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The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)
Observer-Based Test of Analog Linear Time-Invariant Circuits
Christchurch, New Zealand
January 29-January 31
ISBN: 0-7695-1453-7
Zhen Guo, New Jersey Institute Of Technology
Jacob Savir, New Jersey Institute Of Technology
Observer-based test methodology is proposed in this paper for detecting parametric faults in analog linear time-invariant circuits. A Kalman filter is used to reduce the measurement noise. Experiments conducted on an analog circuit are used to test the viability of the test methodology. The paper also discusses some inherent limitations of analog test in general. We show that, in the analog test domain, a fault-free parameter may mask the detection of a faulty parameter. Moreover, one faulty parameter may mask the detection of another faulty parameter leaving them both undetected.
Citation:
Zhen Guo, Jacob Savir, "Observer-Based Test of Analog Linear Time-Invariant Circuits," delta, pp.13, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002
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