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2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (2003)
Boston, Massachusetts
Nov. 3, 2003 to Nov. 5, 2003
ISBN: 0-7695-2042-1
TABLE OF CONTENTS
Introduction
Committees (PDF)
pp. xii
Session 1: Yield and Defects
X. Wang , Northeastern University
M. Ottavi , Northeastern University
F. Lombardi , Northeastern University
pp. 3
Tianxu Zhao , Baoji College of Arts and Sciences and Xidian University
Xuchao Duan , Baoji College of Arts and Sciences
Yue Hao , Xidian University
Peijun Ma , Xidian University
pp. 11
Meng Lu , Hyperchip Inc.
Yvon Savaria , Ecole Polytechnique de Montr?al
Bing Qiu , Hyperchip Inc.
Jacques Taillefer , Hyperchip Inc.
pp. 18
D. K. de Vries , Philips Semiconductors Crolles R&D
P. L. C. Simon , Philips Semiconductors Crolles R&D
pp. 26
T. Feng , Oklahoma State University
Y.B. Kim , Northeastern University
V. Piuri , University of Milan
pp. 34
Session 2: Optoelectronics
Vijay Jain , University of South Florida
Glenn Chapman , Simon Fraser University
pp. 45
Sunjaya Djaja , Simon Fraser University
Glenn H. Chapman , Simon Fraser University
Desmond Y.H. Cheung , Simon Fraser University
Yves Audet , Ecole Polytechnique
pp. 53
Session 3: Fault Analysis, Injection & Simulation
C. Metra , University of Bologna
T.M. Mak , Intel Corporation
D. Rossi , University of Bologna
pp. 63
M. Alderighi , Istituto di Astrofisica Spaziale e Fisica Cosmica
F. Casini , Sanitas E.G. S.r.L.
S. D'Angelo , Istituto di Astrofisica Spaziale e Fisica Cosmica
M. Mancini , Istituto di Astrofisica Spaziale e Fisica Cosmica
A. Marmo , Universitá degli Studi di Milano
S. Pastore , Sanitas E.G. S.r.L.
G.R. Sechi , Istituto di Astrofisica Spaziale e Fisica Cosmica
pp. 71
Wangqi Qiu , Texas A&M University
Xiang Lu , Texas A&M University
Zhuo Li , Texas A&M University
D. M. H. Walker , Texas A&M University
Weiping Shi , Texas A&M University
pp. 79
Session 4: Test & Diagnosis
Hiroshi Takahashi , Ehime University
Yasunori Tsugaoka , Ehime University
Hidekazu Ayano , Ehime University
Yuzo Takamatsu , Ehime University
pp. 89
L. Schianoand , Northeastern University
F. Lombardi , Northeastern University
pp. 97
Guido Bertoni , Politecnico di Milano
Luca Breveglieri , Politecnico di Milano
Israel Koren , University of Massachusetts at Amherst
Paolo Maistri , Politecnico di Milano
Vincenzo Piuri , Università di Milano
pp. 105
Session 5: Current Test & Diagnosis
Y. Hariri , ?cole de Technologie Sup?rieure Montreal
C. Thibeault , ?cole de Technologie Sup?rieure Montreal
pp. 117
Sagar S. Sabade , Texas A&M University
D. M. H. Walker , Texas A&M University
pp. 132
Session 6: Test Generation & Application
Hamidreza Hashempour , Northeastern University
Fabrizio Lombardi , Northeastern University
pp. 151
Fengming Zhang , Northeastern University
Y.J. Lee , Northeastern University
T. Kane , LTX Corporation
L. Schiano , Northeastern University
M. Momenzadeh , Northeastern University
Y-B Kim , Northeastern University
F.J. Meyer , Northeastern University
F. Lombardi , Northeastern University
S. Max , LTX Corporation
Phil Perkinson , LTX Corporation
pp. 159
James Wingfield , Texas A&M University
Jennifer Dworak , Texas A&M University
M. Ray Mercer , Texas A&M University
pp. 167
Session 7: Scan Design & Test
Sandeep Bhatia , Cadence Design Systems, Inc.
