The Community for Technology Leaders
RSS Icon
Subscribe
2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (2001)
San Francisco, California
Oct. 24, 2001 to Oct. 26, 2001
ISBN: 0-7695-1203-8
TABLE OF CONTENTS
Session 1: Wafer Scale
Zahava Koren , University of Massachusetts
Israel Koren , University of Massachusetts
pp. 0003
S.K. Tewksbury , Stevens Institute of Technology
pp. 0011
Yves Audet , Ecole Polytechnique
pp. 0018
Session 2: Yield
Adit D. Singh , Auburn University
Thomas S. Barnett , Auburn University
pp. 0029
Neil Harrison , Philips Semiconductors
pp. 0039
Yue Hao , Xidian University
Peijun Ma , Xidian University
Taifeng Chen , Xidian University
pp. 0048
Session 3: Dependable Design
P.K. Lala , University of Arkansas
pp. 0066
Earl E. Swartzlander Jr , University of Texas at Austin
Chen He , University of Texas at Austin
pp. 0078
Session 4: Testing Techniques 1
J. H. Jiang , National Chung Cheng University
W. B Jone , University of Cincinnati
pp. 0095
Janusz Sosnowski , Warsaw University of Technology
pp. 0104
Ondrej Novak , Technical University Liberec
pp. 0110
Huawei Li , Chinese Academy of Sciences
Xiaowei Li , Chinese Academy of Sciences
pp. 0116
Session 5: Fault-Tolerance in Arrays
Session 6: Fault Detection
X.T. Chen , Lucent Technologies
N. Park , Oklahoma State Univ
F.J. Meyer , Northeastern Univ
F. Lombardi , Northeastern Univ
pp. 0161
Seok-Bum Ko , University of Rhode Island
Xia Tian , University of Rhode Island
Jien-Chung Lo , University of Rhode Island
pp. 0176
Session 7: FPGA Based Applications
Fabio Casini , Istituto di Fisica Cosmica "G. Occhialini"
Sergio D'Angelo , Istituto di Fisica Cosmica "G. Occhialini"
Davide Salvi , Istituto di Fisica Cosmica "G. Occhialini"
Monica Alderighi , Istituto di Fisica Cosmica "G. Occhialini"
pp. 0191
Kaijie Wu , Polytechnic University
Ramesh Karri , Polytechnic University
pp. 0200
Wei-Je Huang , Stanford University
Subhasish Mitra , Stanford University
Edward J. McCluskey , Stanford University
pp. 0206
Jian Xu , University of Alberta
Xiaoling Sun , University of Alberta
pp. 0221
Session 8: Fault Injection
J.C. Baraza , Universidad Polit?cnica de Valencia. Spain
D. Gil , Universidad Polit?cnica de Valencia. Spain
P.J. Gil , Universidad Polit?cnica de Valencia. Spain
pp. 0233
P. Civera , Politecnico di Torino
L. Macchiarulo , Politecnico di Torino
M. Rebaudengo , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
M. Violante , Politecnico di Torino
pp. 0250
Session 9: Testing Techniques 2
F. Karimi , Northeastern University
F. Lombardi , Northeastern University
pp. 0271
Paul Lee , LSI Logic HongKong
Alfred Chen , LSI Logic HongKong
Dilip Mathew , LSI Logic HongKong
pp. 0280
Masaki Hashizume , Univ. of Tokushima
Taisuke Iwakiri , Univ. of Tokushima
Masahiro Ichimiya , Univ. of Tokushima
Takeomi Tamesada , Univ. of Tokushima
pp. 0287
Session 10: Error Correcting Codes
Stanislaw J. Piestrak , Wroclaw University of Technology
Fabrice Monteiro , University of Metz
pp. 0314
Session 11: Mixed Signal Circuits
Alvernon Walker , North Carolina A&T State University
pp. 0329
F. Azaïs , University of Montpellier
Y. Bertrand , University of Montpellier
S. Bernard , University of Montpellier
pp. 0338
Mandeep Singh , University of Massachusetts
Israel Koren , University of Massachusetts
pp. 0347
Session 12: Defect Analysis
S. Di Francescantonio , University of Bologna
B. Ricco' , University of Bologna
C. Metra , University of Bologna
pp. 0357
Kamran Zarrineh , SUN Microelectronics
Dean Adams , IBM Microelectronics
pp. 0366
Mykola Blyzniuk , Lviv Polytechnic National University
Irena Kazymyra , Lviv Polytechnic National University
pp. 0375
Witold A. Pleskacz , Warsaw University of Technology
Dominik Kasprowicz , Warsaw University of Technology
Tomasz Oleszczak , Warsaw University of Technology
Wieslaw Kuzmicz , Warsaw University of Technology
pp. 0384
Session 13: Self-Checking and Fail-Safe Circuits
A. Matrosova , Tomsk State University
I. Levin , Tel-Aviv University
pp. 0395
M. Ottavi , University of Rome
G. C. Cardarilli , University of Rome
D. Cellitti , University of Rome
S. Pontarelli , University of Rome
M. Re , University of Rome
A. Salsano , University of Rome
pp. 0403
Eleftherios Kolonis , iROC Technologies
Michael Nicolaidis , iROC Technologies
pp. 0412
Andreas Steininger , Vienna University of Technology
Christoph Scherrer , Vienna University of Technology
pp. 0418
Session 14: Fault-Tolerant Techniques
Ramesh Karri , Polytechnic University
Piyush Mishra , Polytechnic University
Yongkook Kim , IBM Corporation
pp. 0427
Naotake Kamiura , Himeji Institute of Technology
Teijiro Isokawa , Himeji Institute of Technology
Nobuyuki Matsui , Himeji Institute of Technology
pp. 0436
John Emmert , UNC Charlotte
Stanley Baumgart , UNC Charlotte
Pankaj Kataria , UNC Charlotte
Andrew Taylor , UNC Charlotte
Charles Stroud , UNC Charlotte
Miron Abramovici , Agere Systems
pp. 0445
G.C. Cardarilli , University of Rome
A. Malvoni , University of Rome
M. Ottavi , University of Rome
M. Re , University of Rome
S. Pontarelli , University of Rome
pp. 0455
Ahmad A. Al-Yamani , Stanford University
Nahmsuk Oh , Stanford University
Edward J. McCluskey , Stanford University
pp. 0461
Author Index (PDF)
pp. 0467
21 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool