This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
37th Conference on Design Automation (DAC'00)
Fast Methods for Extraction and Sparsification of Substrate Coupling
Los Angeles, CA
June 05-June 09
ISBN: 1-58113-1897-9
Jacob White, Massachusetts Institute of Technology, Cambridge
Joel Phillips, Cadence Berkeley Laboratories, San Jose, CA
Joe Kanapka, Massachusetts Institute of Technology, Cambridge
The sudden increase in systems-on-a-chip designs has renewed interest in techniques for analyzing and eliminating substrate coupling problems. Previous work on the substrate coupling analysis has focused primarily on faster techniques for extracting coupling resistances, but has offered little help for reducing the resulting network whose number of resistors grows quadratically with the number of contacts. In this paper we show that an approach inspired by wavelets can be used in two ways. First, the wavelet method can be used to accurately sparsify the dense contact conductance matrix. In addition, we show that the method can be used to compute the sparse representation directly. Computational results are presented that show that for a problems with a few thousand contacts, the method can be almost ten times faster at constructing the matrix.
Index Terms:
Gallium Arsenide, design methodology, microprocessors, testing methodology
Citation:
Jacob White, Joel Phillips, Joe Kanapka, "Fast Methods for Extraction and Sparsification of Substrate Coupling," dac, pp.738-743, 37th Conference on Design Automation (DAC'00), 2000
Usage of this product signifies your acceptance of the Terms of Use.