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2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (2004)
Cannes, France
Oct. 10, 2004 to Oct. 13, 2004
ISBN: 0-7695-2241-6
TABLE OF CONTENTS
Committees (PDF)
pp. xii
Session 1: Yield and Defects I
Roman Barsky , Technion, Haifa, Israel
Israel A. Wagner , IBM Haifa Labs, Israel
pp. 2-10
X. Wang , IBM Corp, Essex Junction (VT) USA
M. Ottavi , Northeastern University Boston (MA) USA
F. Meyer , Wichita State University Wichita (KS) USA
F. Lombardi , Northeastern University Boston (MA) USA
pp. 11-19
Yu-Tsao Hsing , National Tsing Hua University, Hsinchu, Taiwan
Chih-Wea Wang , National Tsing Hua University, Hsinchu, Taiwan
Ching-Wei Wu , National Tsing Hua University, Hsinchu, Taiwan
Chih-Tsun Huang , National Tsing Hua University, Hsinchu, Taiwan
Cheng-Wen Wu , National Tsing Hua University, Hsinchu, Taiwan
pp. 20-28
Session 2: Yield and Defects II
Jing Huang , Northeastern University, Boston, MA
Mariam Momenzadeh , Northeastern University, Boston, MA
Mehdi B. Tahoori , Northeastern University, Boston, MA
Fabrizio Lombardi , Northeastern University, Boston, MA
pp. 30-38
Alexandre Schmid , Swiss Federal Institute of Technology EPFL, Switzerland
Yusuf Leblebici , Swiss Federal Institute of Technology EPFL, Switzerland
pp. 39-47
Shanrui Zhang , University of Missouri-Rolla
Minsu Choi , University of Missouri-Rolla
Nohpill Park , Oklahoma State University, Stillwater
Fabrizio Lombardi , Northeastern University, Boston
pp. 48-56
Session 3: Optoelectronics
Michelle L. La Haye , Simon Fraser University, Canada
Glenn H. Chapman , Simon Fraser University, Canada
Cory Jung , Simon Fraser University, Canada
Desmond Y. H. Cheung , Simon Fraser University, Canada
Sunjaya Djaja , Simon Fraser University, Canada
Benjamin Wang , Simon Fraser University, Canada
Gary Liaw , Simon Fraser University, Canada
Yves Audet , ?cole Polytechnique, Canada
pp. 58-66
Glenn H. Chapman , Simon Fraser University, Canada
Vijay Jain , University of South Florida, Tampa, Florida
pp. 67-75
Session 4: Defect and Fault Tolerance
Ammar Aljer , University of Sciences and Technologies of Lille 1
Philippe Devienne , University of Sciences and Technologies of Lille 1
pp. 78-86
Mohamed Abbas , University of Tokyo, Japan
Makoto Ikeda , University of Tokyo, Japan
Kunihiro Asada , University of Tokyo, Japan
pp. 87-95
Jing Huang , Northeastern University, Boston, MA
Mehdi B. Tahoori , Northeastern University, Boston, MA
Fabrizio Lombardi , Northeastern University, Boston, MA
pp. 96-104
Session 5: Memory Test
S. Bertazzoni , University of Rome "Tor Vergata", Italy
D. Di Giovenale , University of Rome "Tor Vergata", Italy
M. Salmeri , University of Rome "Tor Vergata", Italy
A. Mencattini , University of Rome "Tor Vergata", Italy
A. Salsano , University of Rome "Tor Vergata", Italy
M. Florean , University of Rome "Tor Vergata", Italy
J. Wyss , INFN Sezione di Pisa, Italy
R. Rando , INFN Sezione di Padova, Italy
S. Lora , Istituto per la Sintesi Organica e la Fotoreattivit?, Italy
pp. 106-110
X. Wang , IBM Corp, Essex Junction (VT) USA
M. Ottavi , Northeastern University Boston (MA) USA
F. Lombardi , Northeastern University Boston (MA) USA
pp. 111-119
Baosheng Wang , University of British Columbia, Vancouver, Canada
Yuejian Wu , Nortel Networks, Ontario, Canada
Andr? Ivanov , University of British Columbia, Vancouver, Canada
pp. 120-128
Session 6: Diagnosis
Guido Bertoni , STMicroelectronics, Milano, Italy
