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2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (2006)
Arlington, Virginia, USA
Oct. 4, 2006 to Oct. 6, 2006
ISBN: 0-7695-2706-X
TABLE OF CONTENTS
Introduction
Invited Talk
Session 1: Adaptive Design and Gate Level Redundancy
Ramyanshu Datta , The University of Texas at Austin, USA
Jacob A. Abraham , The University of Texas at Austin, USA
Abdulkadir Utku Diril , Nvidia Corporation
Abhijit Chatterjee , Georgia Institute of Technology, USA
Kevin Nowka , IBM Austin Research Laboratory, USA
pp. 3-11
Tian Xia , University of Vermont, USA
Stephen Wyatt , IBM Microelectronics Division, USA
Rupert Ho , IBM Microelectronics Division, USA
pp. 12-19
Kristian Granhaug , University of Oslo, Norway
Snorre Aunet , University of Oslo, Norway
pp. 20-28
V. Beiu , United Arab Emirates University, United Arab Emirates
W. Ibrahim , United Arab Emirates University, United Arab Emirates
Y.A. Alkhawwar , United Arab Emirates University, United Arab Emirates
M.H. Sulieman , United Arab Emirates University, United Arab Emirates
pp. 29-40
Session 2: Delay Test
N. Devtaprasanna , University of Iowa, USA
A. Gunda , LSI Logic Corp., USA
P. Krishnamurthy , LSI Logic Corp., USA
S. M. Reddy , University of Iowa, USA
I. Pomeranz , Purdue University, USA
pp. 41-49
Kyriakos Christou , University of Cyprus, Cyprus
Maria K. Michael , University of Cyprus, Cyprus
Spyros Tragoudas , Southern Illinois University, USA
pp. 50-58
Hangkyu Lee , Purdue University, USA
Suriyaprakash Natarajan , Intel Corporation, USA
Srinivas Patil , Intel Corporation, USA
Irith Pomeranz , Purdue University, USA
pp. 59-70
Session 3: Emerging Technologies
X. Ma , Northeastern University, USA
J. Huang , Northeastern University, USA
C. Metra , University of Bologna, Italy
F. Lombardi , Northeastern University, USA
pp. 71-79
Minsu Choi , University of Missouri-Rolla, USA
Myungsu Choi , Oklahoma State University, USA
Zachary Patitz , Oklahoma State University, USA
Nohpill Park , Oklahoma State University, USA
pp. 80-88
Byunghyun Jang , Northeastern University, USA
Yong-Bin Kim , Northeastern University, USA
Fabrizio Lombardi , Northeastern University, USA
pp. 89-97
Yadunandana Yellambalase , University of Missouri-Rolla, USA
Minsu Choi , University of Missouri-Rolla, USA
Yong-Bin Kim , Northeastern University, USA
pp. 98-106
Reza M.P. Rad , University of Maryland Baltimore County, USA
Mohammad Tehranipoor , University of Maryland Baltimore County, USA
pp. 107-118
Session 4: Test Compression
Sverre Wichlund , Nordic Semiconductor, Norway
Frank Berntsen , Nordic Semiconductor, Norway
Einar J. Aas , Norwegian University of Science and Technology, Norway
pp. 119-127
Hamidreza Hashempour , Northeastern University, USA
Fabrizio Lombardi , Northeastern University, USA
pp. 128-135
Gang Zeng , Nagoya University, Japan
Youhua Shi , Waseda University, Japan
Toshinori Takabatake , Shonan Institute of Technology, Japan
Masao Yanagisawa , Waseda University, Japan
Hideo Ito , Chiba University, Japan
pp. 136-144
Geewhun Seok , University of Texas at Austin, USA
Il-Soo Lee , University of Texas at Austin, USA
Tony Ambler , University of Texas at Austin, USA
B. F. Womack , University of Texas at Austin, USA
pp. 145-156
Invited Talk
Session 5: Defect Tolerance and Error Correction
Vijay Jain , University of South Florida, USA
Glenn H. Chapman , Simon Fraser University, Canada
pp. 157-165
Akhil Garg , STMicroelectronics India Pvt. Ltd., India
Prashant Dubey , STMicroelectronics India Pvt. Ltd., India
pp. 166-174
Hiroyuki Ohde , Tokyo Institute of Technology, Japan
Haruhiko Kaneko , Japan Aerospace Exploration Agency, Japan
Eiji Fujiwara , Tokyo Institute of Technology, Japan
pp. 175-183
Gong Rui , National University of Defense Technology, P.R. China
Chen Wei , National University of Defense Technology, P.R. China
Liu Fang , National University of Defense Technology, P.R. China
Dai Kui , National University of Defense Technology, P.R. China
Wang Zhiying , National University of Defense Technology, P.R. China
