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13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
Test pattern generation for the combinational representation of asynchronous circuits
Vienna, Austria
April 14-April 16
ISBN: 978-1-4244-6612-2
| ASCII Text | x | ||
| Roland Dobai, Elena Gramatova, "Test pattern generation for the combinational representation of asynchronous circuits," 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, pp. 323-328, 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2010. | |||
| BibTex | x | ||
| @article{ 10.1109/DDECS.2010.5491759, author = {Roland Dobai and Elena Gramatova}, title = {Test pattern generation for the combinational representation of asynchronous circuits}, journal ={13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems}, volume = {0}, year = {2010}, isbn = {978-1-4244-6612-2}, pages = {323-328}, doi = {http://doi.ieeecomputersociety.org/10.1109/DDECS.2010.5491759}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems TI - Test pattern generation for the combinational representation of asynchronous circuits SN - 978-1-4244-6612-2 SP323 EP328 A1 - Roland Dobai, A1 - Elena Gramatova, PY - 2010 VL - 0 JA - 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems ER - | |||
In this paper we propose a new deterministic automatic test pattern generator (ATPG) for the stuck-at faults of the combinational representation (CR) of asynchronous sequential digital circuits (ASDCs). The modified FAN algorithm is applied to this CR to generate the test patterns. The FAN was extended to handle the complex gates and to be able to work with the CR of ASDCs. The ATPG was tested over a set of benchmark circuits. The test patterns from the presented ATPG will be used in the future to generate the sequence of test patterns for the ASDCs.
Citation:
Roland Dobai, Elena Gramatova, "Test pattern generation for the combinational representation of asynchronous circuits," ddecs, pp.323-328, 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2010
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