The Community for Technology Leaders
RSS Icon
Subscribe
European Design and Test Conference (1996)
Paris, FRANCE
Mar. 11, 1996 to Mar. 14, 1996
ISBN: 0-8186-7423-7
TABLE OF CONTENTS
pp. xviii
pp. xxiv
Tutorials (PDF)
pp. xxvi
pp. xxx
pp. xxxi
Session 1A: Formal Verification
Rolf Drechsler , Institute of Computer Science, Albert-Ludwigs-University
Bernd Becker , Institute of Computer Science, Albert-Ludwigs-University
Stefan Ruppertz , Department of Computer Science, J.W. Goethe-University, Frankfurt am Main, Germany
pp. 2
C.A.J. Van Eijk , Eindhoven University of Technology
J.A.G. Jess , Eindhoven University of Technology
pp. 9
J. Froessl , Institut fuer Rechnerentwurf und Fehlertoleranz Universitaet Karlsruhe,
Th. Kropf , Institut fuer Rechnerentwurf und Fehlertoleranz Universitaet Karlsruhe,
J. Gerlach , Lehrstuhl Technische Informatik Universitaet Tuebingen
pp. 15
Session 1B: System Design for Digital Broadband Telecom: Trends and System Design Challenges
J.L. Conesa , Microelectron. Div., Telefonica I+D, Madrid, Spain
pp. 27
Session 1C: BIST Pattern Generation
Birgit Reeb , University of Siegen
Hans-Joachim Wunderlich , CRC Stanford University
pp. 30
Janusz Rajski , Mentor Graphics Corporation
Jerzy Tyszer , The Franco-Polish School of New Information and Communication Technologies
pp. 42
Session 2A: New Domains in High-Level Synthesis
Wah Chan , Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA
A. Orailoglu , Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA
pp. 50
Seong Y. Ohm , University of California, Irvine
Douglas M. Blough , University of California, Irvine
Fadi J. Kurdahi , University of California, Irvine
pp. 55
Preeti R. Panda , University of California, Irvine
Nikil D. Dutt , University of California, Irvine
pp. 63
Session 2C: Fault Analysis and Test Quality
F. Corsi , Dipartimento di Elettrotecnica ed Elettronica Politecnico di Bari Via Orabona 4, 70125 Bari , Italy
C. Marzocca , Dipartimento di Elettrotecnica ed Elettronica Politecnico di Bari Via Orabona 4, 70125 Bari , Italy
S. Martino , Tecnopolis CSATA Novus Ortus Laboratorio di Microelettronica Strada Prov. Casamassima km. 3 70010 Valenzano - Bari, Italy
pp. 72
P. Cavallera , UMR 9928 University Montpellier II / CNRS
P. Girard , UMR 9928 University Montpellier II / CNRS
C. Landrault , UMR 9928 University Montpellier II / CNRS
S. Pravossoudovitch , UMR 9928 University Montpellier II / CNRS
pp. 79
Session 3A: Code Generation
Johan van Praet , IMEC (VSDM) Kapeldreef 75, B-3001 Leuven, Belgium
Dirk Lanneer , IMEC (VSDM) Kapeldreef 75, B-3001 Leuven, Belgium
Gert Goossens , IMEC (VSDM) Kapeldreef 75, B-3001 Leuven, Belgium
Werner Geurts , IMEC (VSDM) Kapeldreef 75, B-3001 Leuven, Belgium
Hugo de Man , IMEC (VSDM) Kapeldreef 75, B-3001 Leuven, Belgium
pp. 102
Rajesh K. Gupta , University of Illinois, Urbana-Champaign
pp. 108
Session 3B: IDDQ: You Heard the Hype, But What's Really Coming?
