- D
- DATE
- 2004
- Design, Automation and Test in Europe Conference and Exhibition Designers? Forum (DATE'04)
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Design, Automation and Test in Europe Conference and Exhibition Designers? Forum (DATE'04) Paris, France February 16-February 20 ISBN: 0-7695-2085-5 Table of Contents
 | Introduction |
 | 2D: Hot Topic — From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions |
 | 3D: Analogue and RF Design |
 | 4D: Platform and IP Design |
 | 5D: Design Verification and Test |
Xi Chen, University of California, at Riverside
Yan Luo, University of California, at Riverside pp. 30126
 | 6D: Design Methodology |
B. Rubin, IBM T. J. Watson Research Center pp. 30144
F. Medeiro, Instituto de Microelectr?nica de Sevilla
R. del R?, Instituto de Microelectr?nica de Sevilla pp. 30150
H. Meyr, Aachen University of Technology pp. 30156
 | 7D: Network Design |
 | 8D: Reconfigurable Architecture |
A. Cilardo, Università degli Studi di Napoli Federico II
A. Mazzeo, Università degli Studi di Napoli Federico II
L. Romano, Università degli Studi di Napoli Federico II pp. 30206
Hala Farouk, Arab Academy for Science, Technology & Maritime Transport
Magdy Saeb, Arab Academy for Science, Technology & Maritime Transport pp. 30212
W. Luk, Imperial College London pp. 30236
 | 9D: Constrained and Domain Specific Architectures |
S. Blanc, Polytechnic University of Valencia
J. Gracia, Polytechnic University of Valencia
P. J. Gil, Polytechnic University of Valencia pp. 30256
Beibei Ren, University of California at Santa Cruz
Anru Wang, University of California at Santa Cruz
Kai Liu, University of California at Santa Cruz
Wei Li, University of California at Santa Cruz
Wayne Dai, University of California at Santa Cruz pp. 30280
 | 10D: Low Power Design |
 | IP2 |
 | IP3 |
 | IP5 |
 | Author Index | Usage of this product signifies your acceptance of the Terms of Use.
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