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2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (2001)
San Francisco, California
Oct. 24, 2001 to Oct. 26, 2001
ISBN: 0-7695-1203-8
TABLE OF CONTENTS
Session 1: Wafer Scale
Israel Koren , University of Massachusetts
Zahava Koren , University of Massachusetts
Glenn Chapman , Simon Fraser University
pp. 0003
S.K. Tewksbury , Stevens Institute of Technology
pp. 0011
Yves Audet , Ecole Polytechnique
Glenn H. Chapman , Simon Fraser University
pp. 0018
Session 2: Yield
Thomas S. Barnett , Auburn University
Adit D. Singh , Auburn University
Victor P. Nelson , Auburn University
pp. 0029
Neil Harrison , Philips Semiconductors
pp. 0039
Tianxu Zhao , Xidian University
Yue Hao , Xidian University
Peijun Ma , Xidian University
Taifeng Chen , Xidian University
pp. 0048
Session 3: Dependable Design
P.K. Lala , University of Arkansas
A. Walker , North Carolina A&T State University
pp. 0066
Tat Ngai , University of Texas at Austin
Earl E. Swartzlander Jr , University of Texas at Austin
Chen He , University of Texas at Austin
pp. 0078
Session 4: Testing Techniques 1
J. H. Jiang , National Chung Cheng University
S. C. Chang , National Chung Cheng University
W. B Jone , University of Cincinnati
pp. 0095
Janusz Sosnowski , Warsaw University of Technology
pp. 0104
Ondrej Novak , Technical University Liberec
Jiri Nosek , Technical University Liberec
pp. 0110
Xiaowei Li , Chinese Academy of Sciences
Huawei Li , Chinese Academy of Sciences
Yinghua Min , Chinese Academy of Sciences
pp. 0116
Session 5: Fault-Tolerance in Arrays
Shu-Yi Yu , Stanford University
Edward J. McCluskey , Stanford University
pp. 0125
Session 6: Fault Detection
X.T. Chen , Lucent Technologies
W.K. Huang , Fudan Univ
N. Park , Oklahoma State Univ
F.J. Meyer , Northeastern Univ
F. Lombardi , Northeastern Univ
pp. 0161
C. Bolchini , Politecnico di Milano
F. Salice , Politecnico di Milano
pp. 0170
Seok-Bum Ko , University of Rhode Island
Xia Tian , University of Rhode Island
Jien-Chung Lo , University of Rhode Island
pp. 0176
Session 7: FPGA Based Applications
Monica Alderighi , Istituto di Fisica Cosmica "G. Occhialini"
Fabio Casini , Istituto di Fisica Cosmica "G. Occhialini"
Sergio D'Angelo , Istituto di Fisica Cosmica "G. Occhialini"
Davide Salvi , Istituto di Fisica Cosmica "G. Occhialini"
Giacomo R. Sechi , Istituto di Fisica Cosmica "G. Occhialini"