K. Baker , Philips Res. Lab., Eindhoven, Netherlands
pp. 116
Session 3C: Test and BIST Beyond Chips
Chauchin Su , National Central University
Shyh-Jye Jou , National Central University
Yuan-Tzu Ting , Chung-shan Institute of Science & Technology
pp. 120
J. Oliver , IMB-CNM (CSIC), University Autonoma of Barcelona
H. Kerkhoff , MESA Institute, University of Twente
pp. 126
K. Sasidhar , Georgia Institute of Technology
A. Chatterjee , Georgia Institute of Technology
Y. Zorian , AT&T Bell Laboratories
pp. 131
Session 4A: Transformations and Estimations
Martin Janssen , IMEC, VSDM Division
Francky Catthoor , IMEC, VSDM Division
Hugo de Man , IMEC, VSDM Division
pp. 138
Wei Zhao , Dept. of Comput. Eng., Case Western Reserve Univ., Cleveland, OH, USA
C.A. Papachristou , Dept. of Comput. Eng., Case Western Reserve Univ., Cleveland, OH, USA
pp. 144
Min Xu , University of California, Irvine
Fadi Kurdahi , University of California, Irvine
pp. 151
Session 4B: FPGA Placement and Routing
Y. Takashima , Dept. of Electrical and Electronic Engrg., Tokyo Inst. of Tech. 2-12-1 Ookayama, Meguro-ku, Tokyo 152, Japan
A. Takahashi , Dept. of Electrical and Electronic Engrg., Tokyo Inst. of Tech. 2-12-1 Ookayama, Meguro-ku, Tokyo 152, Japan
Y. Kajitani , Dept. of Electrical and Electronic Engrg., Tokyo Inst. of Tech. 2-12-1 Ookayama, Meguro-ku, Tokyo 152, Japan
pp. 160
Session 4C: Self-Test Methodologies
E. Bernard , OEN TN ETD3, Siemens AG, Munich, Germany
S. Simon , OEN TN ETD3, Siemens AG, Munich, Germany
J.A. Nossek , OEN TN ETD3, Siemens AG, Munich, Germany
pp. 176
Yervant Zorian , AT&T Bell Laboratories
Hakim Bederr , AT&T Bell Laboratories
pp. 181
M. Nicolaidis , Reliable Integrated Systems Group
S. Manich , UPC, Diagonal 647
J. Figueras , UPC, Diagonal 647
pp. 186
Session 4D: Emerging Design Techniques
S. Caufape , Universitat Politecnica de Catalunya
J. Figueras , Universitat Politecnica de Catalunya
pp. 205
Session 5A: Low Power Design
Enric Musoll , Universitat Politecnica de Catalunya
Jordi Cortadella , Universitat Politecnica de Catalunya
pp. 219
S. Turgis , Lab. d'Inf. de Robotique et de Mictroelectron., CNRS, Montpellier, France
N. Azemard , Lab. d'Inf. de Robotique et de Mictroelectron., CNRS, Montpellier, France
D. Auvergne , Lab. d'Inf. de Robotique et de Mictroelectron., CNRS, Montpellier, France
pp. 224
Session 5B: Performance-Driven Routing
Y. P. Chen , The University of Texas at Austin
D. F. Wong , The University of Texas at Austin
pp. 230
Hidenori Sato , NTT LSI Laboratories
Akira Onozawa , NTT LSI Laboratories
Hiroaki Matsuda , NTT LSI Laboratories
pp. 237
Iksoo Pyo , Intel Corportation
Jaewon Oh , University of Southern California
Massoud Pedram , University of Southern California
pp. 244
Session 5D: Test Generation for Mixed-Signal Circuits
Salvador Mir , TIMA/INPG
Bernard Courtois , TIMA/INPG
Marcelo Lubaszewski , DELET/UFRGS
Vladimir Kolarik , Technical University of Brno
pp. 254
F. Mohamed , TIMA Laboratory, 46 avenue Felix Viallet
M. Marzouki , TIMA Laboratory, 46 avenue Felix Viallet
M.H. Touati , TIMA Laboratory, 46 avenue Felix Viallet
pp. 259
J. Machado da Silva , Faculdade de Engenharia da Universidade do Porto - INESC
J. Silva Matos , Faculdade de Engenharia da Universidade do Porto - INESC
pp. 264
Session 6A: Heterogeneous System Modelling and Design
