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Christchurch, New Zealand
Jan. 29, 2002 to Jan. 31, 2002
ISBN: 0-7695-1453-7
pp: 167
Meng-Lieh Sheu , National Chi-Nan University
Tai-Ping Sun , National Chi-Nan University
Far-Wen Jih , National Chi-Nan University
ABSTRACT
A test socket chip for measuring dark currents of infrared (IR) detectors in a focal plane array (FPA) is presented in this paper. A calibration scheme adopted in this chip to cancel the leakage current due to OFF-state MOS switches tied to the measuring path is also demonstrated.
INDEX TERMS
Test Socket Chip, Infrared(IR), Focal Plane Array(FPA), Dark Current
CITATION
Meng-Lieh Sheu, Tai-Ping Sun, Far-Wen Jih, "Test Socket Chip for Measuring Dark Current in IR FPA", DELTA, 2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002 2002, pp. 167, doi:10.1109/DELTA.2002.994608
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