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Christchurch, New Zealand
Jan. 29, 2002 to Jan. 31, 2002
ISBN: 0-7695-1453-7
pp: 392
Kohei Miyase , Kyushu Institute of Technology
Seiji Kajihara , Kyushu Institute of Technology
Sudhakar M. Reddy , University of Iowa
ABSTRACT
In this paper, we propose a procedure to compact a test set for a combinational circuit. Given a test set in which all input values are specified, the procedure first identifies don't care inputs of the test set, and next reassigns appropriate values to the don't cares to achieve test compaction. The procedure can be applied repeatedly, until further compaction cannot be derived. Experimental results show effectiveness of the proposed procedure for the ISCAS benchmark circuits.
INDEX TERMS
Static Test Compaction, Coloring Problem, Don't Care Identification, ATPG
CITATION
Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy, "A Method of Static Test Compaction Based on Don't Care Identification", DELTA, 2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002 2002, pp. 392, doi:10.1109/DELTA.2002.994657
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