ISBN: 0-7695-2531-8

George Nagy, Rensselaer Polytechnic Institute, Troy, NY

Daniel Lopresti, Lehigh University, Bethlehem, PA

Douglas J. Kennard, Brigham Young University

William A. Barrett, Brigham Young University

Pingping Xiu, Tsinghua University, China

Liangrui Peng, Tsinghua University, China

Xiaoqing Ding, Tsinghua University, China

Shaolei Feng, University of Massachusetts

R. Manmatha, University of Massachusetts

Andrew McCallum, University of Massachusetts

Aurelie Lemaitre, IRISA / INSA, Rennes Cedex, France

Jean Camillerapp, IRISA / INSA, Rennes Cedex, France

Stephane Nicolas, Universite de Rouen UFR des Sciences et Techniques, Cedex, France

Thierry Paquet, Universite de Rouen UFR des Sciences et Techniques, Cedex, France

Laurent Heutte, Universite de Rouen UFR des Sciences et Techniques, Cedex, France

N. Jourmet, La Rochelle Cedex 1 - FRANCE

R. Mullot, La Rochelle Cedex 1 - FRANCE

V. Eglin, LIRIS INSA de Lyon, Villeurbanne cedex - FRANCE

J.Y Ramel, LI-RFAI Jean Portalis TOURS - FRANCE

S. Mandal, CST Dept., B. E. & Science University, India

S. P. Chowdhury, CST Dept., B. E. & Science University, India

A. K. Das, CST Dept., B. E. & Science University, India

Bhabatosh Chanda, ECS Unit, Indian Statistical Unit Calcutta, India

Linlin Li, National University of Singapore, Kent Ridge, Singapore

Chew Lim Tan, National University of Singapore, Kent Ridge, Singapore

Bogdan Savchynskyy, International Research and Training Center of Information Technologies and Systems, Kiev, Ukraine

Olexander Kamotskyy, International Research and Training Center of Information Technologies and Systems, Kiev, Ukraine

Suryaprakash Kompalli, CEDAR, University at Buffalo, Amherst, NY

Srirangaraj Setlur, CEDAR, University at Buffalo, Amherst, NY

Venu Govindaraju, CEDAR, University at Buffalo, Amherst, NY

Nadia Ben Amor, National Engineering School of Tunis (ENIT) Tunisia

Najoua Essoukri Ben Amara, National Engineering School of Sousse (ENISo) Tunisia

Istvan Marosi, Scansoft-Recognita, Inc.

Laszlo Toth, Scansoft-Recognita, Inc.

Jose Borbinha, INESC-ID - Instituto de Engenharia de Sistemas e Computadores, Lisboa, Portugal

Joao Gil, INESC-ID - Instituto de Engenharia de Sistemas e Computadores, Lisboa, Portugal

Gilberto Pedrosa, INESC-ID - Instituto de Engenharia de Sistemas e Computadores, Lisboa, Portugal

Joao Penas, INESC-ID - Instituto de Engenharia de Sistemas e Computadores, Lisboa, Portugal

Liangrui Peng, Tsinghua University, China

Changsong Liu, Tsinghua University, China

Xiaoqing Ding, Tsinghua University, China

Hua Wang, Tsinghua University, China

Asanobu Kitamoto, National Institute of Informatics, Tokyo, Japan

Makiko Onishi, National Institute of Informatics, Tokyo, Japan

Tomohiro Ikezaki, National Institute of Informatics, Tokyo, Japan

Dominique Deuff, National Institute of Informatics, Tokyo, Japan

Eka Meyer, National Institute of Informatics, Tokyo, Japan

Sonoko Sato, National Institute of Informatics, Tokyo, Japan

Takako Muramatsu, National Institute of Informatics, Tokyo, Japan

Ryo Kamida, National Institute of Informatics, Tokyo, Japan

Takeo Yamamoto, National Institute of Informatics, Tokyo, Japan

Kinji Ono, National Institute of Informatics, Tokyo, Japan

J.Y. Ramel, Ecole Polytechnique de l?Universite de Tours, France

S. Busson, CESR - UMR 6576 du CNRS Tours, France

M.L. Demonet, CESR - UMR 6576 du CNRS Tours, France

Bruno Morandiere, Universite Lumiere Lyon 2, Cedex, France

Viviane Bouletreau, Universite Lumiere Lyon 2, Cedex, France

Zoltan ISZLAI, Sapientia EMTE, Romania

Elod EGYED-ZSIGMOND, LIRIS INSA-Lyon, Villeurbanne Cedex, France

Bertrand Couasnon, IRISA / INSA, Campus universitaire de Beaulieu, Rennes Cedex, France

Nawei Chen, Queen's University, Kingston, Ontario, Canada

Hagit Shatka, Queen's University, Kingston, Ontario, Canada

Dorothea Blostein, Queen's University, Kingston, Ontario, Canada

Sargur N. Srihari, CEDAR, University at Buffalo(SUNY), NY

Shravya Shetty, CEDAR, University at Buffalo(SUNY), NY

Siyuan Chen, CEDAR, University at Buffalo(SUNY), NY

Harish Srinivasan, CEDAR, University at Buffalo(SUNY), NY

Chen Huang, CEDAR, University at Buffalo(SUNY), NY

Gady Agam, Illinois Institute of Technology, Chicago

Ophir Frieder, Illinois Institute of Technology, Chicago

Floriana Esposito, University of Bari, Italy

Stefano Ferilli, University of Bari, Italy

Teresa M.A. Basile, University of Bari, Italy

Nicola Di Mauro, University of Bari, Italy

Rudolf Pareti, Laboratoire CRIP5, Universite de Paris 5, France

Nicole Vincent, Laboratoire CRIP5, Universite de Paris 5, France

Surapong Uttama, Universite de la Rochelle, Avenue Michel Crepeau, La Rochelle CEDEX, France

