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22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)
Rome, Italy
September 26-September 28
ISBN: 0-7695-2885-6
Table of Contents
Introduction
Session 1 - Reliable NoCs and SoCs
Young Bok Kim, Northeastern University, Boston, MA
Yong-Bin Kim, Northeastern University, Boston, MA
pp. 12-20
Armin Alaghi, University of Tehran, 14399 Tehran, IRA
Naghmeh Karimi, University of Tehran, 14399 Tehran, IRA
Mahshid Sedghi, University of Tehran, 14399 Tehran, IRA
Zainalabedin Navabi, University of Tehran, 14399 Tehran, IRA
pp. 21-29
Abderrahim Doumar, University of Technology of Troyes, France
Kentaroh Katoh, University of Technology of Troyes, France
Hideo Ito, University of Technology of Troyes, France
pp. 30-40
Session 2 - Single Event Effects
Hossein Asadi, Northeastern University Boston, MA
Mehdi B. Tahoori, Northeastern University Boston, MA
Chandra Tirumurti, Intel Corporation
pp. 41-49
Sybille Hellebrand, University of Paderborn
Christian G. Zoellin, University of Stuttgart
Hans-Joachim Wunderlich, University of Stuttgart
Stefan Ludwig, Fraunhofer IIS-EAS Dresden
Torsten Coym, Fraunhofer IIS-EAS Dresden
Bernd Straube, Fraunhofer IIS-EAS Dresden
pp. 50-58
Mario García Valderas, Universidad Carlos III de Madrid
Raúl Fernández Cardenal, Universidad Carlos III de Madrid
Celia López Ongil, Universidad Carlos III de Madrid
Marta Portela García, Universidad Carlos III de Madrid
Luis Entrena, Universidad Carlos III de Madrid
pp. 68-78
Session 3 - Defect and Fault Tolerance
A. Manuzzato, Università di Padova
P. Rech, Università di Padova
S. Gerardin, Università di Padova
A. Paccagnella, Università di Padova
L. Sterpone, Politecnico di Torino
M. Violante, Politecnico di Torino
pp. 79-86
S. Pontarelli, University of Rome
L. Sterpone, Politecnico di Torino
G.C. Cardarilli, University of Rome
M. Re, University of Rome
M. Sonza Reorda, Politecnico di Torino
A. Salsano, University of Rome
M. Violante, Politecnico di Torino
pp. 96-104
Session 4 - Fault Injection and Reliability Analysis
M. Alderighi, INAF, Istituto di Astrofisica Spaziale e Fisica Cosmica, Milano, ITALY
F. Casini, Sanitas EG s.r.l., Milano, ITALY
S. D'Angelo, INAF, Istituto di Astrofisica Spaziale e Fisica Cosmica, Milano, ITALY
S. Pastore, Sanitas EG s.r.l., Milano, ITALY
G.R. Sechi, INAF, Istituto di Astrofisica Spaziale e Fisica Cosmica, Milano, ITALY
R. Weigand, ESA/ESTEC, European Space Agency, Noordwijk, THE NETHERLANDS
pp. 105-113
A. Benso, Politecnico di Torino, Italy
A. Bosio, Politecnico di Torino, Italy
S. Di Carlo, Politecnico di Torino, Italy
R. Mariani, Yogitech S.p.A, San Martino Ulmiano Pisa, Italy
pp. 114-122
G. Beltrame, European Space Agency
C. Bolchini, Politecnico di Milano, Italy
L. Fossati, Politecnico di Milano, Italy
A. Miele, Politecnico di Milano, Italy
D. Sciuto, Politecnico di Milano, Italy
pp. 132-142
Interactive Poster Session
Yoon-Hwa Choi, Hongik University, Seoul, Korea
Myeong-Hyeon Lee, Hongik University, Seoul, Korea
pp. 143-151
Martin Straka, Brno University of Technology
Jiri Tobola, Brno University of Technology
Zdenek Kotasek, Brno University of Technology
pp. 152-160
Ravi Bonam, University of Missouri-Rolla, Rolla, MO 65409-0040, USA
Yong-Bin Kim, Northeastern University, Boston, MA 02115, USA
Minsu Choi, University of Missouri-Rolla, Rolla, MO 65409-0040, USA
pp. 161-169
A. Matrosova, Tomsk State University, RUSSIA
E. Loukovnikova, Tomsk State University, RUSSIA
S. Ostanin, Tomsk State University, RUSSIA
A. Zinchuck, Tomsk State University, RUSSIA
E. Nikolaeva, Tomsk State University, RUSSIA
pp. 206-214
Takashi Aikyo, Semiconductor Technology Academic Research Center
Hiroshi Takahashi, Ehime University
Yoshinobu Higami, Ehime University
Junichi Ootsu, Ehime University
pp. 223-234
Session 5 - Testing and Design for Testability
Hiroshi Takahashi, Ehime University
Yoshinobu Higami, Ehime University
Toru Kikkawa, Ehime University
Takashi Aikyo, Ehime University
Yuzo Takamatsu, Ehime University
Koji Yamazaki, Meiji University
Toshiyuki Tsutsumi, Meiji University
Hiroyuki Yotsuyanagi, University of Tokushima
Masaki Hashizume, University of Tokushima
pp. 243-251
Abhijit Jas, Advanced Test Technology, Intel Corporation
