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Electronic Design, Test and Applications, IEEE International Workshop on (2008)
Jan. 23, 2008 to Jan. 25, 2008
ISBN: 978-0-7695-3110-6
TABLE OF CONTENTS
Papers
pp. v-xv
Title Page i (PDF)
pp. i
pp. iii
pp. xviii-xx
Author Index (PDF)
pp. 607-610
22 ms
(Ver 2.0)

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