Jean-Marc Ogier, Universite de la Rochelle, Avenue Michel Crepeau, La Rochelle CEDEX, France

Jean-Pierre Salmon, LORIA, INRIA, CEDEX, France

Salvatore Tabbone, LORIA, INRIA, CEDEX, France

Laurent Wendling, LORIA, INRIA, CEDEX, France

Sebastien Adam, Laboratoire PSI, Universite de Rouen, UFR Sciences, CEDEX, France

Joost Van Beusekom, Technical University of Kaiserslautern, Germany

Daniel Keysers, Technical University of Kaiserslautern, Germany

Faisal Shafait, Technical University of Kaiserslautern, Germany

Thomas M. Breuel, Technical University of Kaiserslautern, Germany

Simone Marinai, Universita di Firenze, Italy

Emanuele Marino, Universita di Firenze, Italy

Giovanni Soda, Universita di Firenze, Italy

Vasiliki Kokla, University of Westminster, Watford Road, UK

Alexandra Psarrou, University of Westminster, Watford Road, UK

Vassilis Konstantinou, University of Westminster, Watford Road, UK

V. EGLIN, LIRIS INSA de Lyon, Villeurbanne cedex - France

F. LEBOURGEOIS, LIRIS INSA de Lyon, Villeurbanne cedex - France

S. BRES, LIRIS INSA de Lyon, Villeurbanne cedex - France

H. EMPTOZ, LIRIS INSA de Lyon, Villeurbanne cedex - France

Y. LEYDIER, LIRIS INSA de Lyon, Villeurbanne cedex - France

I. MOALLA, LIRIS INSA de Lyon, Villeurbanne cedex - France

F. DRIRA, LIRIS INSA de Lyon, Villeurbanne cedex - France

Bjorn Gottfried, University of Bremen, Germany

Sarbani Palit, Computer Vision & Pattern Recognition Unit

Utpal Garain, Computer Vision & Pattern Recognition Unit

Toshihiro KANAHORI, Tsukuba University of Technology,Ibaraki, Japan

Masakazu SUZUKI, Kyushu University, Fukuoka, Japan

I. MOALLA, University of Sfax, ENIS, DGE, BP. W-3038 - Sfax, Tunisia

A. M. ALIMI, University of Sfax, ENIS, DGE, BP. W-3038 - Sfax, Tunisia

F. LEBOURGEOIS, Laboratoire d'InfoRmatique en Images et Syst?mes d'information (LIRIS)

H. EMPTOZ, Laboratoire d'InfoRmatique en Images et Syst?mes d'information (LIRIS)

Xiaofan Lin, Hewlett-Packard Laboratories, Palo Alto, CA

Kazuki Ashida, Shinshu University, Matsumoto, Japan

Masayuki Okamoto, Shinshu University, Nagano, Japan

Hiroki Imai, Seiko Epson Corporation

Tsubasa Nakatsuka, Seiko Epson Corporation

Xiangwen Liao, Graduate School of the Chinese Academy of Sciences, Beijing, P.R.China

Binxing Fang, Chinese Academy of Sciences Beijing, P.R.China

Weihua Luo, Chinese Academy of Sciences Beijing, P.R.China

Bin Wang, Chinese Academy of Sciences Beijing, P.R.China

Ergina Kavallieratou, University of the Aegean, Karlovassi, Greece

Efstathios Stamatatos, University of the Aegean, Karlovassi, Greece

Fadoua DRIRA, UMR 5205 du CNRS- INSA de LYON, France

Alessandro Ledda, Telin Department, Ghent University, Gent, Belgium

Hiep Q. Luong, Telin Department, Ghent University, Gent, Belgium

Wilfried Philips, Telin Department, Ghent University, Gent, Belgium

Valerie De Witte, Department of Applied Mathematics & Computer Science, Ghent University, Gent, Belgium

Etienne E. Kerre, Department of Applied Mathematics & Computer Science, Ghent University, Gent, Belgium

Xiaowei Shao, University of Science and Technology of China

Zhengkai Liu, University of Science and Technology of China

Houqiang Li, University of Science and Technology of China

Elisa H. Barney Smith, Boise State University, Boise, Idaho, USA

Henry Baird, Lehigh University, Bethlehem, Pennsylvania, USA

William Barrett, Brigham Young University, Provo, Utah, USA

Frank Le Bourgeois, LIRIS I.N.S.A. de Lyon, Villeurbanne Cedex, France

Xiaofan Lin, Hewlett Packard Labs, Palo Alto, California, USA

George Nagy, Rensselaer Polytechnic Institute, Troy, New York, USA

Steve Simske, Hewlett Packard Labs, Palo Alto, California, USA