Jie Gong , Department of Information and Computer Science University of California, Irvine
Daniel D. Gajski , Department of Information and Computer Science University of California, Irvine
Smita Bakshi , Department of Information and Computer Science University of California, Irvine
pp. 270
Youngsoo Shin , Dept. of Electron. Eng., Seoul Nat. Univ., South Korea
Kiyoung Choi , Dept. of Electron. Eng., Seoul Nat. Univ., South Korea
pp. 282
Session 6B: Analysis in Digital Circuit Design
J. Zejda , Dep. I.R.O., Universite de Montreal
E. Cerny , Dep. I.R.O., Universite de Montreal
S. Shenoy , Dept. of EE, McGill University
N. C. Rumin , Dept. of EE, McGill University
pp. 294
Session 6D: High Speed Signal Processing
Cesar Sanz , Technical University of Madrid, Spain
Matias J. Garrido , Technical University of Madrid, Spain
Juan M. Meneses , Technical University of Madrid, Spain
pp. 310
Eric Luthi , Integrated Circuits for Telecommunications Laboratory
Emmanuel Casseau , Integrated Circuits for Telecommunications Laboratory
pp. 315
Session 7A: Sequential Logic Synthesis
Thomas R. Shiple , University of California, Berkeley
Gerard Berry , Ecole des Mines
Herve Touati , Paris Research Laboratory Digital Equipment Corporation
pp. 328
Chih-chang Lin , Univ. of California, Santa Barbara
Malgorzata Marek-Sadowska , Univ. of California, Santa Barbara
Kuang-Chien Chen , Fujitsu Laboratories of America
Mike Tien-Chien Lee , Fujitsu Laboratories of America
pp. 334
Enric Pastor , Universitat Politecnica de Catalunya
Oriol Roig , Universitat Politecnica de Catalunya
Jordi Cortadella , Universitat Politecnica de Catalunya
Alex Kondratyev , The university of Aizu
pp. 340
Session 7B: From High Level Verification to (Low Level) Extraction
Reinaldo A. Bergamaschi , IBM T. J. Watson Research Center
Salil Raje , Northwestern University
pp. 350
Frank Scherber , University of Hanover
Erich Barke , University of Hanover
Wolfgang Meier , Siemens AG, Corporate Research and Development
pp. 357
P.J.H. Elias , Delft University of Technology
N.P. van der Meijs , Delft University of Technology
pp. 362
Session 7C: Sequential Test Generation
Michael S. Hsiao , Center for Reliable and High-Performance Computing University of Illinois, Urbana, IL 61801
Elizabeth M. Rudnick , Center for Reliable and High-Performance Computing University of Illinois, Urbana, IL 61801
Janak H. Patel , Center for Reliable and High-Performance Computing University of Illinois, Urbana, IL 61801
pp. 368
F. Corno , Politecnico di Torino, Dip. Automatica e Informatica
P. Prinetto , Politecnico di Torino, Dip. Automatica e Informatica
M. Rebaudengo , Politecnico di Torino, Dip. Automatica e Informatica
M. Sonza Reorda , Politecnico di Torino, Dip. Automatica e Informatica
R. Mosca , CSP (Centro Supercalcolo Piemonte)
pp. 375
Irith Pomeranz , Electrical and Computer Engineering Department University of Iowa
Sudhakar M. Reddy , Electrical and Computer Engineering Department University of Iowa
pp. 380
Session 7D: Module Generators
M. Wolf , Otto-von-Guericke-Universitaet Magdeburg
U. Kleine , Otto-von-Guericke-Universitaet Magdeburg
B. J. Hosticka , Fraunhofer Institute of Microelectronic Circuits and Systems
pp. 388
Avaneendra Gupta , avigupta@eecs.umich.edu
Siang-Chun The , sthe@scdt.intel.com
John P. Hayes , jhayes@eecs.umich.edu
pp. 393
Session 8A: Logic Synthesis
Shih-Chieh Chang , Synopsys Inc.
