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Design, Automation and Test in Europe (DATE'05) Volume 1
Defect Aware Test Patterns
Munich, Germany
March 07-March 11
ISBN: 0-7695-2288-2
ASCII Text
x 
 
Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz, "Defect Aware Test Patterns," Design, Automation & Test in Europe Conference & Exhibition, vol. 1, pp. 450-455, Design, Automation and Test in Europe (DATE'05) Volume 1, 2005.
 
 
BibTex
x
 
@article{ 10.1109/DATE.2005.110,
author = {Huaxing Tang and Gang Chen and Sudhakar M. Reddy and Chen Wang and Janusz Rajski and Irith Pomeranz},
title = {Defect Aware Test Patterns},
journal ={Design, Automation & Test in Europe Conference & Exhibition},
volume = {1},
year = {2005},
issn = {1530-1591},
pages = {450-455},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2005.110},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation & Test in Europe Conference & Exhibition
TI - Defect Aware Test Patterns
SN - 1530-1591
SP450
EP455
A1 - Huaxing Tang,
A1 - Gang Chen,
A1 - Sudhakar M. Reddy,
A1 - Chen Wang,
A1 - Janusz Rajski,
A1 - Irith Pomeranz,
PY - 2005
KW - null
VL - 1
JA - Design, Automation & Test in Europe Conference & Exhibition
ER -
 
Huaxing Tang, University of Iowa, Iowa City
Gang Chen, University of Iowa, Iowa City
Sudhakar M. Reddy, University of Iowa, Iowa City
Chen Wang, Mentor Graphic Corporation, Wilsonville, OR
Janusz Rajski, Mentor Graphic Corporation, Wilsonville, OR
Irith Pomeranz, Purdue Univ., West Lafayette, IN
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The proposed method can be used with any test generation procedure to improve the effectiveness of the tests in detecting un-modeled defects. Experimental results on several industrial designs show the effectiveness of defect aware tests. We also propose a measure to estimate the effectiveness of given test sets in detecting un-modeled defects.
Citation:
Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz, "Defect Aware Test Patterns," date, vol. 1, pp.450-455, Design, Automation and Test in Europe (DATE'05) Volume 1, 2005
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