Luca Breveglieri , Politecnico di Milano, Italy
Israel Koren , University of Massachusetts, Amherst
Paolo Maistri , Politecnico di Milano, Italy
pp. 130-138
Shi-Yu Huang , National Tsing-Hua University, Taiwan
pp. 139-147
Session 7: Error Correcting Codes
H. Hashempour , Northeastern University, Boston, Mass
F. Lombardi , Northeastern University, Boston, Mass
pp. 150-157
G. C. Cardarilli , University of Rome "Tor Vergata", Italy
M. Ottavi , University of Rome "Tor Vergata", Italy
S. Pontarelli , University of Rome "Tor Vergata", Italy
M. Re , University of Rome "Tor Vergata", Italy
A. Salsano , University of Rome "Tor Vergata", Italy
pp. 158-164
Ping-Hsun Hsieh , National Taiwan University, Taipei
Ing-Yi Chen , National Taipei University of Technology, Taiwan
Yu-Ting Lin , National Taiwan University, Taipei
Sy-Yen Kuo , National Taiwan University, Taipei
pp. 165-172
Session 8: Interconnect Faults
Ajoy K. Palit , University of Bremen, Germany
V. Meyer , University of Bremen, Germany
W. Anheier , University of Bremen, Germany
Juergen Schloeffel , Philips Semiconductors, Germany
pp. 174-182
Irith Pomeranz , Purdue University, W. Lafayette, IN
Sudhakar M. Reddy , University of Iowa, Iowa City
pp. 183-190
M. Favalli , DI - University of Ferrara, Italy
pp. 191-199
Session 9: RF and High Speed Circuits
Martin Oma? , D.E.I.S. University of Bologna, Italy
Daniele Rossi , D.E.I.S. University of Bologna, Italy
Cecilia Metra , D.E.I.S. University of Bologna, Italy
pp. 202-210
Tejasvi Das , Rochester Institute of Technology
Anand Gopalan , Rochester Institute of Technology
Clyde Washburn , Rochester Institute of Technology
P. R. Mukund , Rochester Institute of Technology
pp. 211-219
Jerzy Dabrowski , Link?ping University, Sweden
Javier Gonzalez Bayon , Link?ping University, Sweden
pp. 220-228
Session 10: Analog Testing
Ad?o A. de Souza Jr. , Instituto de Inform?tica -UFRGS. Porto Alegre, Brazil
Luigi Carro , Instituto de Inform?tica -UFRGS. Porto Alegre, Brazil
pp. 239-247
Session 11: Interactive Session
L. Anghel , TIMA Laboratory, Grenoble, France
E. Sanchez , Politecnico di Torino, Italy
M. Sonza Reorda , Politecnico di Torino, Italy
G. Squillero , Politecnico di Torino, Italy
R. Velazco , TIMA Laboratory, Grenoble, France
pp. 250-255
Ireneusz Gosciniak , University of Silesia in Katowice, Poland
pp. 256-263
Najwa Aaraj , American University of Beirut, Lebanon
Anis Nazer , American University of Beirut, Lebanon
Ali Chehab , American University of Beirut, Lebanon
Ayman Kayssi , American University of Beirut, Lebanon
pp. 264-271
Brian Peng , National Taiwan University
Ing-Yi Chen , National Taipei University of Technology
Sy-Yen Kuo , National Taiwan University
Colin Bolger , VIA Technology Incorporation, Taiwan
pp. 272-279
Arvind Kumar , Cornell University, Ithaca, NY
Sandip Tiwari , Cornell University, Ithaca, NY
pp. 280-288
C. A. L. Lisb? , UFRGS, Brasil
L. Carro , UFRGS, Brasil
pp. 289-297
Yinhe Han , Chinese Academy of Sciences, Beijing, China
Yu Hu , Chinese Academy of Sciences, Beijing, China
Huawei Li , Chinese Academy of Sciences, Beijing, China
Xiaowei Li , Chinese Academy of Sciences, Beijing, China
Anshuman Chandra , Synopsys, Inc., Mountain View, CA
pp. 298-305
Hung-Yau Lin , National Taiwan University, Taipei
Fu-Min Yeh , Chung-Shan Institute of Science and Technology, Taoyuan, Taiwan
Ing-Yi Chen , University of Technology, Taipei, Taiwan
Sy-Yen Kuo , National Taiwan University, Taipei
pp. 306-313
S. Bhunia , Purdue University, IN
