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2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (2007)
Rome, Italy
Sept. 26, 2007 to Sept. 28, 2007
ISBN: 0-7695-2885-6
TABLE OF CONTENTS
Introduction
Committees (PDF)
pp. xiii
pp. xiv
Session 1 - Reliable NoCs and SoCs
Avijit Dutta , University of Texas, Austin, TX
Nur A. Touba , University of Texas, Austin, TX
pp. 3-11
Young Bok Kim , Northeastern University, Boston, MA
Yong-Bin Kim , Northeastern University, Boston, MA
pp. 12-20
Armin Alaghi , University of Tehran, 14399 Tehran, IRA
Naghmeh Karimi , University of Tehran, 14399 Tehran, IRA
Mahshid Sedghi , University of Tehran, 14399 Tehran, IRA
Zainalabedin Navabi , University of Tehran, 14399 Tehran, IRA
pp. 21-29
Kentaroh Katoh , University of Technology of Troyes, France
Abderrahim Doumar , University of Technology of Troyes, France
pp. 30-40
Session 2 - Single Event Effects
Hossein Asadi , Northeastern University Boston, MA
Chandra Tirumurti , Intel Corporation
pp. 41-49
Sybille Hellebrand , University of Paderborn
Christian G. Zoellin , University of Stuttgart
Hans-Joachim Wunderlich , University of Stuttgart
Stefan Ludwig , Fraunhofer IIS-EAS Dresden
Torsten Coym , Fraunhofer IIS-EAS Dresden
Bernd Straube , Fraunhofer IIS-EAS Dresden
pp. 50-58
Raúl Fernández Cardenal , Universidad Carlos III de Madrid
Mario García Valderas , Universidad Carlos III de Madrid
Marta Portela García , Universidad Carlos III de Madrid
Luis Entrena , Universidad Carlos III de Madrid
pp. 68-78
Session 3 - Defect and Fault Tolerance
P. Rech , Università di Padova
S. Gerardin , Università di Padova
A. Paccagnella , Università di Padova
L. Sterpone , Politecnico di Torino
A. Manuzzato , Università di Padova
pp. 79-86
L. Sterpone , Politecnico di Torino
G.C. Cardarilli , University of Rome
M. Re , University of Rome
M. Sonza Reorda , Politecnico di Torino
S. Pontarelli , University of Rome
M. Violante , Politecnico di Torino
pp. 96-104
Session 4 - Fault Injection and Reliability Analysis
F. Casini , Sanitas EG s.r.l., Milano, ITALY
S. D'Angelo , INAF, Istituto di Astrofisica Spaziale e Fisica Cosmica, Milano, ITALY
S. Pastore , Sanitas EG s.r.l., Milano, ITALY
G.R. Sechi , INAF, Istituto di Astrofisica Spaziale e Fisica Cosmica, Milano, ITALY
M. Alderighi , INAF, Istituto di Astrofisica Spaziale e Fisica Cosmica, Milano, ITALY
pp. 105-113
A. Benso , Politecnico di Torino, Italy
A. Bosio , Politecnico di Torino, Italy
S. Di Carlo , Politecnico di Torino, Italy
R. Mariani , Yogitech S.p.A, San Martino Ulmiano Pisa, Italy
pp. 114-122
Riccardo Mariani , YOGITECH SpA
Peter Fuhrmann , Philips Research Europe, Germany
pp. 123-131
C. Bolchini , Politecnico di Milano, Italy
L. Fossati , Politecnico di Milano, Italy
A. Miele , Politecnico di Milano, Italy
G. Beltrame , European Space Agency
pp. 132-142
Interactive Poster Session
Yoon-Hwa Choi , Hongik University, Seoul, Korea
Myeong-Hyeon Lee , Hongik University, Seoul, Korea
pp. 143-151
Martin Straka , Brno University of Technology
Jiri Tobola , Brno University of Technology
Zdenek Kotasek , Brno University of Technology
pp. 152-160
Yong-Bin Kim , Northeastern University, Boston, MA 02115, USA
Minsu Choi , University of Missouri-Rolla, Rolla, MO 65409-0040, USA
pp. 161-169
Piotr Zajac , University of Toulouse, France
Jacques Henri Collet , University of Toulouse, France
pp. 197-205
E. Loukovnikova , Tomsk State University, RUSSIA
S. Ostanin , Tomsk State University, RUSSIA
A. Matrosova , Tomsk State University, RUSSIA
E. Nikolaeva , Tomsk State University, RUSSIA
pp. 206-214
Hiroshi Takahashi , Ehime University
Takashi Aikyo , Semiconductor Technology Academic Research Center
Junichi Ootsu , Ehime University
pp. 223-234
Session 5 - Testing and Design for Testability
Irith Pomeranz , Purdue University
pp. 235-242
Yoshinobu Higami , Ehime University
Toru Kikkawa , Ehime University
Takashi Aikyo , Ehime University
Yuzo Takamatsu , Ehime University
Koji Yamazaki , Meiji University
Toshiyuki Tsutsumi , Meiji University
Hiroyuki Yotsuyanagi , University of Tokushima
Masaki Hashizume , University of Tokushima
pp. 243-251
