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The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)
Test Socket Chip for Measuring Dark Current in IR FPA
Christchurch, New Zealand
January 29-January 31
ISBN: 0-7695-1453-7
Meng-Lieh Sheu, National Chi-Nan University
Tai-Ping Sun, National Chi-Nan University
Far-Wen Jih, National Chi-Nan University
A test socket chip for measuring dark currents of infrared (IR) detectors in a focal plane array (FPA) is presented in this paper. A calibration scheme adopted in this chip to cancel the leakage current due to OFF-state MOS switches tied to the measuring path is also demonstrated.
Index Terms:
Test Socket Chip, Infrared(IR), Focal Plane Array(FPA), Dark Current
Citation:
Meng-Lieh Sheu, Tai-Ping Sun, Far-Wen Jih, "Test Socket Chip for Measuring Dark Current in IR FPA," delta, pp.167, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002
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