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13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
A time-to-digital converter using multi-phase-sampling and time amplifier for all digital phase-locked loop
Vienna, Austria
April 14-April 16
ISBN: 978-1-4244-6612-2
Kuo-Hsing Cheng, Department of Electrical Engineering, National Central University, Taiwan
Chang-Chien Hu, Department of Electrical Engineering, National Central University, Taiwan
Jen-Chieh Liu, Department of Electrical Engineering, National Central University, Taiwan
Hong-Yi Huang, Graduate Institute of Electrical Engineering, National Taipei University, Taiwan
This work presents a high timing resolution and wide measured timing range time-to-digital converter (TDC) for all digital phase-locked loop (ADPLL). The multi-phase outputs of digital controlled oscillator (DCO) utilize to sample the timing difference and extend its detectable timing range. A time amplifier (TA) is further applied to enhance the timing resolution. This design requires less silicon area compared to traditional TDCs. The TDC is realized by using a 90 nm CMOS process. TDC achieves a 6.8 ps timing resolution and a measured timing range from 12 ps to 9.5 ns. The DNL and INL are ±0.85 LSB and ±3.5 LSB, respectively. The power dissipation is 240 uW at 0.5 V supply voltage.
Citation:
Kuo-Hsing Cheng, Chang-Chien Hu, Jen-Chieh Liu, Hong-Yi Huang, "A time-to-digital converter using multi-phase-sampling and time amplifier for all digital phase-locked loop," ddecs, pp.285-288, 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2010
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