Malgorzata Marek-Sadowska , University of California at Santa Barbara
pp. 402
A.-M. Trullemans , UCL-Laboratoire de MicroElectronique
Q. Zhang , UCL-Laboratoire de MicroElectronique
pp. 407
Christian Legl , Institute of Electronic Design Automation Technical University of Munich
Bernd Wurth , Institute of Electronic Design Automation Technical University of Munich
Klaus Eckl , Institute of Electronic Design Automation Technical University of Munich
pp. 412
Session 8B: Memory Testing
Ad J. van de Goor , Delft University of Technology
Aad Offerman , Delft University of Technology
Ivo Schanstra , Delft University of Technology
pp. 420
V.G. Mikitjuk , Byelorussian State University of Informatics and Radioelectronics
V.N. Yarmolik , Byelorussian State University of Informatics and Radioelectronics
A.J. van de Goor , Delft University of Technology
pp. 435
Session 8C: Design Environments and CAD Tools for Microsystems Design
J.M. Karam , CMP, Grenoble, France
B. Courtois , CMP, Grenoble, France
M. Bauge , CMP, Grenoble, France
pp. 442
T. Kiriyama , Res. into Artifacts, Tokyo Univ., Japan
N. Nakajima , Res. into Artifacts, Tokyo Univ., Japan
S. Yoshimura , Res. into Artifacts, Tokyo Univ., Japan
S. Burgess , Res. into Artifacts, Tokyo Univ., Japan
D. Moore , Res. into Artifacts, Tokyo Univ., Japan
N. Shibaike , Res. into Artifacts, Tokyo Univ., Japan
pp. 448
S. Büttgenbach , Institute for Microtechnology Technical University of Braunschweig D-38106 Braunschweig, Germany
O. Than , Institute for Microtechnology Technical University of Braunschweig D-38106 Braunschweig, Germany
pp. 454
Session 9A: Partitioning in System Design
E.H.L. Aarts , Philips Research The Netherlands
G. Essink , Philips Research The Netherlands
E.A. de Kock , Philips Research The Netherlands
pp. 460
I. Karkowski , Delft University of Technology
R.H.J.M. Otten , Delft University of Technology
pp. 467
Ralf Niemann , University of Dortmund
Peter Marwedel , University of Dortmund
pp. 473
Session 9B: Synthesis and Testability
Victor Fernandez , Microelectronics Group. TEISA
Pablo Sanchez , Microelectronics Group. TEISA
pp. 481
Angela Krstic , University of California, Santa Barbara, CA 93106
Kwang-Ting Cheng , University of California, Santa Barbara, CA 93106
pp. 486
Bernd Becker , Albert-Ludwigs-University
Rolf Drechsler , Albert-Ludwigs-University
Rolf Krieger , J.W. Goethe-University
Sudhakar M. Reddy , University of Iowa
pp. 491
Session 9C: Novelties in Integrated System Design
Minoru Inamori , NTT LSI Laboratories
Jiro Naganuma , NTT LSI Laboratories
Haruo Wakabayashi , NTT LSI Laboratories
Makoto Endo , NTT LSI Laboratories
pp. 500
Vivek Garg , Georgia Institute of Technology
Steve Lacy , Georgia Institute of Technology
David E. Schimmel , Georgia Institute of Technology
Darrell Stogner , Georgia Institute of Technology
Craig Ulmer , Georgia Institute of Technology
D. Scott Wills , Georgia Institute of Technology
Sudhakar Yalamanchili , Georgia Institute of Technology
pp. 508
K. Shirakawa , NTT Optical Network Systems Laboratories
