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37th Conference on Design Automation (DAC'00)
On Diagnosis of Pattern-Dependent Delay Faults
Los Angeles, CA
June 05-June 09
ISBN: 1-58113-1897-9
Sudhakar M. Reddy, University of Iowa, Iowa City
Irith Pomeranz, University of Iowa, Iowa City
We propose a method of modeling pattern-dependence as part of the existing delay fault models without incurring the complexity of considering physical effects that cause pattern-dependence. Using this model, we define the conditions under which two faults can be said to be distinguished by a given test set. We provide experimental results to demonstrate the diagnostic resolutions obtained under the proposed model.
Index Terms:
ASIC, clock frequency, clock speed, comparison, custom
Citation:
Sudhakar M. Reddy, Irith Pomeranz, "On Diagnosis of Pattern-Dependent Delay Faults," dac, pp.59-62, 37th Conference on Design Automation (DAC'00), 2000
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