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The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)
A Method of Static Test Compaction Based on Don't Care Identification
Christchurch, New Zealand
January 29-January 31
ISBN: 0-7695-1453-7
Kohei Miyase, Kyushu Institute of Technology
Seiji Kajihara, Kyushu Institute of Technology
Sudhakar M. Reddy, University of Iowa
In this paper, we propose a procedure to compact a test set for a combinational circuit. Given a test set in which all input values are specified, the procedure first identifies don't care inputs of the test set, and next reassigns appropriate values to the don't cares to achieve test compaction. The procedure can be applied repeatedly, until further compaction cannot be derived. Experimental results show effectiveness of the proposed procedure for the ISCAS benchmark circuits.
Index Terms:
Static Test Compaction, Coloring Problem, Don't Care Identification, ATPG
Citation:
Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy, "A Method of Static Test Compaction Based on Don't Care Identification," delta, pp.392, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002
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