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2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Vancouver, British Columbia Canada
October 03-October 05
ISBN: 978-0-7695-4556-1
Table of Contents
Papers
O. N. Arjmand, Math. & Stat. Dept., Amirkabir Univ. of Technol., Tehran, Iran
H. Pedram, Comput. Eng. & Inf. Technol. Dept., Amirkabir Univ. of Technol., Tehran, Iran
M. Raji, Comput. Eng. & Inf. Technol. Dept., Amirkabir Univ. of Technol., Tehran, Iran
B. Ghavami, Comput. Eng. & Inf. Technol. Dept., Amirkabir Univ. of Technol., Tehran, Iran
pp. 86-92
F. Lombardi, Dept. of ECE, Northeastern Univ., Boston, MA, USA
H. Pedram, Dept. of CEIT, Amirkabir Univ. of Technol., Tehran, Iran
M. Zamani, Dept. of ECE, Northeastern Univ., Boston, MA, USA
pp. 146-152
Author Index (PDF)
pp. 481-482
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