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2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (2005)
Monterey, California
Oct. 3, 2005 to Oct. 5, 2005
ISBN: 0-7695-2464-8
TABLE OF CONTENTS
Cover
Introduction
Committees (PDF)
pp. xii
Yield Analysis and Modeling
Mehdi B. Tahoori , Northeastern University, Boston, MA
pp. 3-11
Zhaojun Wo , University of Massachusetts
Israel Koren , University of Massachusetts
Maciej Ciesielski , University of Massachusetts
pp. 12-20
Xingguo Xiong , Chinese University of Hong Kong
Yu-Liang Wu , Chinese University of Hong Kong
Wen-Ben Jone , Chinese University of Hong Kong
pp. 21-32
Scan Design and Test Data Compression
Jinkyu Lee , University of Texas, Austin
Nur A. Touba , University of Texas, Austin
pp. 33-41
Samuel I. Ward , IBM Systems andTechnology Group
Chris Schattauer , University of Texas, Austin
Nur A. Touba , University of Texas, Austin
pp. 42-50
Jeremy Lee , University of Maryland Baltimore County
Mohammed Tehranipoor , University of Maryland Baltimore County
Chintan Patel , University of Maryland Baltimore County
Jim Plusquellic , University of Maryland Baltimore County
pp. 51-62
Reconfiguration
Masaru Fukushi , Tohoku University
Yusuke Fukushima , Tohoku University
Susumu Horiguchi , Tohoku University
pp. 63-71
L. Breveglieri , Politecnico di Milano, Milano, ITALY
I. Koren , University of Massachusetts, Amherst
P. Maistri , Politecnico di Milano, Milano, ITALY
pp. 72-80
Chin-Lung Su , National Tsing Hua University
Yi-Ting Yeh , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 81-92
Error Correcting Codes and Circuits
S. Bayat-Sarmadi , University of Waterloo, ON, Canada
M. A. Hasan , University of Waterloo, ON, Canada
pp. 102-110
G.C. Cardarilli , University of Rome
S. Pontarelli , University of Rome
M. Re , University of Rome
A. Salsano , University of Rome
pp. 111-119
Jien-Chung Lo , University of Rhode Island
Yu-Lun Wan , University of Rhode Island
Eiji Fujiwara , Tokyo Institute of Technology
pp. 120-130
Fault Detection and Tolerance for Sensor and Flash Memory
B. Saillet , IMT - Technop?le de Ch?teau Gombert
J.M. Portal , IMT - Technop?le de Ch?teau Gombert
D. N? , ST-Microelectronics ZI de Rousset BP 2
pp. 131-139
Cory Jung , Simon Fraser University,
Mohammad H. Izadi , Simon Fraser University
Michelle L. La Haye , Simon Fraser University
pp. 140-148
Glenn H. Chapman , Simon Fraser University
Israel Koren , University of Massachusetts, Amherst
Zahava Koren , University of Massachusetts, Amherst
Jozsef Dudas , Simon Fraser University
Cory Jung , Simon Fraser University
pp. 149-157
Glenn H. Chapman , Simon Fraser University
Vijay Jain , University of South Florida, Tampa
Shekhar Bhansal , University of South Florida, Tampa
pp. 158-168
Invited Talks
Delay Fault Test and Timing Consideration
C. Metra , DEIS Univ. of Bologna
M. Oma? , DEIS Univ. of Bologna
D. Rossi , DEIS Univ. of Bologna
J. M. Cazeaux , DEIS Univ. of Bologna
TM Mak , DEIS Univ. of Bologna
pp. 169-177
Lei Wu , Texas A&M University
D. M. H. Walker , Texas A&M University
pp. 178-186
Nisar Ahmed , ASIC Product Development Center, Texas Instruments India
Mohammad Tehranipoor , Univ. of Maryland Baltimore
pp. 187-198
Defect and Fault Tolerant Design in QCA Circuits
M. Momenzadeh , Northeastern University
J. Huang , Northeastern University
F. Lombardi , Northeastern University
pp. 199-207
Mariam Momenzadeh , Northeastern University, Boston
Marco Ottavi , Northeastern University, Boston
Fabrizio Lombardi , Northeastern University, Boston
pp. 208-216
Zachary D. Patitz , Oklahoma State University
Nohpill Park , Oklahoma State University
Minsu Choi , University of Missouri-Rolla
Fred J. Meyer , Wichita State University, Kansas
pp. 217-228
Interconnect Test
David M. Horan , Cork Institute of Technology, Cork, IRELAND
Richard A. Guinee , Cork Institute of Technology, Cork, IRELAND
pp. 229-237
Cristian Grecu , University of British Columbia
Partha Pande , University of British Columbia
Baosheng Wang , University of British Columbia
Andr? Ivanov , University of British Columbia
Res Saleh , University of British Columbia
pp. 238-246
Roberto Gomez , National Institute for Astrophysics, Optics and Electronics - INAOE
Alejandro Giron , National Institute for Astrophysics, Optics and Electronics - INAOE
Victor Champac , National Institute for Astrophysics, Optics and Electronics - INAOE
pp. 247-258
Case Studies and Applications
G.C. Cardarilli , University of Rome
S. Pontarelli , University of Rome
M. Re , University of Rome
A. Salsano , University of Rome
pp. 259-265
Mahdi Fazeli , Sharif University of Technology
Reza Farivar , Sharif University of Technology
Seyed Ghassem Miremadi , Sharif University of Technology
pp. 266-274
G. Cellere , Padova University
A. Paccagnella , Padova University
