Ilia Polian, Bernd Becker, Sudhakar M. Reddy, "Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST," Design, Automation & Test in Europe Conference & Exhibition, vol. 1, pp. 11184, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003.

@article{ 10.1109/DATE.2003.10051,
author = {Ilia Polian and Bernd Becker and Sudhakar M. Reddy},
title = {Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST},
journal ={Design, Automation & Test in Europe Conference & Exhibition},
volume = {1},
year = {2003},
issn = {1530-1591},
pages = {11184},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10051},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Design, Automation & Test in Europe Conference & Exhibition
TI - Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST
SN - 1530-1591
SP
EP
A1 - Ilia Polian,
A1 - Bernd Becker,
A1 - Sudhakar M. Reddy,
PY - 2003
KW - null
VL - 1
JA - Design, Automation & Test in Europe Conference & Exhibition
ER -