The Community for Technology Leaders
RSS Icon
Subscribe
2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (1997)
Paris, FRANCE
Oct. 20, 1997 to Oct. 22, 1997
ISBN: 0-8186-8168-3
TABLE OF CONTENTS
Session 1: Critical Area
Witold A. Pleskacz , Warsaw University of Technology
Wojciech Maly , Carnegie Mellon University
pp. 2
S. Levasseur , Central R&D, SGS-Thomson Microelectron., Crolles, France
F. Duvivier , Central R&D, SGS-Thomson Microelectron., Crolles, France
pp. 11
G.A. Allan , Dept. of Electr. Eng., Edinburgh Univ., UK
A.J. Walton , Dept. of Electr. Eng., Edinburgh Univ., UK
pp. 20
Zhan Chen , University of Massachusetts, Amherst
Israel Koren , University of Massachusetts, Amherst
pp. 38
Session 2: Yield Management
A. Gandhi , KLA-Tencor, Milpitas, CA, USA
S. Hall , KLA-Tencor, Milpitas, CA, USA
R. Harris , KLA-Tencor, Milpitas, CA, USA
pp. 53
Witold A. Pleskacz , Warsaw University of Technology
Wojciech Maly , Carnegie Mellon University
Hans T. Heineken , Level One Communications
pp. 62
Allan Y. Wong , Yield Management Consulting KLA-Tencor Corporation
pp. 69
Session 3: Test and Test Generation
D.G. Ashen , Intel Corp., Santa Clara, CA, USA
F.J. Meyer , Intel Corp., Santa Clara, CA, USA
N. Park , Intel Corp., Santa Clara, CA, USA
F. Lombardi , Intel Corp., Santa Clara, CA, USA
pp. 76
F. Ferrandi , Politecnico di Milano
F. Fummi , Politecnico di Milano
L. Pozzi , Politecnico di Milano
M.G. Sami , Politecnico di Milano
pp. 85
C. Aktouf , LCIS-ESISAR, Valence, France
G. Al-Hayek , LCIS-ESISAR, Valence, France
C. Robach , LCIS-ESISAR, Valence, France
pp. 94
Panel Session
Session 4: Self Checking and Coding
Yu-Yau Guo , Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI, USA
Jien-Chung Lo , Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI, USA
C. Metra , Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI, USA
pp. 110
S.J. Piestrak , Inst. of Eng. Cybern., Wroclaw Univ. of Technol., Poland
pp. 119
X. Kavousianos , University of Patras
D. Nikolos , University of Patras
G. Sidiropoulos , University of Patras
pp. 128
C. Metra , Dipt. di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
M. Favalli , Dipt. di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
B. Ricco , Dipt. di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
pp. 137
Session 5: Cost Modeling
Michel Kafrouni , ?cole de Technologie Sup?rieure
Claude Thibeault , ?cole de Technologie Sup?rieure
pp. 148
Y. Gagnon , Dept. de Genie Phys., Ecole Polytech. de Montreal, Que., Canada
Y. Savaria , Dept. de Genie Phys., Ecole Polytech. de Montreal, Que., Canada
M. Meunier , Dept. de Genie Phys., Ecole Polytech. de Montreal, Que., Canada
C. Thibeault , Dept. de Genie Phys., Ecole Polytech. de Montreal, Que., Canada
pp. 157
Israel Koren , University of Massachusetts
Zahava Koren , University of Massachusetts
pp. 166
J.R. Samson, Jr. , Space & Strategic Syst. Operation, Honeywell Inc., USA
W. Moreno , Space & Strategic Syst. Operation, Honeywell Inc., USA
F. Falquez , Space & Strategic Syst. Operation, Honeywell Inc., USA
pp. 175
Session 6: Fault Tolerance
Wei Liang Huang , Dept. of Electron. Eng., Fudan Univ., Shanghai, China
F.J. Meyer , Dept. of Electron. Eng., Fudan Univ., Shanghai, China
F. Lombardi , Dept. of Electron. Eng., Fudan Univ., Shanghai, China
pp. 186
X. Wendling , Institut National Polytechnique de Grenoble / CSI
H. Chauvet , Institut National Polytechnique de Grenoble / CSI
L. Reveret , Institut National Polytechnique de Grenoble / CSI
R. Rochet , Institut National Polytechnique de Grenoble / CSI
R. Leveugle , Institut National Polytechnique de Grenoble / CSI
pp. 195
C. Bolchini , Politecnico di Milano
G. Buonanno , Politecnico di Milano
M. Cozzini , Politecnico di Milano
D. Sciuto , Politecnico di Milano
R. Stefanelli , Politecnico di Milano
pp. 204
A. Benso , Politecnico di Torino
P. Prinetto , Politecnico di Torino
M. Rebaudengo , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
J. Raik , Tallinn Technical University
R. Ubar , Tallinn Technical University
pp. 212
Session 7: Fault Tolerance II
I. Takanami , Dept. of Comput. Sci., Iwate Univ., Morioka, Japan
T. Horita , Dept. of Comput. Sci., Iwate Univ., Morioka, Japan
pp. 218
Session 8: Error Recovery
M. Favalli , Dipt. di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
C. Metra , Dipt. di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
pp. 234
W. Lynn Gallagher , The University of Texas at Austin
Earl E. Swartzlander, Jr. , The University of Texas at Austin
pp. 243
Xiaoling Sun , University of Alberta
Wes Tutak , University of Alberta
pp. 252
F. Distante , Informazione Politecnico di Milano
M. G. Sami , Informazione Politecnico di Milano
R. Stefanelli , Informazione Politecnico di Milano
pp. 261
Session 9: Error Detection
A. Walker , Dept. of Electr. Eng., North Carolina A&T State Univ., Greensboro, NC, USA
A.P. Henry , Dept. of Electr. Eng., North Carolina A&T State Univ., Greensboro, NC, USA
P.K. Lala , Dept. of Electr. Eng., North Carolina A&T State Univ., Greensboro, NC, USA
pp. 272
Christopher G. Knight , Auburn University
Adit D. Singh , Auburn University
Victor P. Nelson , Auburn University
pp. 281
C. Bolchini , Politecnico di Milano
D. Sciuto , Politecnico di Milano
F. Salice , CEFRIEL
pp. 290
Anna Antola , Politecnico di Milano
Vincenzo Piuri , Politecnico di Milano
Mariagiovanna Sami , Politecnico di Milano
pp. 298
Author Index (PDF)
pp. 313
16 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool