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Los Angeles, CA
June 5, 2000 to June 9, 2000
ISBN: 1-58113-1897-9
pp: 631-636
Mehradad Nourani , The Univ. of Texas at Dallas
Carco Lucas , The Univ. of Tehran, Iran
Amir Attarha , The Univ. of Texas at Dallas
ABSTRACT
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the traditional zero-resistance model is not sufficient. Then, we present a resistive fault model for real defects and use fuzzy logic techniques for fault simulation and test pattern generation at the gate-level. Our method produces more realistic fault coverage compared to the conventional methods. The experimental results include the fault coverage and test pattern statistics for the ISCAS85 benchmarks.
INDEX TERMS
MPEG-2, SIMD, automatic target recognition, dynamic configuration, reconfigurable processors, scheduling
CITATION
Mehradad Nourani, Carco Lucas, Amir Attarha, "Modeling and Simulation of Real Defects using Fuzzy Logic", DAC, 2000, Design Automation Conference, Design Automation Conference 2000, pp. 631-636, doi:10.1109/DAC.2000.855389
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