pp. 0191
Kaijie Wu , Polytechnic University
Ramesh Karri , Polytechnic University
pp. 0200
Wei-Je Huang , Stanford University
Subhasish Mitra , Stanford University
Edward J. McCluskey , Stanford University
pp. 0206
Xiaoling Sun , University of Alberta
Jian Xu , University of Alberta
Pieter Trouborst , Nortel Networks
pp. 0221
Session 8: Fault Injection
J. Gracia , Universidad Polit?cnica de Valencia. Spain
J.C. Baraza , Universidad Polit?cnica de Valencia. Spain
D. Gil , Universidad Polit?cnica de Valencia. Spain
P.J. Gil , Universidad Polit?cnica de Valencia. Spain
pp. 0233
P. Civera , Politecnico di Torino
L. Macchiarulo , Politecnico di Torino
M. Rebaudengo , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
M. Violante , Politecnico di Torino
pp. 0250
R. Velazco , TIMA Laboratory
R. Leveugle , TIMA Laboratory
O. Calvo , Universidad de las Islas Baleares (U.I.B.)
pp. 0259
Session 9: Testing Techniques 2
F. Karimi , Northeastern University
F. Lombardi , Northeastern University
pp. 0271
Paul Lee , LSI Logic HongKong
Alfred Chen , LSI Logic HongKong
Dilip Mathew , LSI Logic HongKong
pp. 0280
Hiroyuki Yotsuyanagi , Univ. of Tokushima
Masaki Hashizume , Univ. of Tokushima
Taisuke Iwakiri , Univ. of Tokushima
Masahiro Ichimiya , Univ. of Tokushima
Takeomi Tamesada , Univ. of Tokushima
pp. 0287
Session 10: Error Correcting Codes
Kazuteru Namba , Tokyo Institute of Technology
Eiji Fujiwara , Tokyo Institute of Technology
pp. 0299
Stanislaw J. Piestrak , Wroclaw University of Technology
Abbas Dandache , University of Metz
Fabrice Monteiro , University of Metz
pp. 0314
Session 11: Mixed Signal Circuits
Xiangdong Xuan , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
pp. 0323
Alvernon Walker , North Carolina A&T State University
pp. 0329
S. Bernard , University of Montpellier
F. Azaïs , University of Montpellier
Y. Bertrand , University of Montpellier
M. Renovell , University of Montpellier
pp. 0338
Mandeep Singh , University of Massachusetts
Israel Koren , University of Massachusetts
pp. 0347
Session 12: Defect Analysis
C. Metra , University of Bologna
S. Di Francescantonio , University of Bologna
B. Ricco' , University of Bologna
T.M. Mak , Intel Corporation
pp. 0357
Pradeep Nagaraj , Qualcomm CDMA Technologies
Kamran Zarrineh , SUN Microelectronics
Dean Adams , IBM Microelectronics
pp. 0366
Mykola Blyzniuk , Lviv Polytechnic National University
Irena Kazymyra , Lviv Polytechnic National University
pp. 0375
Witold A. Pleskacz , Warsaw University of Technology
Dominik Kasprowicz , Warsaw University of Technology
Tomasz Oleszczak , Warsaw University of Technology
Wieslaw Kuzmicz , Warsaw University of Technology
pp. 0384
Session 13: Self-Checking and Fail-Safe Circuits
A. Matrosova , Tomsk State University
S. Ostanin , Tel-Aviv University
I. Levin , Tel-Aviv University
pp. 0395
M. Ottavi , University of Rome
G. C. Cardarilli , University of Rome
D. Cellitti , University of Rome
S. Pontarelli , University of Rome
M. Re , University of Rome
A. Salsano , University of Rome
pp. 0403
Eleftherios Kolonis , iROC Technologies
Michael Nicolaidis , iROC Technologies
pp. 0412
Andreas Steininger , Vienna University of Technology
Christoph Scherrer , Vienna University of Technology
pp. 0418
Session 14: Fault-Tolerant Techniques
Ramesh Karri , Polytechnic University
Kaijie Wu , Polytechnic University
Piyush Mishra , Polytechnic University
Yongkook Kim , IBM Corporation
pp. 0427
Naotake Kamiura , Himeji Institute of Technology
Masashi Tomita , Himeji Institute of Technology
Teijiro Isokawa , Himeji Institute of Technology
Nobuyuki Matsui , Himeji Institute of Technology
pp. 0436
John Emmert , UNC Charlotte
Stanley Baumgart , UNC Charlotte
Pankaj Kataria , UNC Charlotte
Andrew Taylor , UNC Charlotte
Charles Stroud , UNC Charlotte
Miron Abramovici , Agere Systems
pp. 0445
S. Pontarelli , University of Rome
G.C. Cardarilli , University of Rome
A. Malvoni , University of Rome
M. Ottavi , University of Rome
M. Re , University of Rome
A. Salsano , University of Rome
pp. 0455
Ahmad A. Al-Yamani , Stanford University
Nahmsuk Oh , Stanford University
Edward J. McCluskey , Stanford University
pp. 0461
Author Index (PDF)
pp. 0467
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