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Christchurch, New Zealand
Jan. 29, 2002 to Jan. 31, 2002
ISBN: 0-7695-1453-7
pp: 13
Zhen Guo , New Jersey Institute Of Technology
Jacob Savir , New Jersey Institute Of Technology
ABSTRACT
Observer-based test methodology is proposed in this paper for detecting parametric faults in analog linear time-invariant circuits. A Kalman filter is used to reduce the measurement noise. Experiments conducted on an analog circuit are used to test the viability of the test methodology. The paper also discusses some inherent limitations of analog test in general. We show that, in the analog test domain, a fault-free parameter may mask the detection of a faulty parameter. Moreover, one faulty parameter may mask the detection of another faulty parameter leaving them both undetected.
CITATION
Zhen Guo, Jacob Savir, "Observer-Based Test of Analog Linear Time-Invariant Circuits", DELTA, 2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002, Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002 2002, pp. 13, doi:10.1109/DELTA.2002.994581
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