Weidong Kuang, Casto Manuel Ibarra, Peiyi Zhao, "Soft Error Hardening for Asynchronous Circuits," 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), pp. 273-281, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007.

@article{ 10.1109/DFT.2007.15,
author = {Weidong Kuang and Casto Manuel Ibarra and Peiyi Zhao},
title = {Soft Error Hardening for Asynchronous Circuits},
journal ={2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)},
volume = {0},
year = {2007},
isbn = {0-7695-2885-6},
pages = {273-281},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.15},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
TI - Soft Error Hardening for Asynchronous Circuits
SN - 0-7695-2885-6
SP273
EP281
A1 - Weidong Kuang,
A1 - Casto Manuel Ibarra,
A1 - Peiyi Zhao,
PY - 2007
KW - null
VL - 0
JA - 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
ER -