H. Mahmoodi , Purdue University, IN
A. Raychowdhury , Purdue University, IN
K. Roy , Purdue University, IN
pp. 314-315
H. Hashempour , Northeastern University, Boston, MA
L. Schiano , Northeastern University, Boston, MA
F. Lombardi , Northeastern University, Boston, MA
pp. 316-323
D. P. Vasudevan , University of Arkansas, Fayetteville
P. K. Lala , University of Arkansas, Fayetteville
J. P. Parkerson , University of Arkansas, Fayetteville
pp. 324-331
Nitin Parimi , University of Alberta, Canada
Xiaoling Sun , University of Alberta, Canada
pp. 332-338
Naotake Kamiura , University of Hyogo, Japan
Teijiro Isokawa , University of Hyogo, Japan
Nobuyuki Matsui , University of Hyogo, Japan
pp. 339-346
John Y. Fong , Texas Instruments, Dallas, TX
Randy Acklin , Texas Instruments, Dallas, TX
John Roscher , Texas Instruments, Dallas, TX
Feng Li , Agilent Technologies, Santa Clara, CA
Cindy Laird , Agilent Technologies, Santa Clara, CA
Cezary Pietrzyk , Agilent Technologies, Santa Clara, CA
pp. 347-355
Shanrui Zhang , University of Missouri-Rolla
Minsu Choi , University of Missouri-Rolla
Nohpill Park , Oklahoma State University, Stillwater
pp. 356-364
Session 12: Error Detection and Correction
M. Favalli , DI - University of Ferrara, Italy
pp. 366-376
Wayne Burleson , University of Massachusetts, Amherst
Israel Koren , University of Massachusetts, Amherst
Atul Maheshwari , University of Massachusetts, Amherst
pp. 377-385
Nicola Bombieri , Universit? di Verona
Franco Fummi , Universit? di Verona
Graziano Pravadelli , Universit? di Verona
pp. 386-394
Yung-Yuan Chen , Chung-Hua University, Hsin-Chu, Taiwan
Kun-Feng Chen , Chung-Hua University, Hsin-Chu, Taiwan
pp. 395-402
Session 13: System-on-Chip Test
P. Bernardi , Politecnico di Torino, Italy
M. Rebaudengo , Politecnico di Torino, Italy
M. Sonza Reorda , Politecnico di Torino, Italy
pp. 404-412
Gang Zeng , Chiba University, Japan
Hideo Ito , Chiba University, Japan
pp. 413-421
Session 14: Circuit and System Reliability and Dependability
M. Sonza Reorda , Politecnico di Torino, Italy
M. Violante , Politecnico di Torino, Italy
pp. 424-432
C. Bolchini , Politecnico di Milano
A. Miele , Politecnico di Milano
F. Salice , Politecnico di Milano
D. Sciuto , Politecnico di Milano
L. Pomante , CEFRIEL, Milano, Italy
pp. 433-441
T. Feng , Oklahoma State University, Stillwater
N. Park , Oklahoma State University, Stillwater
Y. Kim , Northeastern University, Boston, MA
F. Lombardi , Northeastern University, Boston, MA
F. J. Meyer , Wichita State University, KS
pp. 442-450
R. Leveugle , TIMA Laboratory, France
D. Cimonnet , TIMA Laboratory, France
A. Ammari , TIMA Laboratory, France
pp. 451-458
Session 15: Novel Test Approaches
Jennifer Dworak , Texas A&M University, College Station, Texas
James Wingfield , Texas A&M University, College Station, Texas
M. Ray Mercer , Texas A&M University, College Station, Texas
pp. 460-468
Irith Pomeranz , Purdue University, W. Lafayette, IN
Sudhakar M. Reddy , University of Iowa, Iowa City
pp. 469-476
Session 16: FPGA and Reconfigurable Circuits
Yen-Lin Peng , National Tsing Hua University, Hsinchu, Taiwan
Jing-Jia Liou , National Tsing Hua University, Hsinchu, Taiwan
Chih-Tsun Huang , National Tsing Hua University, Hsinchu, Taiwan
Cheng-Wen Wu , National Tsing Hua University, Hsinchu, Taiwan
pp. 478-486
Masaru Fukushi , Tohoku University, Japan
Susumu Horiguchi , Tohoku University, Japan
pp. 496-504
Author Index (PDF)
pp. 505-506
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