pp. 184-196
Session 6: BIST and Pseudo-Functional Test
Yuejian Wu , Nortel, Canada
Andre Ivanov , Univ. of British Columbia, Canada
pp. 197-205
Avijit Dutta , University of Texas, USA
Nur A. Touba , University of Texas, USA
pp. 206-214
Abhijit Jas , Intel Corporation
Yi-Shing Chang , Intel Corporation
Sreejit Chakravarty , Intel Corporation
pp. 215-226
Session 7: Reliability Evaluation and Analysis
S. Pontarelli , Universita di Roma "Tor Vergata", Italy
M. Ottavi , Northeastern University, USA
V. Vankamamidi , Northeastern University, USA
A. Salsano , Universita di Roma "Tor Vergata", Italy
F. Lombardi , Northeastern University, USA
pp. 227-235
Xingguo Xiong , University of Bridgeport, USA
Yu-Liang Wu , The Chinese University of Hong Kong, Hong Kong
Wen-Ben Jone , University of Cincinnati, USA
pp. 236-244
Sanghoan Chang , Texas A&M University, USA
Gwan Choi , Texas A&M University, USA
pp. 245-253
Andr? V. Fidalgo , Instituto Superior de Engenharia do Porto, Portugal
Gustavo R. Alves , Instituto Superior de Engenharia do Porto, Portugal
Jos? M. Ferreira , Faculdade de Engenharia da Universidade do Porto, Portugal
pp. 254-264
Session 8: Approaches for Soft Errors
M. Rebaudengo , Politecnico di Torino, Italy
L. Sterpone , Politecnico di Torino, Italy
M. Violante , Politecnico di Torino, Italy
C. Bolchini , Politecnico di Milano, Italy
A. Miele , Politecnico di Milano, Italy
D. Sciuto , Politecnico di Milano, Italy
pp. 265-273
Ilia Polian , Albert-Ludwigs-University, Germany
Bernd Becker , Albert-Ludwigs-University, Germany
Masato Nakasato , Nara Institute of Science and Technology, Japan
Satoshi Ohtake , Nara Institute of Science and Technology, Japan
Hideo Fujiwara2 , Nara Institute of Science and Technology, Japan
pp. 274-279
C. A. L. Lisb? , Univ. Fed. do Rio Grande do Sul, Brazil
L. Carro , Univ. Fed. do Rio Grande do Sul, Brazil
M. Sonza Reorda , Politecnico di Torino, Italy
M. Violante , Politecnico di Torino, Italy
pp. 280-290
Session 9: Interactive Papers
Chuen-Song Chen , University of Rhode Island, USA
Jien-Chung Lo , University of Rhode Island, USA
Tian Xia , University of Vermont, USA
pp. 291-299
Ondrej Nov? , Czech Technical University in Prague, Czech Repub
Zdenek Pl?va , Technical University Liberec, Czech Republic
Jiri Jenicek , Technical University Liberec, Czech Republic
Zbynek Mader , Technical University Liberec, Czech Republic
Michal Jarkovsk? , Technical University Liberec, Czech Republic
pp. 300-308
Lei Fang , Virginia Tech, USA
Michael S. Hsiao , Virginia Tech, USA
pp. 309-317
Sandeep Dechu , Southern Illinois University Carbondale, USA
Manoj Kumar Goparaju , Southern Illinois University Carbondale, USA
Spyros Tragoudas , Southern Illinois University Carbondale, USA
pp. 318-326
Yoichi Sasaki , Chiba University, Japan
Kazuteru Namba , Chiba University, Japan
Hideo Ito , Chiba University, Japan
pp. 327-335
Ajoy K. Palit , University of Bremen, Germany
Kishore K. Duganapalli , University of Bremen, Germany
Walter Anheier , University of Bremen, Germany
pp. 336-344
?. Michels , UFRGS, Brazil
L. Petroli , UFRGS, Brazil
C.A.L. Lisb? , UFRGS, Brazil
F. Kastensmidt , UFRGS, Brazil
L. Carro , UFRGS, Brazil
pp. 345-352
Yusuke Fukushima , Tohoku University, Japan
Masaru Fukushi , Tohoku University, Japan
Susumu Horiguchi , Tohoku University, Japan
pp. 353-361
Yu-Jen Huang , National Central University, Taiwan
Da-Ming Chang , National Central University, Taiwan
Jin-Fu Li , National Central University, Taiwan
pp. 362-370
M. Ottavi , Northeastern University Boston, USA
S. Pontarelli , Universit? di Roma "Tor Vergata", Italy
A. Leandri , Universit? di Roma "Tor Vergata", Italy
A. Salsano , Universit? di Roma "Tor Vergata", Italy
pp. 371-379
Christian El Salloum , Vienna University of Technology, Austria
Andreas Steininger , Vienna University of Technology, Austria
Peter Tummeltshammer , Vienna University of Technology, Austria
Werner Harter , Robert Bosch GmbH, Germany
pp. 380-388
Yasser Sedaghat , Sharif University of Technology, Iran
