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- DIAL
- 2006
- Second International Conference on Document Image Analysis for Libraries (DIAL'06)
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Second International Conference on Document Image Analysis for Libraries (DIAL'06)
Lyon, France
April 27-April 28
ISBN: 0-7695-2531-8
Table of Contents
 | Introduction |
 | Introduction Paper |
George Nagy, Rensselaer Polytechnic Institute, Troy, NY
pp. 2-11
 | Chapter 1. Handwritten Documents Segmentation and Recognition |
Stephane Nicolas, Universite de Rouen UFR des Sciences et Techniques, Cedex, France
Thierry Paquet, Universite de Rouen UFR des Sciences et Techniques, Cedex, France
Laurent Heutte, Universite de Rouen UFR des Sciences et Techniques, Cedex, France
pp. 46-59
 | Chapter 2. OCR and Layout Analysis for Multilingual Printed Documents |
V. Eglin, LIRIS INSA de Lyon, Villeurbanne cedex - FRANCE
J.Y Ramel, LI-RFAI Jean Portalis TOURS - FRANCE
pp. 60-69
S. Mandal, CST Dept., B. E. & Science University, India
A. K. Das, CST Dept., B. E. & Science University, India
pp. 70-81
Linlin Li, National University of Singapore, Kent Ridge, Singapore
Chew Lim Tan, National University of Singapore, Kent Ridge, Singapore
pp. 82-87
Bogdan Savchynskyy, International Research and Training Center of Information Technologies and Systems, Kiev, Ukraine
Olexander Kamotskyy, International Research and Training Center of Information Technologies and Systems, Kiev, Ukraine
pp. 88-95
 | Chapter 3. DIA Applications for Digital Libraries |
Jose Borbinha, INESC-ID - Instituto de Engenharia de Sistemas e Computadores, Lisboa, Portugal
Joao Gil, INESC-ID - Instituto de Engenharia de Sistemas e Computadores, Lisboa, Portugal
Gilberto Pedrosa, INESC-ID - Instituto de Engenharia de Sistemas e Computadores, Lisboa, Portugal
Joao Penas, INESC-ID - Instituto de Engenharia de Sistemas e Computadores, Lisboa, Portugal
pp. 116-125
Eka Meyer, National Institute of Informatics, Tokyo, Japan
Sonoko Sato, National Institute of Informatics, Tokyo, Japan
Ryo Kamida, National Institute of Informatics, Tokyo, Japan
Kinji Ono, National Institute of Informatics, Tokyo, Japan
pp. 133-144
J.Y. Ramel, Ecole Polytechnique de l?Universite de Tours, France
S. Busson, CESR - UMR 6576 du CNRS Tours, France
pp. 145-155
Bertrand Couasnon, IRISA / INSA, Campus universitaire de Beaulieu, Rennes Cedex, France
pp. 172-179
 | Chapter 4. Documents Images Indexing and Retrieval |
Nawei Chen, Queen's University, Kingston, Ontario, Canada
pp. 180-197
Chen Huang, CEDAR, University at Buffalo(SUNY), NY
Gady Agam, Illinois Institute of Technology, Chicago
pp. 198-203
Surapong Uttama, Universite de la Rochelle, Avenue Michel Crepeau, La Rochelle CEDEX, France
Jean-Marc Ogier, Universite de la Rochelle, Avenue Michel Crepeau, La Rochelle CEDEX, France
Sebastien Adam, Laboratoire PSI, Universite de Rouen, UFR Sciences, CEDEX, France
pp. 220-231
 | Chapter 5. Other Trends in DIA |
V. EGLIN, LIRIS INSA de Lyon, Villeurbanne cedex - France
S. BRES, LIRIS INSA de Lyon, Villeurbanne cedex - France
H. EMPTOZ, LIRIS INSA de Lyon, Villeurbanne cedex - France
Y. LEYDIER, LIRIS INSA de Lyon, Villeurbanne cedex - France
I. MOALLA, LIRIS INSA de Lyon, Villeurbanne cedex - France
F. DRIRA, LIRIS INSA de Lyon, Villeurbanne cedex - France
pp. 265-280
I. MOALLA, University of Sfax, ENIS, DGE, BP. W-3038 - Sfax, Tunisia
A. M. ALIMI, University of Sfax, ENIS, DGE, BP. W-3038 - Sfax, Tunisia
F. LEBOURGEOIS, Laboratoire d'InfoRmatique en Images et Syst?mes d'information (LIRIS)
H. EMPTOZ, Laboratoire d'InfoRmatique en Images et Syst?mes d'information (LIRIS)
pp. 303-311
 | Chapter 6. DIA Evaluation and Document Image Quality |
Xiaofan Lin, Hewlett-Packard Laboratories, Palo Alto, CA
pp. 312-319
Xiangwen Liao, Graduate School of the Chinese Academy of Sciences, Beijing, P.R.China
Binxing Fang, Chinese Academy of Sciences Beijing, P.R.China
Weihua Luo, Chinese Academy of Sciences Beijing, P.R.China
Bin Wang, Chinese Academy of Sciences Beijing, P.R.China
pp. 332-339
Valerie De Witte, Department of Applied Mathematics & Computer Science, Ghent University, Gent, Belgium
Etienne E. Kerre, Department of Applied Mathematics & Computer Science, Ghent University, Gent, Belgium
pp. 358-367
Houqiang Li, University of Science and Technology of China
pp. 368-372
Henry Baird, Lehigh University, Bethlehem, Pennsylvania, USA
Xiaofan Lin, Hewlett Packard Labs, Palo Alto, California, USA
George Nagy, Rensselaer Polytechnic Institute, Troy, New York, USA
Steve Simske, Hewlett Packard Labs, Palo Alto, California, USA
pp. 373-376
 | Author Index |
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