K. Higuchi , NTT Optical Network Systems Laboratories
T. Miyazaki , NTT Optical Network Systems Laboratories
K. Hayashi , NTT Optical Network Systems Laboratories
K. Yamada , NTT Optical Network Systems Laboratories
pp. 514
Session 10A: Modelling and Design Strategies for Microsystems Design
Wolfgang Vermeiren , Fraunhofer-Institut fuer Integrierte Schaltungen
Bernd Straube , Fraunhofer-Institut fuer Integrierte Schaltungen
Andreas Holubek , Fraunhofer-Institut fuer Integrierte Schaltungen
pp. 522
J.M. Karam , TIMA, Grenoble, France
B. Courtois , TIMA, Grenoble, France
A. Poppe , TIMA, Grenoble, France
K. Hofmann , TIMA, Grenoble, France
M. Rencz , TIMA, Grenoble, France
M. Glesner , TIMA, Grenoble, France
V. Szekely , TIMA, Grenoble, France
pp. 528
W. Suess , Forschungszentrum Karlsruhe Institut fuer Angewandte Informatik
K. Lindemann , Forschungszentrum Karlsruhe Institut fuer Angewandte Informatik
H. Eggert , Forschungszentrum Karlsruhe Institut fuer Angewandte Informatik
M. Gorges-Schleuter , Forschungszentrum Karlsruhe Institut fuer Angewandte Informatik
W. Jakob , Forschungszentrum Karlsruhe Institut fuer Angewandte Informatik
W. Hoffmann , Forschungszentrum Karlsruhe Institut fuer Angewandte Informatik
R. Rapp , Forschungszentrum Karlsruhe Institut fuer Angewandte Informatik
pp. 533
Session 10C: New Technologies for Mixed-Signal Test
Bert Atzema , Philips Research Laboratories Eindhoven, The Netherlands
Taco Zwemstra , Philips Research Laboratories Eindhoven, The Netherlands
pp. 542
M. Zwolinski , University of Southampton
C. Chalk , University of Southampton
B.R. Wilkins , University of Southampton
pp. 547
Session 11A: Recent Advances in Simulation
A.J. Van Genderen , Delft University of Technology
N.P. van der Meijs , Delft University of Technology
T. Smedes , Delft University of Technology
pp. 560
Yi-Kan Cheng , University of Illinois at Urban-Champaign
Elyse Rosenbaum , University of Illinois at Urban-Champaign
Sung-Mo Kang , University of Illinois at Urban-Champaign
pp. 566
H.Z. Yang , Dept. of Electronic Engineering Tsinghua Univ., Beijing, P.R. China, 100084
C.Z. Fan , Dept. of Electronic Engineering Tsinghua Univ., Beijing, P.R. China, 100084
H. Wang , Dept. of Electronic Engineering Tsinghua Univ., Beijing, P.R. China, 100084
R.S. Liu , Dept. of Electronic Engineering Tsinghua Univ., Beijing, P.R. China, 100084
pp. 571
Session 11C: DFT Solutions and IDDQ
T.W. Williams , IBM, Boulder, CO, USA
R. Kapur , IBM, Endicott, NY, USA
M.R. Mercer , Texas A&M, College Station, TX, USA
R.H. Dennard , IBM, Yorktown, NY, USA
W. Maly , CMU, Pittsburgh, PA, USA
pp. 578
M. Favalli , DEIS - University of Bologna
L. Benini , CIS - Stanford University
G. de Micheli , CIS - Stanford University
pp. 589
Poster Session
Tom Conway , University of Limerick
John Nelson , University of Limerick
pp. 598
Mohamed Abid , TIMA Laboratory, 46 avenue Felix Viallet 38031 Grenoble Cedex, FRANCE
Adel Changuel , TIMA Laboratory, 46 avenue Felix Viallet 38031 Grenoble Cedex, FRANCE
