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Los Angeles, CA
June 5, 2000 to June 9, 2000
ISBN: 1-58113-1897-9
pp: 738-743
Jacob White , Massachusetts Institute of Technology, Cambridge
Joel Phillips , Cadence Berkeley Laboratories, San Jose, CA
Joe Kanapka , Massachusetts Institute of Technology, Cambridge
ABSTRACT
The sudden increase in systems-on-a-chip designs has renewed interest in techniques for analyzing and eliminating substrate coupling problems. Previous work on the substrate coupling analysis has focused primarily on faster techniques for extracting coupling resistances, but has offered little help for reducing the resulting network whose number of resistors grows quadratically with the number of contacts. In this paper we show that an approach inspired by wavelets can be used in two ways. First, the wavelet method can be used to accurately sparsify the dense contact conductance matrix. In addition, we show that the method can be used to compute the sparse representation directly. Computational results are presented that show that for a problems with a few thousand contacts, the method can be almost ten times faster at constructing the matrix.
INDEX TERMS
Gallium Arsenide, design methodology, microprocessors, testing methodology
CITATION
Jacob White, Joel Phillips, Joe Kanapka, "Fast Methods for Extraction and Sparsification of Substrate Coupling", DAC, 2000, Design Automation Conference, Design Automation Conference 2000, pp. 738-743, doi:10.1109/DAC.2000.855412
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