ISBN: 0-7695-2914-3

Bran Selic, IBM Canada

Francisco Gomez-Molinero, Visual Tools, Spain

Merce Griera i Fisa, European Commission

Michele Cirinei, Scuola Superiore Sant'Anna, Italy

Theodore P. Baker, Florida State University, USA

Enrico Bini, Scuola Superiore Sant'Anna, Italy

Giorgio Buttazzo, Scuola Superiore Sant'Anna, Italy

Praveen Jayachandran, University of Illinois, USA

Tarek Abdelzaher, University of Illinois, USA

Wan-Chen Lu, National Tsing Hua University, Taiwan

Kwei-Jay Lin, University of California, Irvine, USA

Hsin-Wen Wei, National Tsing Hua University, Taiwan

Wei-Kuan Shih, National Tsing Hua University, Taiwan

Nathan Fisher, The University of North Carolina at Chapel Hill, USA

Sanjoy Baruah, The University of North Carolina at Chapel Hill, USA

Bjorn B. Brandenburg, The University of North Carolina at Chapel Hill, USA

James H. Anderson, The University of North Carolina at Chapel Hill, USA

Hennadiy Leontyev, The University of North Carolina at Chapel Hill, USA

James H. Anderson, The University of North Carolina at Chapel Hill, USA

Luciano Bertini, Universidade Federal Fluminense, Brazil

J.C.B. Leite, Universidade Federal Fluminense, Brazil

Daniel Mosse, University of Pittsburgh, USA

Ala' Qadi, University of Nebraska-Lincoln, USA

Steve Goddard, University of Nebraska-Lincoln, USA

Jiangyang Huang, University of Nebraska-Lincoln, USA

Shane Farritor, University of Nebraska-Lincoln, USA

Xiaorui Wang, University of Tennessee, USA

Yingming Chen, Washington University in St. Louis, USA

Chenyang Lu, Washington University in St. Louis, USA

Xenofon Koutsoukos, Vanderbilt University, USA

Alexandre P. Ferreira, University of Pittsburgh, USA

Daniel Mosse, University of Pittsburgh, USA

Jae C. Oh, Syracuse University

Anis Koubaa, Polytechnic Institute of Porto, Portugal; Al-Imam Muhammad Ibn Saud University, Saudi Arabia

Andre Cunha, Polytechnic Institute of Porto, Portugal

Mario Alves, Polytechnic Institute of Porto, Portugal

K. Shashi Prabh, University of Virginia, USA

Tarek F. Abdelzaher, University of Illinois at Urbana-Champaign, USA

Douglas Dimi Demarch, Federal University of Santa Catarina, Brazil

Leandro Buss Becker, Federal University of Santa Catarina, Brazil

Samarjit Chakraborty, National University of Singapore, Singapore

Tulika Mitra, National University of Singapore, Singapore

Abhik Roychoudhury, National University of Singapore, Singapore

Lothar Thiele, Eidgenossische Technische Hochschule Zurich, Switzerland

Unmesh D. Bordoloi, National University of Singapore, Singapore

Cem Derdiyok, Ecole Polytechnique Federale de Lausanne, Switzerland

Isabelle Puaut, Universite Europeenne de Bretagne/IRISA, France

Damien Hardy, Universite Europeenne de Bretagne/IRISA, France

Jean-Fran?ois Deverge, Universite Europeenne de Bretagne/IRISA, France

Isabelle Puaut, Universite Europeenne de Bretagne/IRISA, France

Abhishek Singh, UNC Chapel Hill, USA

Kevin Jeffay, UNC Chapel Hill, USA

Audrey Marchand, Technical University of Valencia, Spain

Patricia Balbastre, Technical University of Valencia, Spain

Ismael Ripoll, Technical University of Valencia, Spain

Miguel Masmano, Technical University of Valencia, Spain

Alfons Crespo, Technical University of Valencia, Spain

Claude-J. Hamann, Technische Universitat Dresden, Germany

Michael Roitzsch, Technische Universitat Dresden, Germany

Lars Reuther, Technische Universitat Dresden, Germany

Jean Wolter, Technische Universitat Dresden, Germany

Hermann Hartig, Technische Universitat Dresden, Germany

Chengdu Huang, University of Illinois at Urbana-Champaign, USA

Tarek Abdelzaher, University of Illinois at Urbana-Champaign, USA

Xue Liu, McGill University, Canada

Madhukar Anand, University of Pennsylvania, USA

Sebastian Fischmeister, University of Pennsylvania, USA

Insup Lee, University of Pennsylvania, USA

John M. Calandrino, The University of North Carolina at Chapel Hill, USA

James H. Anderson, The University of North Carolina at Chapel Hill, USA

Dan P. Baumberger, Intel Corporation, USA

Yanching Chu, University of York, UK

Alan Burns, University of York, UK

Reinder J. Bril, Technische Universiteit Eindhoven, The Netherlands

Johan J. Lukkien, Technische Universiteit Eindhoven, The Netherlands

Wim F.J. Verhaegh, Philips Research Laboratories, The Netherlands

Patrick Meumeu Yomsi, INRIA, France

Yves Sorel, INRIA, France

Laura Carnevali, Universita di Firenze, Italy

Luigi Sassoli, Universita di Firenze, Italy

Enrico Vicario, Universita di Firenze, Italy