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The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)
A Method for Storing Fail Bit Maps in Burn-in Memory Testers
Christchurch, New Zealand
January 29-January 31
ISBN: 0-7695-1453-7
Atsumu Iseno, Meiji University
Yukihiro Iguchi, Meiji University
Although fail bit maps in burn-in memory testers are important for analyzing process problems,we need very large storage for storing them. This paper present a method for compressing fail bit maps and storing them catch rams. We classify fail patterns under six types. Catch ram stores the fail types and their locations. Since proposed method is simple, it can be easy implemented in hardware on every DUT(device under test) board. A prototype has been developed by using an FPGA and an SRAM.
Citation:
Atsumu Iseno, Yukihiro Iguchi, "A Method for Storing Fail Bit Maps in Burn-in Memory Testers," delta, pp.142, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002
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