• D
  • DSN
  • 2005
  • 2005 International Conference on Dependable Systems and Networks (DSN'05)
Advanced Search 
2005 International Conference on Dependable Systems and Networks (DSN'05)
Yokohama, Japan
June 28-July 01
ISBN: 0-7695-2282-3
Table of Contents
Introduction
pp. xiv,xv,xvi,xvii
pp. xx,xxi,xxii
Keynote Address
Session 1A: Fault Tolerant Architectures and Algorithms
null
Elisabeth A. Strunk, University of Virginia
John C. Knight, University of Virginia
M. Anthony Aiello, University of Virginia
pp. 2-11
David Bernick, Hewlett Packard Company
Bill Bruckert, Hewlett Packard Company
Paul Del Vigna, Hewlett Packard Company
David Garcia, Hewlett Packard Company
Robert Jardine, Hewlett Packard Company
Jim Klecka, Hewlett Packard Company
Jim Smullen, Hewlett Packard Company
pp. 12-21
Session 1B: Dependability in VLSI
null
Nicholas J. Wang, University of Illinois at Urbana-Champaign
Sanjay J. Patel, University of Illinois at Urbana-Champaign
pp. 30-39
P. Bernardi, Politecnico di Torino
L. Bolzani, Politecnico di Torino
M. Rebaudengo, Politecnico di Torino
M. Sonza Reorda, Politecnico di Torino
F. Vargas, Pontif?cia Universidade Cat?lica do Rio Grande do Sul
M. Violante, Politecnico di Torino
pp. 50-58
Session 2A: Experimental Validation
null
Sampath Yerramalla, West Virginia University
Bojan Cukic, West Virginia University
Martin Mladenovski, West Virginia University
Edgar Fuller, West Virginia University
pp. 70-79
Andréas Johansson, Technische Universität Darmstadt
Neeraj Suri, Technische Universität Darmstadt
pp. 86-95
Session 2B: System Security
null
Ramkumar Chinchani, University at Buffalo
Anusha Iyer, University at Buffalo
Hung Q. Ngo, University at Buffalo
Shambhu Upadhyaya, University at Buffalo
pp. 108-117
Zonghua Zhang, Japan Advanced Institute of Science and Technology
Hong Shen, Japan Advanced Institute of Science and Technology
pp. 118-127
Mohamed G. Gouda, University of Texas at Austin
Alex X. Liu, University of Texas at Austin
pp. 128-137
Session 3A: Multicast
null
Chunqiang Tang, IBM T.J. Watson Research Center
Rong N. Chang, IBM T.J. Watson Research Center
Christopher Ward, IBM T.J. Watson Research Center
pp. 140-149
Vadim Drabkin, Technion - Israel Institute of Technology
Roy Friedman, Technion - Israel Institute of Technology
Marc Segal, Technion - Israel Institute of Technology
pp. 160-169
Session 3B: Wide Area Networks
null
Tina Wong, Carnegie Mellon University
Van Jacobson, Packet Design, Inc.
Cengiz Alaettinoglu, Packet Design, Inc.
pp. 172-181
Yin Zhang, University of Texas at Austin
Zihui Ge, AT&T Labs - Research
pp. 188-197
Session 4A: Detection and Adaptation
null
Xavier Défago, Japan Advanced Institute of Science and Technology and PRESTO, Japan Science and Technology Agency
Péter Urb?, Japan Advanced Institute of Science and Technology
Naohiro Hayashibara, Japan Advanced Institute of Science and Technology
Takuya Katayama, Japan Advanced Institute of Science and Technology
pp. 206-215
Session 4B: FT Communications
null
Jing Fang, Iowa State University
Mahesh Sivakumar, University of Maryland at Baltimore County
Arun K. Somani, Iowa State University
Krishna M. Sivalingam, University of Maryland at Baltimore County
pp. 228-237
Audun Fosselie Hansen, Simula Research Laboratory and Telenor R&D
Amund Kvalbein, Simula Research Laboratory
Tarik Čičić, Simula Research Laboratory
Stein Gjessing, Simula Research Laboratory
Olav Lysne, Simula Research Laboratory
pp. 238-247
Steven Y. Ko, University of Illinois at Urbana-Champaign
Indranil Gupta, University of Illinois at Urbana-Champaign
pp. 248-257
Session 5A: Operating Systems and Mechanisms
null
G. (John) Janakiraman, Hewlett-Packard Laboratories
Jose Renato Santos, Hewlett-Packard Laboratories
Dinesh Subhraveti, Hewlett-Packard Laboratories
Yoshio Turner, Hewlett-Packard Laboratories
pp. 260-269
Archana Ganapathi, University of California at Berkeley
David Patterson, University of California at Berkeley
pp. 280-285
Session 5B: Networking
null
Fanglu Guo, State University of New York at Stony Brook and Rether Networks Inc.
