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The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)
Enhancing The Static D.C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis
Christchurch, New Zealand
January 29-January 31
ISBN: 0-7695-1453-7
Mike W.T. Wong, The Hong Kong Polytechnic University
Y. S. Lee, The Hong Kong Polytechnic University
Analysis of equivalent single parametric component faults in a Resistance-Temperature-Detector (RTD) sensor circuit under steady-state d.c. condition is used to systematically adjust component parameters for enhanced fault diagnosis. Component tolerances are accounted for when evaluating the effectiveness of the proposed changes.
Index Terms:
Analog testing, fault diagnosis, equivalent faults
Citation:
Matthew Worsman, Mike W.T. Wong, Y. S. Lee, "Enhancing The Static D.C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis," delta, pp.443, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002
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