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2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (1998)
Austin, Texas
Nov. 2, 1998 to Nov. 4, 1998
ISBN: 0-8186-8832-7
TABLE OF CONTENTS
pp. xi
Keynote Address
Session 1: Yield and Defect Density
Session 2: Layout and Critical Area
Israel Koren , University of Massachusetts
pp. 28
Neil Harrison , Philips Semiconductors
pp. 37
Invited Presentation
Session 3: Reliability Enhancement
Suriyaprakash Natarajan , University of Southern California
Sandeep K. Gupta , University of Southern California
pp. 73
Session 4: Defect and Fault Analysis
S. Adham , Royal Military College of Canada
C. Rozon , Royal Military College of Canada
M. Hossain , Royal Military College of Canada
D. Racz , Royal Military College of Canada
pp. 84
James F. Plusquellic , University of Maryland
Donald M. Chiarulli , University of Pittsburgh
Steven P. Levitan , University of Pittsburgh
pp. 93
Vijay Sar-Dessai , Texas A&M University
D. M. H. Walker , Texas A&M University
pp. 102
Xiao Sun , Applied Micro Circuits Corporation
Carmie Hull , Applied Micro Circuits Corporation
pp. 108
M. Rebaudengo , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
P.L. Civera , Politecnico di Torino
pp. 117
Panel Session: Fault Tolerance
Session 5: Testing Techniques
Claude Thibeault , ?cole de Technologie Sup?rieure
pp. 126
Session 6: Testing of Regular Structures
Fred J. Meyer , Texas A&M University
Avinash Munshi , Texas A&M University
pp. 146
T. Haniotakis , University of Patras
D. Nikolos , University of Patras
Y. Tsiatouhas , University of Athens
pp. 155
Fred J. Meyer , Texas A&M University
Wei Kang Huang , Fudan University
Fabrizio Lombardi , Northeastern University
pp. 164
Session 7: Concurrent Testing Techniques
Yu-Yau Guo , The University of Rhode Island
pp. 192
Session 8: Fault Diagnosis
Yuejian Wu , Nortern Telecom
pp. 217
Session 9: Fault-Tolerant Designs I
W. Lynn Gallagher , The University of Texas at Austin
Earl E. Swartzlander, Jr. , The University of Texas at Austin
pp. 224
Steve Masson , Universit? du Qu?bec ? Chicoutimi
Daniel Audet , Universit? du Qu?bec ? Chicoutimi
pp. 241
Session 10: Fault-Tolerant Designs II
Samuel Norman Hamilton , University of California at San Diego
Alex Orailoglu , University of California at San Diego
pp. 252
Jien-Chung Lo , The University of Rhode Island
pp. 261
Susumu Horiguchi , Japan Advanced Institute of Science and Technology
Issei Numata , Japan Advanced Institute of Science and Technology
pp. 276
Session 11: High-Level Synthesis of Reliable Systems
S. Chiusano , Politecnico di Torino
F. Corno , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
R. Vietti , Politecnico di Torino
pp. 284
Anna Antola , Politecnico di Milano
Vincenzo Piuri , Politecnico di Milano
Mariagiovanna Sami , Politecnico di Milano
pp. 292
Alex Orailoglu , University of California at San Diego
pp. 301
M. Broglia , Politecnico di Milano
G. Buonanno , Politecnico di Milano
M.G. Sami , Politecnico di Milano
M. Selvini , Politecnico di Milano
pp. 312
Xiaowei Li , The University of Hong Kong
pp. 318
Session 12: Yield and Reliability Issues of Analog and Mixed Signal Circuits
Pramodchandran N. Variyam , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
pp. 335
Ramakrishna Voorakaranam , Georgia Institute of Technology, Atlanta.
Abhijit Chatterjee , Georgia Institute of Technology, Atlanta.
pp. 341
V. Piuri , Politecnico di Milano
V. Yarmolik , Belarusian State University of Informatics and Radio Electronics
A. Shmidman , Belarusian State University of Informatics and Radio Electronics
pp. 349
Author Index (PDF)
pp. 355
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