Tzi-cker Chiueh, State University of New York at Stony Brook and Rether Networks Inc.
pp. 288-297
Manish Marwah, University of Colorado
Shivakant Mishra, University of Colorado
Christof Fetzer, Dresden University of Technology
pp. 308-313
Session 6A: Codes
null
G. Chen, Pennsylvania State University
M. Kandemir, Pennsylvania State University
M. Karakoy, Imperial College
pp. 316-325
Marcos K. Aguilera, HP Laboratories
Ramaprabhu Janakiraman, Washington University in Saint Louis
Lihao Xu, Washington University in Saint Louis
pp. 336-345
Michael Paulitsch, Honeywell
Jennifer Morris, Carnegie Mellon University
Brendan Hall, Honeywell
Kevin Driscoll, Honeywell
Elizabeth Latronico, Carnegie Mellon University
Philip Koopman, Carnegie Mellon University
pp. 346-355
Session 6B: Critical Infrastructures Protection
null
Mohan Rajagopalan, University of Arizona
Matti Hiltunen, AT&T Labs-Research
Trevor Jim, AT&T Labs-Research
Richard Schlichting, AT&T Labs-Research
pp. 358-367
Yi-Min Wang, Microsoft Research
Doug Beck, Microsoft Research
Binh Vo, Microsoft Research
Roussi Roussev, Microsoft Research
Chad Verbowski, Microsoft Research
pp. 368-377
Shuo Chen, University of Illinois at Urbana-Champaign
Jun Xu, North Carolina State University
Nithin Nakka, University of Illinois at Urbana-Champaign
Zbigniew Kalbarczyk, University of Illinois at Urbana-Champaign
Ravishankar K. Iyer, University of Illinois at Urbana-Champaign
pp. 378-387
Lap-chung Lam, State University of New York at Stony Brook
Tzi-cker Chiueh, State University of New York at Stony Brook
pp. 388-397
Panel: Dependability Benchmarking of Computing Systems
Karama Kanoun, LAAS-CNRS
Henrique Madeira, University of Coimbra
Brendan Murphy, Microsoft
Ira Pramanick, Sun Microsystems
pp. 400
Session 7A: Consensus
null
Jean-Philippe Martin, University of Texas at Austin
Lorenzo Alvisi, University of Texas at Austin
pp. 402-411
Sérgio Gorender, Federal University of Bahia
Raimundo Mac?do, Federal University of Bahia
Michel Raynal, IRISA, Université de Rennes 1
pp. 412-421
Lívia Sampaio, Universidade Federal de Campina Grande
Francisco Brasileiro, Universidade Federal de Campina Grande
pp. 422-431
Session 7B: Hardware and Codesign
null
P. Oscar Boykin, University of Florida
Vwani P. Roychowdhury, University of California at Los Angeles
pp. 444-453
Sumant Kowshik, University of Illinois at Urbana-Champaign
Girish Baliga, University of Illinois at Urbana-Champaign
Scott Graham, Air Force Institute of Technology
Lui Sha, University of Illinois at Urbana-Champaign
pp. 454-463
Session 8A: Dependability Modeling and Prediction
null
Yinglung Liang, Rutgers University
Yanyong Zhang, Rutgers University
Anand Sivasubramaniam, Penn State University
Ramendra K. Sahoo, IBM T. J. Watson Research Center
Jose Moreira, IBM T. J. Watson Research Center
Manish Gupta, IBM T. J. Watson Research Center
pp. 476-485
Session 8B: Intrusion Detection and Tolerance
null
Claudio Basile, University of Illinois at Urbana-Champaign
Zbigniew Kalbarczyk, University of Illinois at Urbana-Champaign
Ravi K. Iyer, University of Illinois at Urbana-Champaign
pp. 518-527
Alper Tugay Mizrak, University of California at San Diego
Yu-Chung Cheng, University of California at San Diego
Keith Marzullo, University of California at San Diego
Stefan Savage, University of California at San Diego
pp. 538-547
Session 1C: Software Reliability, Rejuvenation and Optimization
null
Ann T. Tai, IA Tech, Inc.
Kam S. Tso, IA Tech, Inc.
