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The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)
Test Data Compression Using Don't-Care Identification and Statistical Encoding
Christchurch, New Zealand
January 29-January 31
ISBN: 0-7695-1453-7
Seiji Kajihara, Kyushu Institute of Technology
Kenjiro Taniguchi, Kyushu Institute of Technology
Irith Pomeranz, Purdue University
Sudhakar M. Reddy, University of Iowa
This paper describes a method of test data compression for a given test set using statistical encoding. In order to maximize the effectiveness of statistical encoding, the method first converts some specified values of test vectors to unspecified ones without losing fault coverage, and then reassigns appropriate logic values to the unspecified inputs. Experimental results for ISCAS-89 benchmark circuits show that the proposed method could reduce test data volume to less than 40% of the original test sets.
Index Terms:
Test Data Compression, Statistical Encoding, Don't Care Identification, Huffman's algorithm
Citation:
Seiji Kajihara, Kenjiro Taniguchi, Irith Pomeranz, Sudhakar M. Reddy, "Test Data Compression Using Don't-Care Identification and Statistical Encoding," delta, pp.413, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002
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