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13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
Testing analog electronic circuits using N-terminal network
Vienna, Austria
April 14-April 16
ISBN: 978-1-4244-6612-2
| ASCII Text | x | ||
| Piotr Kyziol, Jerzy Rutkowski, Damian Grzechca, "Testing analog electronic circuits using N-terminal network," 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, pp. 177-180, 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2010. | |||
| BibTex | x | ||
| @article{ 10.1109/DDECS.2010.5491790, author = {Piotr Kyziol and Jerzy Rutkowski and Damian Grzechca}, title = {Testing analog electronic circuits using N-terminal network}, journal ={13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems}, volume = {0}, year = {2010}, isbn = {978-1-4244-6612-2}, pages = {177-180}, doi = {http://doi.ieeecomputersociety.org/10.1109/DDECS.2010.5491790}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems TI - Testing analog electronic circuits using N-terminal network SN - 978-1-4244-6612-2 SP177 EP180 A1 - Piotr Kyziol, A1 - Jerzy Rutkowski, A1 - Damian Grzechca, PY - 2010 VL - 0 JA - 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems ER - | |||
A new test method using multidimensional search space (TMMSS) for analog electronic circuits is presented. During test mode the circuit under test is connected to active N-terminal network. The structure and values of elements of this network is selected (by heuristic particle swarm optimization algorithm) in way that the best localization/identification of faults is obtained. The differences between proposed method and others existing methods (specially oscillating testing method) have been described. The proposed method allows to increase observability of the circuit under test, which is very important if integrated circuits are tested. In this paper, the validity of described method has been verified throughout practical myoelectrical filtering circuit (taken from note "Testing Analog and Mixed-Signal Integreted Circuits Using Oscillation-Test Method" K. Arabi and B. Kaminska). The obtained simulations results shows, that presented method assure a high degree of localization of CUT faults.
Citation:
Piotr Kyziol, Jerzy Rutkowski, Damian Grzechca, "Testing analog electronic circuits using N-terminal network," ddecs, pp.177-180, 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2010
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