Los Angeles, CA
June 5, 2000 to June 9, 2000
Sudhakar M. Reddy , University of Iowa, Iowa City
Irith Pomeranz , University of Iowa, Iowa City
We propose a method of modeling pattern-dependence as part of the existing delay fault models without incurring the complexity of considering physical effects that cause pattern-dependence. Using this model, we define the conditions under which two faults can be said to be distinguished by a given test set. We provide experimental results to demonstrate the diagnostic resolutions obtained under the proposed model.
ASIC, clock frequency, clock speed, comparison, custom
Sudhakar M. Reddy, Irith Pomeranz, "On Diagnosis of Pattern-Dependent Delay Faults", DAC, 2000, Design Automation Conference, Design Automation Conference 2000, pp. 59-62, doi:10.1109/DAC.2000.855277