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2006 IEEE Design and Diagnostics of Electronic Circuits and systems
Multiple-Vector Column-Matching BIST Design Method
Prague, Czech Republic
April 18-April 21
ISBN: 1-4244-0185-2
| ASCII Text | x | ||
| P. Fiser, H. Kubatova, "Multiple-Vector Column-Matching BIST Design Method," 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, pp. 266-271, 2006 IEEE Design and Diagnostics of Electronic Circuits and systems, 2006. | |||
| BibTex | x | ||
| @article{ 10.1109/DDECS.2006.1649633, author = {P. Fiser and H. Kubatova}, title = {Multiple-Vector Column-Matching BIST Design Method}, journal ={13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems}, volume = {0}, year = {2006}, isbn = {1-4244-0185-2}, pages = {266-271}, doi = {http://doi.ieeecomputersociety.org/10.1109/DDECS.2006.1649633}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems TI - Multiple-Vector Column-Matching BIST Design Method SN - 1-4244-0185-2 SP266 EP271 A1 - P. Fiser, A1 - H. Kubatova, PY - 2006 KW - null VL - 0 JA - 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems ER - | |||
Citation:
P. Fiser, H. Kubatova, "Multiple-Vector Column-Matching BIST Design Method," ddecs, pp.266-271, 2006 IEEE Design and Diagnostics of Electronic Circuits and systems, 2006
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