William H. Sanders, University of Illinois at Urbana-Champaign
Savio N. Chau, Jet Propulsion Laboratory
pp. 570-579
Session 2C: Security Evaluation
null
Xiapu Luo, Hong Kong Polytechnic University
Rocky K. C. Chang, Hong Kong Polytechnic University
pp. 582-591
Susmit Panjwani, University of Maryland at College Park
Stephanie Tan, University of Maryland at College Park
Keith M. Jarrin, University of Maryland at College Park
Michel Cukier, University of Maryland at College Park
pp. 602-611
Session 3C: Evaluation of QoS and Self-Healing Systems
null
A. J. Oliner, Massachusetts Institute of Technology
L. Rudolph, Massachusetts Institute of Technology
R. K. Sahoo, IBM T. J. Watson Research Center
J. E. Moreira, IBM T. J. Watson Research Center
M. Gupta, IBM T. J. Watson Research Center
pp. 634-643
Steve Zhang, Stanford University
Ira Cohen, Hewlett Packard Research Labs
Moises Goldszmidt, Hewlett Packard Research Labs
Julie Symons, Hewlett Packard Research Labs
Armando Fox, Stanford University
pp. 644-653
Session 4C: Experimental Evaluation of Fault-Tolerance
null
Joakim Aidemark, Volvo Car Corporation
Peter Folkesson, Chalmers University of Technology
Johan Karlsson, Chalmers University of Technology
pp. 656-665
Jonny Vinter, Chalmers University of Technology
Olof Hannius, Volvo Aero Corporation
Torbj? Norlander, Volvo Aero Corporation
Peter Folkesson, Chalmers University of Technology
Johan Karlsson, Chalmers University of Technology
pp. 666-671
Session 5C: Performance Evaluation of Networks and Protocols
null
Sherif M. ElRakabawy, University of Dortmund
Christoph Lindemann, University of Dortmund
Mary K. Vernon, University of Wisconsin - Madison
pp. 684-693
M. Gribaudo, Università di Torino
C.-F. Chiasserini, Politecnico di Torino
R. Gaeta, Università di Torino
M. Garetto, Politecnico di Torino
D. Manini, Università di Torino
M. Sereno, Università di Torino
pp. 694-703
Session 6C: Markovian Models for Performance and Dependability
null
Axel Th?mmler, University of Dortmund
Peter Buchholz, University of Dortmund
Mikl? Telek, Budapest University of Technology and Economics
pp. 712-721
Lucia Cloth, University of Twente
Joost-Pieter Katoen, RWTH Aachen and University of Twente
Maneesh Khattri, University of Twente
Reza Pulungan, Saarland University
pp. 722-731
Yi Zhang, University of Birmingham
David Parker, University of Birmingham
Marta Kwiatkowska, University of Birmingham
pp. 732-741
Salem Derisavi, University of Illinois at Urbana-Champaign
Peter Kemper, Universität Dortmund
William H. Sanders, University of Illinois at Urbana-Champaign
pp. 742-751
Session 7C: Experimental Microprocessor Evaluation
null
Giacinto Paolo Saggese, University of Illinois at Urbana-Champaign
Anoop Vetteth, University of Illinois at Urbana-Champaign
Zbigniew Kalbarczyk, University of Illinois at Urbana-Champaign
Ravishankar Iyer, University of Illinois at Urbana-Champaign
pp. 760-769
Gokhan Memik, Northwestern University
Masud H. Chowdhury, University of Illinois at Chicago
Arindam Mallik, Northwestern University
Yehea I. Ismail, Northwestern University
pp. 770-779
Session 8C: Replication and Checkpointing Protocol Evaluation
null
Tabito Suzuki, Tokyo Metropolitan University
Mamoru Ohara, Tokyo Metropolitan University
Masayuki Arai, Tokyo Metropolitan University
Satoshi Fukumoto, Tokyo Metropolitan University
Kazuhiko Iwasaki, Tokyo Metropolitan University
pp. 782-791
A. Sousa, University of Minho
J. Pereira, University of Minho
L. Soares, University of Minho
A. Correia Jr., University of Minho
L. Rocha, University of Minho
R. Oliveira, University of Minho
F. Moura, University of Minho
pp. 792-801
Vijayan Prabhakaran, University of Wisconsin - Madison
Andrea C. Arpaci-Dusseau, University of Wisconsin - Madison
Remzi H. Arpaci-Dusseau, University of Wisconsin - Madison
pp. 802-811
Long Wang, University of Illinois at Urbana-Champaign
Karthik Pattabiraman, University of Illinois at Urbana-Champaign
Zbigniew Kalbarczyk, University of Illinois at Urbana-Champaign
Ravishankar K. Iyer, University of Illinois at Urbana-Champaign
Lawrence Votta, Sun Microsystems
Christopher Vick, Sun Microsystems
Alan Wood, Sun Microsystems
pp. 812-821
Workshop on Dependable Software — Tools and Methods
Takuya Katayama, Japan Advanced Institute of Science and Technology
Yutaka Ishikawa, University of Tokyo
Yoshiki Kinoshita, National Institute of Advanced Industrial Science and Technology - Japan
pp. 824
Workshop on Hot Topics in System Depend
George Candea, Stanford University
David Oppenheimer, University of California at Berkeley
pp. 826-827
Workshop on Assurance of Networking Systems Dependability Service Level Agreements
Saida Benlarbi, Alcatel - IP Division
pp. 830
Author Index
Author Index (PDF)
pp. 831-833
Usage of this product signifies your acceptance of the Terms of Use.