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Electronic Design, Test and Applications, IEEE International Workshop on (2010)
Ho Chi Minh City, Vietnam
Jan. 13, 2010 to Jan. 15, 2010
ISBN: 978-0-7695-3978-2
TABLE OF CONTENTS
Papers
pp. C1
Title Page i (PDF)
pp. i
pp. iii
pp. v-x
Run (Abstract)
pp. 245-249
Author Index (PDF)
pp. 367-369
[Roster] (PDF)
pp. 370
6 ms
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