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Los Angeles, CA
June 5, 2000 to June 9, 2000
ISBN: 1-58113-1897-9
pp: 790-793
Carl D. Roth , Intel Corporation, Santa Clara, CA
Sreejit Chakravarty , Intel Corporation, Santa Clara, CA
ABSTRACT
Defect based testing is based on the premise that it is possible to extract high probability defects viz. bridges and opens using layout and defect data. We present a very efficient algorithm to extract two-node bridges from layout. Comparison results with a popular tool show that our algorithm is considerably faster and that it has higher capacity.
INDEX TERMS
fault modeling, fault simulation, hard faults, test vector generation
CITATION
Carl D. Roth, Sreejit Chakravarty, "A Novel Algorithm to Extract Two-Node Bridges", DAC, 2000, Design Automation Conference, Design Automation Conference 2000, pp. 790-793, doi:10.1109/DAC.2000.855421