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2009 12th International Symposium on Design and Diagnostics of Electronic Circuits&Systems
Global parametric faults identification with the use of Differential Evolution
Liberec, Czech Republic
April 15-April 17
ISBN: 978-1-4244-3341-4
ASCII Text
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P. Jantos, D. Grzechca, J. Rutkowski, "Global parametric faults identification with the use of Differential Evolution," 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, pp. 222-225, 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits&Systems, 2009.
 
 
BibTex
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@article{ 10.1109/DDECS.2009.5012133,
author = {P. Jantos and D. Grzechca and J. Rutkowski},
title = {Global parametric faults identification with the use of Differential Evolution},
journal ={13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems},
volume = {0},
year = {2009},
isbn = {978-1-4244-3341-4},
pages = {222-225},
doi = {http://doi.ieeecomputersociety.org/10.1109/DDECS.2009.5012133},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
TI - Global parametric faults identification with the use of Differential Evolution
SN - 978-1-4244-3341-4
SP222
EP225
A1 - P. Jantos,
A1 - D. Grzechca,
A1 - J. Rutkowski,
PY - 2009
VL - 0
JA - 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
ER -
 
P. Jantos, Silesian University of Technology Gliwice, POLAND
D. Grzechca, Silesian University of Technology Gliwice, POLAND
J. Rutkowski, Silesian University of Technology Gliwice, POLAND
This paper presents a novel method to a multiple parametric faults diagnosis (global parametric faults - GPF) in analogue integrated circuits (AIC). The method is based on features of AIC time domain response to voltage step excitation, i.e. AIC response and its first order derivative maxima and minima locations. A circuit states classification is acquired with the use of linear evolutionary classifier which parameters are determined with the use of Differential Evolution. Selected AIC response features distributions are approximated with geometric figures based on polynomial functions. The proposed diagnosis method has been applied for a GPF diagnosis in an exemplary integrated circuit - operational amplifier µ4741.
Citation:
P. Jantos, D. Grzechca, J. Rutkowski, "Global parametric faults identification with the use of Differential Evolution," ddecs, pp.222-225, 2009 12th International Symposium on Design and Diagnostics of Electronic Circuits&Systems, 2009
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