Srinivas Patil, Advanced Test Technology, Intel Corporation
pp. 252-260
Ilya Levin, Tel Aviv University, Israel
Benjamin Abramov, Tel Aviv University, Israel
Vladimir Ostrovsky, Tel Aviv University, Israel
pp. 261-272
Session 6 - Soft Errors
Weidong Kuang, University of Texas Pan American, Edinburg
Casto Manuel Ibarra, University of Texas Pan American, Edinburg
Peiyi Zhao, Chapman University, Orange, CA
pp. 273-281
J. Lagos-Benites, Pontificia Universidad Católica del Perú, Lima, Perú
D. Appello, STMicroelectronics, Milano, Italy
P. Bernardi, Politecnico di Torino, Torino, Italy
M. Grosso, Politecnico di Torino, Torino, Italy
D. Ravotto, Politecnico di Torino, Torino, Italy
E. Sánchez, Politecnico di Torino, Torino, Italy
M. Sonza Reorda, Politecnico di Torino, Torino, Italy
pp. 291-302
Session 7 - Defect and Fault Tolerance
J. Semião, Univ. of Algarve, Portugal
J. J. Rodríguez-Andina, Univ. of Vigo, Spain
F. Vargas, PUCRS, Brazil
M. B. Santos, IST / INESC-ID, Portugal
I. C. Teixeira, IST / INESC-ID, Portugal
J. P. Teixeira, IST / INESC-ID, Portugal
pp. 303-311
Laura Frigerio, Politecnico di Milano, Dip. di Elettronica e Informazione
Fabio Salice, Politecnico di Milano, Dip. di Elettronica e Informazione
pp. 312-320
Erik Schuler, Universidade Federal do Rio Grande do Sul
Adão Júnior Antônio de Souza, Universidade Federal do Rio Grande do Sul
Luigi Carro, Universidade Federal do Rio Grande do Sul
pp. 321-330
Session 8 - Dependable Solutions for Memories and Storage
Costas Argyrides, University of Bristol, UK
Hamid R. Zarandi, Amirkabir University of Technology, Tehran, IRAN
Dhiraj K. Pradhan, University of Bristol, UK
pp. 340-348
Session 9 - Reliable Design Techniques
Portolan Michele, TIMA Laboratory (CNRS, InPG, UJF), France
Leveugle Régis, TIMA Laboratory (CNRS, InPG, UJF), France
pp. 370-378
G. Xenoulis, University of Piraeus, Greece
M. Psarakis, University of Piraeus, Greece
D. Gizopoulos, University of Piraeus, Greece
A. Paschalis, University of Athens, Greece
pp. 379-397
Session 10 - Emerging Technologies - 1
Masoud Hashempour, Northeastern University, Dept. of ECE, Boston MA
Zahra Mashreghian Arani, Northeastern University, Dept. of ECE, Boston MA
Fabrizio Lombardi, Northeastern University, Dept. of ECE, Boston MA
pp. 400-408
Helia Naeimi, California Institute of Technology
Andre DeHon, University of Pennsylvania
pp. 409-417
Michelangelo Grosso, Politecnico di Torino, Torino, Italy
Maurizio Rebaudengo, Politecnico di Torino, Torino, Italy
Matteo Sonza Reorda, Politecnico di Torino, Torino, Italy
pp. 418-426
Session 11 - Testing
Session 12 - Emerging Technologies - 2
J. Huang, Northeastern University, Boston, MA
X. Ma, Northeastern University, Boston, MA
C. Metra, University of Bologna, Bologna, Italy
F. Lombardi, Northeastern University, Boston, MA
pp. 469-477
M. Ottavi, Northeastern University
H. Hashempour, Northeastern University
V. Vankamamidi, Northeastern University
F. Karim, University of British Columbia
K. Walus, University of British Columbia
A. Ivanov, University of British Columbia
pp. 487-498
Session 13 - Reliable Applications
P. Maistri, TIMA Laboratory - 46 Avenue Félix Viallet - 38031 Grenoble Cedex - FRANCE
P. Vanhauwaert, TIMA Laboratory - 46 Avenue Félix Viallet - 38031 Grenoble Cedex - FRANCE
R. Leveugle, TIMA Laboratory - 46 Avenue Félix Viallet - 38031 Grenoble Cedex - FRANCE
pp. 499-507
Francesco Regazzoni, University of Lugano, Lugano, Switzerland
Thomas Eisenbarth, Horst Gortz Institute for IT Security, RUB, Bochum, Germany
Johann Großschädl, University of Bristol, Bristol, UK
Luca Breveglieri, Politecnico di Milano, Milano, Italy
Paolo Ienne, EPFL, Lausanne, Switzerland.
Israel Koren, University of Massachusetts
Christof Paar, Horst Gortz Institute for IT Security, RUB, Bochum, Germany
pp. 508-516
Jozsef Dudas, Simon Fraser University
Michelle L. La Haye, Simon Fraser University
Jenny Leung, Simon Fraser University
Glenn H. Chapman, Simon Fraser University
pp. 517-525
Jenny Leung, Simon Fraser University
Jozsef Dudas, Simon Fraser University
Glenn H. Chapman, Simon Fraser University
Israel Koren, University of Massachusetts
Zahava Koren, University of Massachusetts
pp. 526-534
Author Index
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