- D
- DATE
- 2004
- Design, Automation and Test in Europe Conference and Exhibition Designers? Forum (DATE'04)
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Design, Automation and Test in Europe Conference and Exhibition Designers? Forum (DATE'04)
Paris, France
February 16-February 20
ISBN: 0-7695-2085-5
Table of Contents
 | Introduction |
 | 2D: Hot Topic — From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions |
 | 3D: Analogue and RF Design |
 | 4D: Platform and IP Design |
 | 5D: Design Verification and Test |
Xi Chen, University of California, at Riverside
Yan Luo, University of California, at Riverside
pp. 30126
 | 6D: Design Methodology |
B. Rubin, IBM T. J. Watson Research Center
pp. 30144
F. Medeiro, Instituto de Microelectr?nica de Sevilla
R. del R?, Instituto de Microelectr?nica de Sevilla
pp. 30150
H. Meyr, Aachen University of Technology
pp. 30156
 | 7D: Network Design |
 | 8D: Reconfigurable Architecture |
A. Cilardo, Università degli Studi di Napoli Federico II
A. Mazzeo, Università degli Studi di Napoli Federico II
L. Romano, Università degli Studi di Napoli Federico II
pp. 30206
Hala Farouk, Arab Academy for Science, Technology & Maritime Transport
Magdy Saeb, Arab Academy for Science, Technology & Maritime Transport
pp. 30212
W. Luk, Imperial College London
pp. 30236
 | 9D: Constrained and Domain Specific Architectures |
S. Blanc, Polytechnic University of Valencia
J. Gracia, Polytechnic University of Valencia
P. J. Gil, Polytechnic University of Valencia
pp. 30256
Beibei Ren, University of California at Santa Cruz
Anru Wang, University of California at Santa Cruz
Kai Liu, University of California at Santa Cruz
Wei Li, University of California at Santa Cruz
Wayne Dai, University of California at Santa Cruz
pp. 30280
 | 10D: Low Power Design |
 | IP2 |
 | IP3 |
 | IP5 |
 | Author Index |
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