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2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02)
Dynamic VTH Scaling Scheme for Active Leakage Power Reduction
Paris, France
March 04-March 08
ISBN: 0-7695-1471-5
| ASCII Text | x | ||
| C. Kim, K. Roy, "Dynamic VTH Scaling Scheme for Active Leakage Power Reduction," Design, Automation & Test in Europe Conference & Exhibition, pp. 0163, 2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02), 2002. | |||
| BibTex | x | ||
| @article{ 10.1109/DATE.2002.998265, author = {C. Kim and K. Roy}, title = {Dynamic VTH Scaling Scheme for Active Leakage Power Reduction}, journal ={Design, Automation & Test in Europe Conference & Exhibition}, volume = {0}, year = {2002}, isbn = {0-7695-1471-5}, pages = {0163}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2002.998265}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - Design, Automation & Test in Europe Conference & Exhibition TI - Dynamic VTH Scaling Scheme for Active Leakage Power Reduction SN - 0-7695-1471-5 SP EP A1 - C. Kim, A1 - K. Roy, PY - 2002 VL - 0 JA - Design, Automation & Test in Europe Conference & Exhibition ER - | |||
We present a Dynamic VTH Scaling (DVTS) scheme to save the leakage power during active mode of the circuit. The power saving strategy of DVTS is similar to that of the Dynamic VDD Scaling (DVS) scheme, which adaptively changes the supply voltage depending on the current workload of the system. Instead of adjusting the supply voltage, DVTS controls the threshold voltage by means of body bias control, in order to reduce the leakage power. The power saving potential of DVTS and its impact on dynamic and leakage power when applied to future technologies are discussed. Pros and cons of the DVTS system are dealt with in detail. Finally, a feedback loop hardware for the DVTS which tracks the optimal VTH for a given clock frequency, is proposed. Simulation results show that 92% energy savings can be achieved with DVTS for 70nm circuits.
Citation:
C. Kim, K. Roy, "Dynamic VTH Scaling Scheme for Active Leakage Power Reduction," date, pp.0163, 2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02), 2002
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