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2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (1999)
Albuquerque, New Mexico
Nov. 1, 1999 to Nov. 3, 1999
ISBN: 0-7695-0325-X
TABLE OF CONTENTS
Organizers (PDF)
pp. xii
Keynote Address
Session 1: Yield I
Julie Segal , HPL Incorporated
Sergei Bakarian , HPL Incorporated
Ron Ross , Texas Instruments
pp. 14
Session 2: Yield II
Glenn Chapman , Simon Fraser University
Yves Audet , Mitel Semiconductor
pp. 22
Witold A. Pleskacz , Warsaw University of Technology
pp. 55
Session 3: Testing Techniques
James F. Plusquellic , University of Maryland at Baltimore County
Amy Germida , University of Maryland at Baltimore County
Zheng Yan , University of Maryland at Baltimore County
pp. 68
S.C. Chang , National Chung Cheng University
J.S. Wang , National Chung Cheng University
W.B. Jone , National Chung Cheng University
pp. 77
S. Tragoudas , University of Arizona
pp. 86
Sule Ozev , University of California at San Diego
Alex Orailoglu , University of California at San Diego
pp. 101
Session 4: Built-In Self-Test Architectures
Wenyi Feng , Lucent Technologies
Fabrizio Lombardi , Northeastern University
pp. 112
D. Bakalis , University of Patras and Computer Technology Institute
H.T. Vergos , University of Patras and Computer Technology Institute
D. Nikolos , University of Patras and Computer Technology Institute
G.Ph. Alexiou , University of Patras and Computer Technology Institute
pp. 121
Dimitri Kagaris , Southern Illinois University
Spyros Tragoudas , University of Arizona
pp. 130
Marco Brazzarola , Universit? di Verona
Franco Fummi , Universit? di Verona
pp. 139
Session 5: Fault Modeling and Simulation
G.C. Cardarilli , University of Rome "Tor Vergata"
D. Piergentili , University of Rome "Tor Vergata"
M. Salmeri , University of Rome "Tor Vergata"
A. Salsano , University of Rome "Tor Vergata"
D. Di Giovenale , U.L.I.S.S.E. Consortium
G.C. Grande , U.L.I.S.S.E. Consortium
P. Marinucci , U.L.I.S.S.E. Consortium
S. Sperandei , U.L.I.S.S.E. Consortium
S. Bartalucci , Istituto Nazionale di Fisica Nucleare, Laboratori Nazionali
G. Mazzenga , Istituto Nazionale di Fisica Nucleare, Laboratori Nazionali
M. Ricci , Istituto Nazionale di Fisica Nucleare, Laboratori Nazionali
V. Bidoli , Istituto Nazionale di Fisica Nucleare
D. de Francesco , Istituto Nazionale di Fisica Nucleare
P.G. Picozza , Istituto Nazionale di Fisica Nucleare
A. Rovelli , Istituto Nazionale di Fisica Nucleare, Laboratori Nazionali del Sud
pp. 158
Chi-Feng Wu , National Tsing Hua University
Chih-Tsun Huang , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 165
Fabrizio Ferrandi , Politecnico di Milano
Donatella Sciuto , Politecnico di Milano
Franco Fummi , Universit? di Verona
pp. 174
Firas Khadour , University of Alberta
Xiaoling Sun , University of Alberta
pp. 181
Session 6: Design for Testing
Jin-Fu Li , National Tsing Hua University
pp. 201
Matteo Sonza Reorda , Politecnico di Torino
Marco Torchiano , Politecnico di Torino
Massimo Violante , Politecnico di Torino
pp. 210
Fulvio Corno , Politecnico di Torino
Matteo Sonza Reorda , Politecnico di Torino
Maurizio Rebaudengo , Politecnico di Torino
Massimo Violante , Politecnico di Torino
pp. 219
Session 7: Self-Checking Processing Units and Systems
A. Singh , University of South Florida at Tampa
P.K. Lala , University of South Florida at Tampa
pp. 238
L. Pomante , Politecnico di Milano
D. Sciuto , Politecnico di Milano
C. Bolchini , Politecnico di Milano
pp. 247
W. Lynn Gallagher , University of Texas at Austin
pp. 256
Sergio D'Angelo , Istituto di Fisica Cosmica
Giacomo R. Sechi , Istituto di Fisica Cosmica
Monica Alderighi , Istituto di Fisica Cosmica
pp. 274
Session 8: Self-Checking Memories and Interconnections
Haruhiko Kaneko , Tokyo Institue of Technology
Kiattichai Saowapa , Tokyo Institue of Technology
pp. 284
William D. Armitage , Rhode Island College
Jien-Chung Lo , The University of Rhode Island
pp. 293
S. Bertazzoni , University of Rome "Tor Vergata"
M. Salmeri , University of Rome "Tor Vergata"
A. Salsano , University of Rome "Tor Vergata"
G.C. Cardarilli , University of Rome "Tor Vergata"
pp. 302
Eric J. Stuckey , IBM Research, Tokyo Research Laboratory
Sumio Morioka , IBM Research, Tokyo Research Laboratory
Yasunao Katayama , IBM Research, Tokyo Research Laboratory
pp. 311
Session 9: Diagnosis
Giacomo Sechi , IFC - Consiglio Nazionale delle Ricerche
Cecilia Metra , University of Bologna
pp. 330
Fred J. Meyer , Northeastern University
Jun Zhao , Lucent Technologies
pp. 348
Session 10: Reconfiguration
Xiaotao Chen , Lucent Technologies
Fred J. Meyer , Northeastern University
Fabrizio Lombardi , Northeastern University
pp. 368
Abderrahim Doumar , Chiba University
Satoshi Kaneko , Chiba University
Hideo Ito , Chiba University
pp. 377
John Lach , University of California at Los Angeles
Miodrag Potkonjak , University of California at Los Angeles
pp. 386
Naotake Kamiura , Himeji Institute of Technology
Sumito Nakano , Himeji Institute of Technology
Nobuyuki Matsui , Himeji Institute of Technology
pp. 395
Author Index (PDF)
pp. 404
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