Enhancing The Static D.C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis

Matthew Worsman; Mike W.T. Wong; Y. S. Lee

doi:10.1109/DELTA.2002.994669

D
DELTA
2002
The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)
Abstract - Enhancing The Static D.C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis

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The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)

Enhancing The Static D.C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis

Christchurch, New Zealand

January 29-January 31

ISBN: 0-7695-1453-7

	ASCII Text	x
	Matthew Worsman, Mike W.T. Wong, Y. S. Lee, "Enhancing The Static D.C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 443, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002.

	BibTex	x
	@article{ 10.1109/DELTA.2002.994669, author = {Matthew Worsman and Mike W.T. Wong and Y. S. Lee}, title = {Enhancing The Static D.C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2002}, isbn = {0-7695-1453-7}, pages = {443}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994669}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Enhancing The Static D.C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis SN - 0-7695-1453-7 SP EP A1 - Matthew Worsman, A1 - Mike W.T. Wong, A1 - Y. S. Lee, PY - 2002 KW - Analog testing KW - fault diagnosis KW - equivalent faults VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

Matthew Worsman

Mike W.T. Wong, The Hong Kong Polytechnic University

Y. S. Lee, The Hong Kong Polytechnic University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994669

Analysis of equivalent single parametric component faults in a Resistance-Temperature-Detector (RTD) sensor circuit under steady-state d.c. condition is used to systematically adjust component parameters for enhanced fault diagnosis. Component tolerances are accounted for when evaluating the effectiveness of the proposed changes.

Index Terms:

Analog testing, fault diagnosis, equivalent faults

Citation:

Matthew Worsman, Mike W.T. Wong, Y. S. Lee, "Enhancing The Static D.C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis," delta, pp.443, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002

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