Abhijit Jas , Advanced Test Technology, Intel Corporation
pp. 252-260
Ilya Levin , Tel Aviv University, Israel
Benjamin Abramov , Tel Aviv University, Israel
Vladimir Ostrovsky , Tel Aviv University, Israel
pp. 261-272
Session 6 - Soft Errors
Weidong Kuang , University of Texas Pan American, Edinburg
Casto Manuel Ibarra , University of Texas Pan American, Edinburg
Peiyi Zhao , Chapman University, Orange, CA
pp. 273-281
D. Appello , STMicroelectronics, Milano, Italy
P. Bernardi , Politecnico di Torino, Torino, Italy
M. Grosso , Politecnico di Torino, Torino, Italy
D. Ravotto , Politecnico di Torino, Torino, Italy
E. Sánchez , Politecnico di Torino, Torino, Italy
M. Sonza Reorda , Politecnico di Torino, Torino, Italy
pp. 291-302
Session 7 - Defect and Fault Tolerance
J. J. Rodríguez-Andina , Univ. of Vigo, Spain
F. Vargas , PUCRS, Brazil
M. B. Santos , IST / INESC-ID, Portugal
J. Semião , Univ. of Algarve, Portugal
J. P. Teixeira , IST / INESC-ID, Portugal
pp. 303-311
Laura Frigerio , Politecnico di Milano, Dip. di Elettronica e Informazione
Fabio Salice , Politecnico di Milano, Dip. di Elettronica e Informazione
pp. 312-320
Erik Schuler , Universidade Federal do Rio Grande do Sul
Adão Júnior Antônio de Souza , Universidade Federal do Rio Grande do Sul
Luigi Carro , Universidade Federal do Rio Grande do Sul
pp. 321-330
Session 8 - Dependable Solutions for Memories and Storage
Hamid R. Zarandi , Amirkabir University of Technology, Tehran, IRAN
Dhiraj K. Pradhan , University of Bristol, UK
pp. 340-348
Session 9 - Reliable Design Techniques
Mahmut Yilmaz , Duke University
Albert Meixner , Duke University
Sule Ozev , Duke University
Daniel J. Sorin , Duke University
pp. 361-369
Portolan Michele , TIMA Laboratory (CNRS, InPG, UJF), France
pp. 370-378
M. Psarakis , University of Piraeus, Greece
D. Gizopoulos , University of Piraeus, Greece
G. Xenoulis , University of Piraeus, Greece
pp. 379-397
Session 10 - Emerging Technologies - 1
Susumo Horiguchi , Tohuko University
Luke Demoracski , Northeastern University
Fabrizio Lombardi , Northeastern University
pp. 391-399
Masoud Hashempour , Northeastern University, Dept. of ECE, Boston MA
Fabrizio Lombardi , Northeastern University, Dept. of ECE, Boston MA
pp. 400-408
Helia Naeimi , California Institute of Technology
pp. 409-417
Maurizio Rebaudengo , Politecnico di Torino, Torino, Italy
Matteo Sonza Reorda , Politecnico di Torino, Torino, Italy
pp. 418-426
Mandar V. Joshi , University of Missouri-Rolla
pp. 427-438
Session 11 - Testing
Session 12 - Emerging Technologies - 2
J. Huang , Northeastern University, Boston, MA
X. Ma , Northeastern University, Boston, MA
C. Metra , University of Bologna, Bologna, Italy
F. Lombardi , Northeastern University, Boston, MA
pp. 469-477
Timothy J. Dysart , University of Notre Dame
Peter M. Kogge , University of Notre Dame
pp. 478-486
H. Hashempour , Northeastern University
V. Vankamamidi , Northeastern University
F. Karim , University of British Columbia
M. Ottavi , Northeastern University
A. Ivanov , University of British Columbia
pp. 487-498
Session 13 - Reliable Applications
P. Vanhauwaert , TIMA Laboratory - 46 Avenue Félix Viallet - 38031 Grenoble Cedex - FRANCE
P. Maistri , TIMA Laboratory - 46 Avenue Félix Viallet - 38031 Grenoble Cedex - FRANCE
pp. 499-507
Thomas Eisenbarth , Horst Gortz Institute for IT Security, RUB, Bochum, Germany
Johann Großschädl , University of Bristol, Bristol, UK
Luca Breveglieri , Politecnico di Milano, Milano, Italy
Paolo Ienne , EPFL, Lausanne, Switzerland.
Francesco Regazzoni , University of Lugano, Lugano, Switzerland
Christof Paar , Horst Gortz Institute for IT Security, RUB, Bochum, Germany
pp. 508-516
Jozsef Dudas , Simon Fraser University
Michelle L. La Haye , Simon Fraser University
Jenny Leung , Simon Fraser University
Glenn H. Chapman , Simon Fraser University
pp. 517-525
Jozsef Dudas , Simon Fraser University
Glenn H. Chapman , Simon Fraser University
Israel Koren , University of Massachusetts
Zahava Koren , University of Massachusetts
pp. 526-534
Author Index
Author Index (PDF)
pp. 535
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