Ahmed Jerraya , TIMA Laboratory, 46 avenue Felix Viallet 38031 Grenoble Cedex, FRANCE
pp. 599
Peter Marwedel , University of Dortmund, Informatik XII Otto-Hahn-Str. 16, 44221 Dortmund, Germany
Steven Bashford , University of Dortmund, Informatik XII Otto-Hahn-Str. 16, 44221 Dortmund, Germany
Rainer Dömer , University of Dortmund, Informatik XII Otto-Hahn-Str. 16, 44221 Dortmund, Germany
Birger Landwehr , University of Dortmund, Informatik XII Otto-Hahn-Str. 16, 44221 Dortmund, Germany
Ingolf Markhof , University of Dortmund, Informatik XII Otto-Hahn-Str. 16, 44221 Dortmund, Germany
pp. 600
J.M. Mendias , Universidad Complutense de Madrid
R. Hermida , Universidad Complutense de Madrid
M. Fernandez , Universidad Complutense de Madrid
pp. 601
D.M. Miller , Dept. of Comput. Sci., Victoria Univ., BC, Canada
pp. 602
K.-R.R. Pan , Dept. of Electr. Eng. Syst., Univ. of Southern California, Los Angeles, CA, USA
M. Pedram , Dept. of Electr. Eng. Syst., Univ. of Southern California, Los Angeles, CA, USA
pp. 603
Vladimir Szekely , Technical University of Budapest
Andras Poppe , Technical University of Budapest
Marta Rencz , Technical University of Budapest
Gabor Farkas , Technical University of Budapest
Alpar Csendes , Technical University of Budapest
Andras Pahi , Technical University of Budapest
pp. 604
Michel Allemand , Laboratoire d'Informatique de Marseille -- URA CNRS 1787
Solange Coupet-Grimal , Laboratoire d'Informatique de Marseille -- URA CNRS 1787
Line Jakubiec , Laboratoire d'Informatique de Marseille -- URA CNRS 1787
Jean-Luc Paillet , Laboratoire d'Informatique de Marseille -- URA CNRS 1787
pp. 605
Ales Casar , University of Maribor
Zmago Brezocnik , University of Maribor
Tatjana Kapus , University of Maribor
pp. 606
Jean Bruce Guignet , BULL Electronic Engineering Services
pp. 608
A. Josep Velasco , Centre Nacional de Microelectronica, IMB-CNM(CSIC)
Xavier Marin , Centre Nacional de Microelectronica, IMB-CNM(CSIC)
Jordi Carrabina , Centre Nacional de Microelectronica, IMB-CNM(CSIC)
Rafael Peset Llopis , Philips Research Laboratories
pp. 609
Alexander Drozd , Odessa State Politechnic University
Wael Hassonah , Odessa State Politechnic University
Michel Lobachov , Odessa State Politechnic University
pp. 611
J.T. Sousa , Department of Electrical and Electronic Engineering Imperial College, London SW7 2BT, U.K
T. Shen , Department of Electrical and Electronic Engineering Imperial College, London SW7 2BT, U.K
P.Y.K. Cheung , Department of Electrical and Electronic Engineering Imperial College, London SW7 2BT, U.K
pp. 612
M.H. Touati , TIMA Laboratory, 46 avenue Felix Viallet 38031 Grenoble Cedex, FRANCE
F. Mohamed , TIMA Laboratory, 46 avenue Felix Viallet 38031 Grenoble Cedex, FRANCE
M. Marzouki , TIMA Laboratory, 46 avenue Felix Viallet 38031 Grenoble Cedex, FRANCE
pp. 616
Tb. Johansson , Katholieke Universiteit Leuven
K. Hameyer , Katholieke Universiteit Leuven
R. Belmans , Katholieke Universiteit Leuven
pp. 618
Author Index (PDF)
pp. 621
19 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool