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The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)
A Novel Analytical Model for Evaluation of Substrate Crosstalk in VLSI Circuits
Christchurch, New Zealand
January 29-January 31
ISBN: 0-7695-1453-7
Nasser Masoumi, University of Waterloo
Mohamed I. Elmasry, University of Waterloo
Safieddin Safavi-Naeini, University of Waterloo
Haydar Hadi, University of Waterloo
Accurate and fast evaluation of substrate coupled noise has become a key-factor in today's mixed-signal RF IC design. In this work, we present efficient and closed-form analytical solutions for modeling substrate coupling in VLSI circuits. Using Maxwell's equations and the Green's theorem an integral equation for the extraction of substrate parasitic elements is developed. We utilize a fast-convergent Green's function in the integral equation. We also derive analytical solutions for the fourfold integrals of the Green's function. Finally, the impact of using the proposed models on the speed up of the computations required for the extraction process is demonstrated.
Index Terms:
Substrate coupling modeling, Green's function, image method
Citation:
Nasser Masoumi, Mohamed I. Elmasry, Safieddin Safavi-Naeini, Haydar Hadi, "A Novel Analytical Model for Evaluation of Substrate Crosstalk in VLSI Circuits," delta, pp.355, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002
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