Seyed Ghassem Miremadi , Sharif University of Technology, Iran
Mahdi Fazeli , Sharif University of Technology, Iran
pp. 389-400
Session 10: Diagnosis
Hiroshi Takahashi , Ehime University, Japan
Shuhei Kadoyama , Ehime University, Japan
Yoshinobu Higami , Ehime University, Japan
Yuzo Takamatsu , Ehime University, Japan
Koji Yamazaki , Meiji University, Japan
Takashi Aikyo , Semiconductor Technology Academic Research Center (STARC)
Yasuo Sato , Semiconductor Technology Academic Research Center (STARC)
pp. 401-109
Yukiya Miura , Tokyo Metropolitan University, Japan
Jiro Kato , Tokyo Metropolitan University, Japan
pp. 410-418
Irith Pomeranz , Purdue University, USA
Sudhakar M. Reddy , University of Iowa, USA
pp. 419-427
Ying-Yen Chen , National Tsing Hua University, Taiwan
Jing-Jia Liou , National Tsing Hua University, Taiwan
pp. 428-438
Session 11: Defect and Fault Tolerance in Sensors and NOCs
Jozsef Dudas , Simon Fraser University, Canada
Cory Jung , Simon Fraser University, Canada
Linda Wu , Simon Fraser University, Canada
Glenn H. Chapman , Simon Fraser University, Canada
Israel Koren , University of Massachusetts, USA
Zahava Koren , University of Massachusetts, USA
pp. 439-447
Michelle L. La Haye , Simon Fraser University, Canada
Cory Jung , Simon Fraser University, Canada
David Chen , Simon Fraser University, Canada
Glenn H. Chapman , Simon Fraser University, Canada
Jozsef Dudas , Simon Fraser University, Canada
pp. 448-456
Cristian Grecu , University of British Columbia, Canada
Andr? Ivanov , University of British Columbia, Canada
Res Saleh , University of British Columbia, Canada
Partha Pratim Pande , Washington State University, USA
pp. 457-465
Partha Pratim Pande , Washington State University, USA
Amlan Ganguly , Washington State University, USA
Brett Feero , Washington State University, USA
Benjamin Belzer , Washington State University, USA
Cristian Grecu , University of British Columbia, Canada
pp. 466-476
Session 12: Test Techniques
Zhiyuan He , Link?ping University, Sweden
Zebo Peng , Link?ping University, Sweden
Petru Eles , Link?ping University, Sweden
Paul Rosinger , University of Southampton, UK
Bashir M. Al-Hashimi , University of Southampton, UK
pp. 477-485
Fengming Zhang , LTX Corporation, USA
Warren Necoechea , LTX Corporation, USA
Peter Reiter , LTX Corporation, USA
Yong-Bin Kim , Northeastern University, USA
Fabrizio Lombardi , Northeastern University, USA
pp. 486-494
Xiaojun Ma , Northeastern University, USA
Fabrizio Lombardi , Northeastern University, USA
pp. 495-506
Session 13: Processor Checking and Jitter
Federico Rota , University of Illinois-Chicago, USA
Shantanu Dutt , University of Illinois-Chicago, USA
Sahithi Krishna , University of Illinois-Chicago, USA
pp. 507-515
Joonhyuk Yoo , University of Maryland at College Park, USA
Manoj Franklin , University of Maryland at College Park, USA
pp. 516-524
Nandakumar P. Venugopal , University at Buffalo, The State University of New York, USA
Nihal Shastry , University at Buffalo, The State University of New York, USA
Shambhu J. Upadhyaya , University at Buffalo, The State University of New York, USA
pp. 525-534
Di Mu , University of Vermont, USA
Tian Xia , University of Vermont, USA
Hao Zheng , Univerisity of South Florida, USA
pp. 534-544
Session 14: Fault Tolerance Designs
Lushan Liu, , State University of New York at Buffalo, USA
Ramalingam Sridhar , State University of New York at Buffalo, USA
Shambhu Upadhyaya , State University of New York at Buffalo, USA
pp. 545-553
Tadayoshi Horita , Polytechnic University
Takurou Murata , Polytechnic University
Itsuo Takanami , Polytechnic University
pp. 554-562
M. Ferringer , TU Vienna, Austria
G. Fuchs , TU Vienna, Austria
A. Steininger , TU Vienna, Austria
G. Kempf , Austrian Aerospace GmbH, Austria
pp. 563-571
Mehran Mozaffari Kermani , University of Western Ontario, Canada
Arash Reyhani-Masoleh , University of Western Ontario, Canada
pp. 572-580
Author Index
Author Index (PDF)
pp. 581-583
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