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Electronic Design, Test and Applications, IEEE International Workshop on (2011)
Queenstown, New Zealand
Jan. 17, 2011 to Jan. 19, 2011
ISBN: 978-0-7695-4306-2
TABLE OF CONTENTS
Papers
pp. C1
Title Page i (PDF)
pp. i
pp. iii
pp. v-ix
Author Index (PDF)
pp. 287-288
16 ms
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