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2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (1996)
Boston, MA
Nov. 6, 1996 to Nov. 8, 1996
ISBN: 0-8186-7545-4
TABLE OF CONTENTS
Session 1: Defect Avoidance
W.B. Culbertson , Hewlett-Packard Laboratories
R. Amerson , Hewlett-Packard Laboratories
R.J. Carter , Hewlett-Packard Laboratories
P. Kuekes , Hewlett-Packard Laboratories
G. Snider , Hewlett-Packard Laboratories
pp. 2
G.H. Chapman , Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
B. Dufort , Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
pp. 11
Session 2: Yield Prediction
C.H. Ouyang , Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
W.A. Pleskacz , Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
W. Maly , Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 21
D. D. Gaitonde , Motorola Inc.
W. Maly , Carnegie Mellon University
D. M. H. Walker , Texas A&M University
pp. 30
Gerard A. Allan , University of Edinburgh
Anthony J. Walton , University of Edinburgh
pp. 39
D. Nikolos , University of Patras
H. T. Vergos , University of Patras
A. Vazaios , University of Patras
S. Voulgaris , University of Patras
pp. 53
Session 3: Yield and Reliability Enhancement
Thomas G. Waring , University of Edinburgh
Gerard A. Allan , University of Edinburgh
and Anthony J. Walton , University of Edinburgh
pp. 59
A. Venkataraman , Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
I. Koren , Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
pp. 68
Zhan Chen , University of Massachusetts
Israel Koren , University of Massachusetts
pp. 77
W. Maly , Carnegie Mellon Univ., Pittsburgh, PA, USA
C. Ouyang , Carnegie Mellon Univ., Pittsburgh, PA, USA
S. Ghosh , Carnegie Mellon Univ., Pittsburgh, PA, USA
S. Maturi , Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 86
Session 4: Layout-Driven Test
Tong Liu , Actel Corp., Sunnyvale, CA, USA
Xiaotao Chen , Actel Corp., Sunnyvale, CA, USA
F. Lombardi , Actel Corp., Sunnyvale, CA, USA
J. Salinas , Actel Corp., Sunnyvale, CA, USA
pp. 105
Peilin Song , The University of Rhode Island
Jien-Chung Lo , The University of Rhode Island
pp. 114
Session 5: Process Data Analysis
Allan Y. Wong , KLA - The Yield Management Company
pp. 131
Thomas Gneiting , Fachhochschule fuer Technik Esslingen
Ian P. Jalowiecki , Brunel University of West London
pp. 140
F. Joel Ferguson , University of California, Santa Cruz
Jianlin Yu , University of California, Santa Cruz
pp. 149
Session 6: Test And Diagnosis
Earl Swartzlander, Jr. , University of Texas at Austin
pp. 159
Xiaoling Sun , University of Alberta
Wes Tutak , University of Alberta
pp. 177
C. Thibeault , Ecole de Technologie Superieure
A. Payeur , Ecole de Technologie Superieure
pp. 185
Session 7: Self-Test and Self-Checking Designs
P.K. Lala , Dept. of Electr. Eng., North Carolina A&T State Univ., Greensboro, NC, USA
S. Yang , Dept. of Electr. Eng., North Carolina A&T State Univ., Greensboro, NC, USA
F. Busaba , Dept. of Electr. Eng., North Carolina A&T State Univ., Greensboro, NC, USA
pp. 195
Cecilia Metra , DEIS - Universita' di Bologna
Michele Favalli , DEIS - Universita' di Bologna
Bruno Ricco , DEIS - Universita' di Bologna
pp. 204
Cecilia Metra , DEIS - Universita' di Bologna
Michele Favalli , DEIS - Universita' di Bologna
Bruno Ricco , DEIS - Universita' di Bologna
pp. 213
Session 8: Fault-Tolerant Structuies
Nobuo Tsuda , NTT Information and Communication Systems Laboratories
pp. 231
W.L. Gallagher , Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
E.E. Swartzlander, Jr. , Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
pp. 240
C. Bolchini , Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
G. Buonanno , Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
D. Sciuto , Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
R. Stefanelli , Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
pp. 258
Session 9: Reliable Circuit Synthesis
A. Antola , Politecnico di Milano
V. Piuri , Politecnico di Milano
M.G. Sami , Politecnico di Milano
pp. 268
Jien-Chung Lo , The University of Rhode Island
Masato Kitakami , Tokyo Institute of Technology
Eiji Fujiwara , Tokyo Institute of Technology
pp. 286
Kyosun Kim , University of Massachusetts
Ramesh Karri , University of Massachusetts
Miodrag Potkonjak , University of California, Los Angeles
pp. 295
X. Wendling , Laboratoire INPG/CSI
R. Rochet , Laboratoire INPG/CSI
R. Leveugle , Laboratoire INPG/CSI
pp. 304
Session 10: Fault-Tolerance Approaches
S. R. Goldberg , State University of New York at Buffalo
S. J. Upadhyaya , State University of New York at Buffalo
W. K. Fuchs , Purdue University
pp. 318
G.A. Mojoli , Dipt. di Fisica, Milan Univ., Italy
D. Salvi , Dipt. di Fisica, Milan Univ., Italy
M.G. Sami , Dipt. di Fisica, Milan Univ., Italy
G.R. Sechi , Dipt. di Fisica, Milan Univ., Italy
R. Stefanelli , Dipt. di Fisica, Milan Univ., Italy
pp. 327
T. Horita , Dept. of Comput. & Inf. Sci., Iwate Univ., Morioka, Japan
I. Takanami , Dept. of Comput. & Inf. Sci., Iwate Univ., Morioka, Japan
pp. 335
pp. 341
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