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Second International Conference on Document Image Analysis for Libraries (DIAL'06)
Lyon, France
April 27-April 28
ISBN: 0-7695-2531-8
Table of Contents
Introduction
Preface (PDF)
pp. viii
Introduction Paper
George Nagy, Rensselaer Polytechnic Institute, Troy, NY
Daniel Lopresti, Lehigh University, Bethlehem, PA
pp. 2-11
Chapter 1. Handwritten Documents Segmentation and Recognition
Stephane Nicolas, Universite de Rouen UFR des Sciences et Techniques, Cedex, France
Thierry Paquet, Universite de Rouen UFR des Sciences et Techniques, Cedex, France
Laurent Heutte, Universite de Rouen UFR des Sciences et Techniques, Cedex, France
pp. 46-59
Chapter 2. OCR and Layout Analysis for Multilingual Printed Documents
N. Jourmet, La Rochelle Cedex 1 - FRANCE
R. Mullot, La Rochelle Cedex 1 - FRANCE
V. Eglin, LIRIS INSA de Lyon, Villeurbanne cedex - FRANCE
J.Y Ramel, LI-RFAI Jean Portalis TOURS - FRANCE
pp. 60-69
S. Mandal, CST Dept., B. E. & Science University, India
S. P. Chowdhury, CST Dept., B. E. & Science University, India
A. K. Das, CST Dept., B. E. & Science University, India
Bhabatosh Chanda, ECS Unit, Indian Statistical Unit Calcutta, India
pp. 70-81
Linlin Li, National University of Singapore, Kent Ridge, Singapore
Chew Lim Tan, National University of Singapore, Kent Ridge, Singapore
pp. 82-87
Bogdan Savchynskyy, International Research and Training Center of Information Technologies and Systems, Kiev, Ukraine
Olexander Kamotskyy, International Research and Training Center of Information Technologies and Systems, Kiev, Ukraine
pp. 88-95
Suryaprakash Kompalli, CEDAR, University at Buffalo, Amherst, NY
Srirangaraj Setlur, CEDAR, University at Buffalo, Amherst, NY
Venu Govindaraju, CEDAR, University at Buffalo, Amherst, NY
pp. 96-102
Chapter 3. DIA Applications for Digital Libraries
Jose Borbinha, INESC-ID - Instituto de Engenharia de Sistemas e Computadores, Lisboa, Portugal
Joao Gil, INESC-ID - Instituto de Engenharia de Sistemas e Computadores, Lisboa, Portugal
Gilberto Pedrosa, INESC-ID - Instituto de Engenharia de Sistemas e Computadores, Lisboa, Portugal
Joao Penas, INESC-ID - Instituto de Engenharia de Sistemas e Computadores, Lisboa, Portugal
pp. 116-125
Liangrui Peng, Tsinghua University, China
Changsong Liu, Tsinghua University, China
Xiaoqing Ding, Tsinghua University, China
Hua Wang, Tsinghua University, China
pp. 126-132
Asanobu Kitamoto, National Institute of Informatics, Tokyo, Japan
Makiko Onishi, National Institute of Informatics, Tokyo, Japan
Tomohiro Ikezaki, National Institute of Informatics, Tokyo, Japan
Dominique Deuff, National Institute of Informatics, Tokyo, Japan
Eka Meyer, National Institute of Informatics, Tokyo, Japan
Sonoko Sato, National Institute of Informatics, Tokyo, Japan
Takako Muramatsu, National Institute of Informatics, Tokyo, Japan
Ryo Kamida, National Institute of Informatics, Tokyo, Japan
Takeo Yamamoto, National Institute of Informatics, Tokyo, Japan
Kinji Ono, National Institute of Informatics, Tokyo, Japan
pp. 133-144
J.Y. Ramel, Ecole Polytechnique de l?Universite de Tours, France
S. Busson, CESR - UMR 6576 du CNRS Tours, France
M.L. Demonet, CESR - UMR 6576 du CNRS Tours, France
pp. 145-155
Zoltan ISZLAI, Sapientia EMTE, Romania
Elod EGYED-ZSIGMOND, LIRIS INSA-Lyon, Villeurbanne Cedex, France
pp. 164-171
Chapter 4. Documents Images Indexing and Retrieval
Nawei Chen, Queen's University, Kingston, Ontario, Canada
Hagit Shatka, Queen's University, Kingston, Ontario, Canada
Dorothea Blostein, Queen's University, Kingston, Ontario, Canada
pp. 180-197
Sargur N. Srihari, CEDAR, University at Buffalo(SUNY), NY
Shravya Shetty, CEDAR, University at Buffalo(SUNY), NY
Siyuan Chen, CEDAR, University at Buffalo(SUNY), NY
Harish Srinivasan, CEDAR, University at Buffalo(SUNY), NY
Chen Huang, CEDAR, University at Buffalo(SUNY), NY
Gady Agam, Illinois Institute of Technology, Chicago
Ophir Frieder, Illinois Institute of Technology, Chicago
pp. 198-203
Rudolf Pareti, Laboratoire CRIP5, Universite de Paris 5, France
Nicole Vincent, Laboratoire CRIP5, Universite de Paris 5, France
Surapong Uttama, Universite de la Rochelle, Avenue Michel Crepeau, La Rochelle CEDEX, France
Jean-Marc Ogier, Universite de la Rochelle, Avenue Michel Crepeau, La Rochelle CEDEX, France
Jean-Pierre Salmon, LORIA, INRIA, CEDEX, France
Salvatore Tabbone, LORIA, INRIA, CEDEX, France
Laurent Wendling, LORIA, INRIA, CEDEX, France
Sebastien Adam, Laboratoire PSI, Universite de Rouen, UFR Sciences, CEDEX, France
pp. 220-231
Joost Van Beusekom, Technical University of Kaiserslautern, Germany
Daniel Keysers, Technical University of Kaiserslautern, Germany
Faisal Shafait, Technical University of Kaiserslautern, Germany
Thomas M. Breuel, Technical University of Kaiserslautern, Germany
pp. 232-242
Simone Marinai, Universita di Firenze, Italy
Emanuele Marino, Universita di Firenze, Italy
Giovanni Soda, Universita di Firenze, Italy
pp. 243-253
Chapter 5. Other Trends in DIA
Vasiliki Kokla, University of Westminster, Watford Road, UK
Alexandra Psarrou, University of Westminster, Watford Road, UK
Vassilis Konstantinou, University of Westminster, Watford Road, UK
pp. 254-264
V. EGLIN, LIRIS INSA de Lyon, Villeurbanne cedex - France
F. LEBOURGEOIS, LIRIS INSA de Lyon, Villeurbanne cedex - France
S. BRES, LIRIS INSA de Lyon, Villeurbanne cedex - France
H. EMPTOZ, LIRIS INSA de Lyon, Villeurbanne cedex - France
Y. LEYDIER, LIRIS INSA de Lyon, Villeurbanne cedex - France
I. MOALLA, LIRIS INSA de Lyon, Villeurbanne cedex - France
F. DRIRA, LIRIS INSA de Lyon, Villeurbanne cedex - France
pp. 265-280
Sarbani Palit, Computer Vision & Pattern Recognition Unit
Utpal Garain, Computer Vision & Pattern Recognition Unit
pp. 291-296
Toshihiro KANAHORI, Tsukuba University of Technology,Ibaraki, Japan
Masakazu SUZUKI, Kyushu University, Fukuoka, Japan
pp. 297-302
I. MOALLA, University of Sfax, ENIS, DGE, BP. W-3038 - Sfax, Tunisia
A. M. ALIMI, University of Sfax, ENIS, DGE, BP. W-3038 - Sfax, Tunisia
F. LEBOURGEOIS, Laboratoire d'InfoRmatique en Images et Syst?mes d'information (LIRIS)
H. EMPTOZ, Laboratoire d'InfoRmatique en Images et Syst?mes d'information (LIRIS)
pp. 303-311
Chapter 6. DIA Evaluation and Document Image Quality
Kazuki Ashida, Shinshu University, Matsumoto, Japan
Masayuki Okamoto, Shinshu University, Nagano, Japan
Hiroki Imai, Seiko Epson Corporation
Tsubasa Nakatsuka, Seiko Epson Corporation
pp. 320-331
Xiangwen Liao, Graduate School of the Chinese Academy of Sciences, Beijing, P.R.China
Binxing Fang, Chinese Academy of Sciences Beijing, P.R.China
Weihua Luo, Chinese Academy of Sciences Beijing, P.R.China
Bin Wang, Chinese Academy of Sciences Beijing, P.R.China
pp. 332-339
Ergina Kavallieratou, University of the Aegean, Karlovassi, Greece
Efstathios Stamatatos, University of the Aegean, Karlovassi, Greece
pp. 340-349
Alessandro Ledda, Telin Department, Ghent University, Gent, Belgium
Hiep Q. Luong, Telin Department, Ghent University, Gent, Belgium
Wilfried Philips, Telin Department, Ghent University, Gent, Belgium
Valerie De Witte, Department of Applied Mathematics & Computer Science, Ghent University, Gent, Belgium
Etienne E. Kerre, Department of Applied Mathematics & Computer Science, Ghent University, Gent, Belgium
pp. 358-367
Xiaowei Shao, University of Science and Technology of China
Zhengkai Liu, University of Science and Technology of China
Houqiang Li, University of Science and Technology of China
pp. 368-372
Elisa H. Barney Smith, Boise State University, Boise, Idaho, USA
Henry Baird, Lehigh University, Bethlehem, Pennsylvania, USA
William Barrett, Brigham Young University, Provo, Utah, USA
Frank Le Bourgeois, LIRIS I.N.S.A. de Lyon, Villeurbanne Cedex, France
Xiaofan Lin, Hewlett Packard Labs, Palo Alto, California, USA
George Nagy, Rensselaer Polytechnic Institute, Troy, New York, USA
Steve Simske, Hewlett Packard Labs, Palo Alto, California, USA
pp. 373-376
Author Index
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