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Christchurch, New Zealand
Jan. 29, 2002 to Jan. 31, 2002
ISBN: 0-7695-1453-7
pp: 443
Mike W.T. Wong , The Hong Kong Polytechnic University
Y. S. Lee , The Hong Kong Polytechnic University
ABSTRACT
Analysis of equivalent single parametric component faults in a Resistance-Temperature-Detector (RTD) sensor circuit under steady-state d.c. condition is used to systematically adjust component parameters for enhanced fault diagnosis. Component tolerances are accounted for when evaluating the effectiveness of the proposed changes.
INDEX TERMS
Analog testing, fault diagnosis, equivalent faults
CITATION
Matthew Worsman, Mike W.T. Wong, Y. S. Lee, "Enhancing The Static D.C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis", DELTA, 2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002 2002, pp. 443, doi:10.1109/DELTA.2002.994669
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