A. Visconti , STMicroelectronics Central R&D
M. Bonanomi , STMicroelectronics Central R&D
pp. 275-284
Kyung Ki Kim , Northeastern University, Boston
Jing Huang , Northeastern University, Boston
Yong-Bin Kim , Northeastern University, Boston
Fabrizio Lombardi , Northeastern University, Boston
pp. 285-293
Kyung Ki Kim , Northeastern University, Boston
Yong-Bin Kim , Northeastern University, Boston
Fabrizio Lombardi , Northeastern University, Boston
pp. 294-304
Interactive Session
Erik Schuler , Universidade Federal do Rio Grande do Sul
Luigi Carro , Universidade Federal do Rio Grande do Sul
pp. 314-324
D. P. Vasudevan , University of Arkansas, Fayetteville
P. K. Lala , University of Arkansas, Fayetteville
pp. 325-333
C. Bolchini , Politecnico di Milano
A. Miele , Politecnico di Milano
F. Salice , Politecnico di Milano
D. Sciuto , Politecnico di Milano
pp. 334-342
Vladimir Ostrovsky , Bar-Ilan University, Ramat Gan
Ilya Levin , Bar-Ilan University, Ramat Gan
pp. 343-351
Daniele Rossi , DEIS, University of Bologna
Martin Oma? , DEIS, University of Bologna
Fabio Toma , DEIS, University of Bologna
Cecilia Metra , DEIS, University of Bologna
pp. 352-360
Fang Yu , Institute of Information Science, Academia Sinica
Chung-Hung Tsai , Institute of Information Science, Academia Sinica
Yao-Wen Huang , Institute of Information Science, Academia Sinica
D. T. Lee , Institute of Information Science, Academia Sinica
Hung-Yau Lin , National Taiwan University
Sy-Yen Kuo , National Taiwan University
pp. 361-370
J. Di , University of Arkansas
P.K. Lala , University of Arkansas
D. Vasudevan , University of Arkansas
pp. 371-379
Bhushan Vaidya , Northeastern University, Boston, MA
Mehdi B. Tahoori , Northeastern University, Boston, MA
pp. 380-388
Pedram A. Riahi , Northeastern University
Zainalabedin Navabi , Northeastern University
Fabrizio Lombardi , Northeastern University
pp. 389-397
Zhuo Zhang , University of Iowa
Sudhakar M. Reddy , University of Iowa
Irith Pomeranz , Purdue University
pp. 398-405
Ahmad Al-Yamani , KFUPM, Dhahran, Saudi Arabia
Narendra Devta-Prasanna , Univ. of Iowa, Iowa
Arun Gunda , LSI Logic Corp.
pp. 406-414
Leonard Lee , ECE, UC-Santa Barbara
Sean Wu , ECE, UC-Santa Barbara
Charles H-P Wen , ECE, UC-Santa Barbara
Li-C. Wang , ECE, UC-Santa Barbara
pp. 415-426
Approaches for Soft Error
Wei Zhang , ECE, Southern Illinois Univ. Carbondale
pp. 427-435
L. Sterpone , Politecnico di Torino
M. Violante , Politecnico di Torino
pp. 436-444
P. Bernardi , Politecnico di Torino
L. Bolzani , Politecnico di Torino
M. Rebaudengo , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
M. Violante , Politecnico di Torino
pp. 445-453
Jeetendra Kumar , Analog Devices Inc.
Mehdi B. Tahoori , Northeastern University
pp. 454-462
Hossein Asadi , Northeastern University
Mehdi B. Tahoori , Northeastern University
pp. 463-474
On-line and Concurrent Fault Detection
Irith Pomeranz , Purdue University
Sudhakar M. Reddy , University of Iowa
pp. 475-483
Song Peng , Cornell University
Rajit Manohar , Cornell University
pp. 484-493
E. S?nchez , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
G. Squillero , Politecnico di Torino
pp. 494-504
Fault and Error Tolerant Systems
Masato Kitakami , Chiba University
Manabu Sueishi , Chiba University
pp. 505-513
Hyukjune Chung , University of Southern California
Antonio Ortega , University of Southern California
pp. 514-522
In Suk Chong , University of Southern California
Antonio Ortega , University of Southern California
pp. 523-534
Test Scheduling and Software-based Test
M. Hatzimihail , University of Piraeus, Greece
M. Psarakis , University of Piraeus, Greece
G. Xenoulis , University of Piraeus, Greece
D. Gizopoulos , University of Piraeus, Greece
A. Paschalis , University of Athens, Greece
pp. 535-543
Enkelejda Tafaj , University of Southampton
Paul Rosinger , University of Southampton
Bashir M. Al-Hashimi , University of Southampton
Krishnendu Chakrabarty , Duke University
pp. 544-551
Chunsheng Liu , University of Nebraska-Lincoln
Kugesh Veeraraghavant , University of Nebraska-Lincoln
Vikram Iyengar , IBM Microelectronics
pp. 552-562
Testing and Design for Analog Circuits
Shaolei Quan , Michigan State University, USA
Meng-Yao Liu , Natinal Central University, Taiwan
Chin-Long Wey , Natinal Central University, Taiwan
pp. 563-572
Yukiya Miura , Tokyo Metropolitan University
pp. 573-581
Michael Wieckowski , University of Rochester
John Liobe , University of Rochester
Quentin Diduck , University of Rochester
Martin Margala , University of Rochester
pp. 582-590
Sadeka Ali , University of Rochester
Gregory J. Briggs , University of Rochester
Martin Margala , University of Rochester
pp. 591-600
Author Index
Author Index (Abstract)
pp. 601
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