pp. 185
Debjyoti Ghosh , Purdue University
Swarup Bhunia , Purdue University
Kaushik Roy , Purdue University
pp. 191
Session 8: BIST
Kedarnath J. Balakrishnan , University of Texas at Austin
Nur A. Touba , University of Texas at Austin
pp. 209
C.V. Krishna , University of Texas at Austin
Nur A. Touba , University of Texas at Austin
pp. 217
Gert Jervan , Link?ping University
Petru Eles , Link?ping University
Zebo Peng , Link?ping University
Raimund Ubar , Tallinn Technical University
Maksim Jenihhin , Tallinn Technical University
pp. 225
Session 9: Error Correcting Codes
Haruhiko Kaneko , Tokyo Institute of Technology
Eiji Fujiwara , Tokyo Institute of Technology
pp. 242
Whitney J. Townsend , University of Texas at Austin
Jacob A. Abraham , University of Texas at Austin
Earl E. Swartzlander, Jr. , University of Texas at Austin
pp. 250
D. Rossi , University of Bologna
S. Cavallotti , University of Bologna
C. Metra , University of Bologna
pp. 257
Invited Talk
Charles Hawkins , University of New Mexico
Ali Keshavarzi , Intel Corporation
Jaume Segura , University Balearic Islands
pp. 267
Session 10: Analogue & Mixed Signal Test
Kranthi K. Pinjala , Arizona State University
Bruce C. Kim , Arizona State University
pp. 287
Jerzy Dąbrowski , Link?ping University
pp. 295
John M. Emmert , Wright State University
Jason A. Cheatham , Wright State University
Badhri Jagannathan , Wright State University
Sandeep Umarani , Wright State University
pp. 303
Session 11: Defect Tolerance and Testing
Arman Vassighi , University of Waterloo
Oleg Semenov , University of Waterloo
Manoj Sachdev , University of Waterloo
Ali Keshavarzi , Intel Corporation
pp. 313
Eiko Sugawara , Japan Aadvanced Institute of Science and Technology
Masaru Fukushi , Japan Aadvanced Institute of Science and Technology
Susumu Horiguchi , Japan Aadvanced Institute of Science and Technology
pp. 328
A. Ammari , TIMA Laboratory
R. Leveugle , TIMA Laboratory
M. Sonza-Reorda , Politecnico di Torino
M. Violante , Politecnico di Torino
pp. 336
Konstantinos Rokas , Yale University
Yiorgos Makris , Yale University
Dimitris Gizopoulos , University of Piraeus
pp. 344
Shervin Sharifi , University of Tehran
Mohammad Hosseinabadi , University of Tehran
Pedram Riahi , Northeastern University
Zainalabedin Navabi , University of Tehran
pp. 352
John M. Emmert , Wright State University
Jason A. Cheatham , Wright State University
Badhri Jagannathan , Wright State University
Sandeep Umarani , Wright State University
pp. 361
R. A. Ayoubi , University of Balamand
H. A. Ziade , Lebanese University
M. A. Bayoumi , University of Louisiana
pp. 369
B. Nicolescu , TIMA Laboratory
P. Peronnard , TIMA Laboratory
R. Velazco , TIMA Laboratory
Y. Savaria , Ecole Polytechnique de Montr?al
pp. 377
Anders Larsson , Link?pings Universitet
Erik Larsson , Link?pings Universitet
Petru Eles , Link?pings Universitet
Zebo Peng , Link?pings Universitet
pp. 385
N.-J. Park , Oklahoma State University
B. Jin , Oklahoma State University
K.M. George , Oklahoma State University
N. Park , Oklahoma State University
M. Choi , University of Missouri-Rolla
pp. 393
G.C. Cardarilli , University of Rome "Tor Vergata"
M. Ottavi , University of Rome "Tor Vergata"
S. Pontarelli , University of Rome "Tor Vergata"
M. Re , University of Rome "Tor Vergata"
A. Salsano , University of Rome "Tor Vergata"
pp. 401
Cecilia Metra , University of Bologna
Stefano Di Francescantonio , University of Bologna
Martin Omaña , University of Bologna
pp. 417
Dan Zhao , State University of New York at Buffalo
Shambhu Upadhyaya , State University of New York at Buffalo
Martin Margala , University of Rochester
pp. 425
Kartik Mohanram , University of Texas at Austin
Nur A. Touba , University of Texas at Austin
pp. 433
Session 12: FPGA & Memory Test
C. Bolchini , Politecnico di Milano
F. Salice , Politecnico di Milano
D. Sciuto , Politecnico di Milano
R. Zavaglia , Politecnico di Milano
pp. 443
Bai Hong Fang , McMaster University
Nicola Nicolici , McMaster University
pp. 451
M. Nicolaidis , iRoC Technologies
N. Achouri , iRoC Technologies
L. Anghel , TIMA laboratory
pp. 459
Rob Aitken , Artisan Components
Neeraj Dogra , Artisan Components
Dhrumil Gandhi , Artisan Components
Scott Becker , Artisan Components
pp. 467
X. Sun , University of Alberta
B. F. Cockburn , University of Alberta
D. G. Elliott , University of Alberta
pp. 475
Session 13: Design Verification & Synthesis
Hamid R. Zarandi , Sharif University of Technology
Seyed Ghassem Miremadi , Sharif University of Technology
Alireza Ejlali , Sharif University of Technology
pp. 485
L. Anghel , TIMA Laboratory
R. Velazco , TIMA Laboratory
S. Saleh , TIMA Laboratory
S. Deswaertes , TIMA Laboratory
A. El Moucary , TIMA Laboratory
pp. 493
Session 14: SoC & Core Test
Adam B. Kinsman , McMaster University
Jonathan I. Hewitt , McMaster University
Nicola Nicolici , McMaster University
pp. 519
Session 15: System Reliability
F. Corno , Politecnico di Torino
S. Tosato , Politecnico di Torino
P. Gabrielli , Fiat Auto
pp. 529
J. P?rez , Universidad de la Rep?blica
M. Sonza Reorda , Politecnico di Torino
M. Violante , Politecnico di Torino
pp. 537
Session 16: Fault Tolerance
Toshinori Sato , Kyushu Institute of Technology
pp. 547
Yung-Yuan Chen , Chung-Hua University
Shi-Jinn Horng , National Taiwan University of Science & Technology
Hung-Chuan Lai , National Taiwan University of Science & Technology
pp. 555
Session 17: Soft Errors
O. Goloubeva , Politecnico di Torino
M. Rebaudengo , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
M. Violante , Politecnico di Torino
pp. 581
B. Nicolescu , Ecole Polytechnique de Montr?al
Y. Savaria , Ecole Polytechnique de Montr?al
R. Velazco , TIMA Laboratory
pp. 589
Atul Maheshwari , University of Massachusetts at Amherst
Israel Koren , University of Massachusetts at Amherst
Wayne Burleson , University of Massachusetts at Amherst
pp. 597
Author Index
null (PDF)
pp. 605
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