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28th ACM/IEEE Design Automation Conference (1991)
San Francisco, California, USA
June 17, 1991 to June 21, 1991
ISBN: 0-89791-395-7
TABLE OF CONTENTS
Papers
Reviewers (PDF)
pp. xi-xiii
Prakash , University of Southern California
pp. 8-13
Visweswariah , Carnegie Mellon University
pp. 32-37
Dai , University of California
pp. 45-48
Crastes , Institut National Polytechnique de Grenoble / CSI
pp. 93-98
Pedram , University of California
pp. 99-105
Morgan , Synopsys, Inc.
pp. 106-111
Enbody , Michigan State University
pp. 132-137
Yount , Carnegie Mellon University
pp. 199-204
Jonesi , University of Illinois at Urbana-Champaign
pp. 211-214
Chew , Carnegie Mellon University
pp. 215-218
Kozminski , MCNC Center for Microelectronics
pp. 265-270
Kuan-Jen Lin , National Taiwan University
pp. 296-301
Yang Cai , University of Texas at Austin
pp. 328-334
Guruswamy , The University of Texas at Austin
pp. 335-340
Raghavendra , University of Southwestern Louisiana
pp. 385-390
Busch , Siemens AG, Corporate Research and Development
pp. 391-396
Burch , Carnegie Mellon University
pp. 408-412
Limqueco , University of Illinois
pp. 464-469
Soe , University of California
pp. 470-473
Ho , University of Southern California
pp. 475-480
Maziasz , University of Michigan
pp. 487-493
Kucukcakar , University of Southern California
pp. 514-519
Dutt , University of California
pp. 526-529
Ratzlaff , The University of Texas at Austin
pp. 555-560
Raghavan , Carnegie Mellon University
pp. 561-566
Bergamaschi , Thomas J. Watson Research Center
pp. 591-596
Chen , Syracuse University
pp. 603-606
Benkoski , Carnegie Mellon University
pp. 612-619
Luk , IBM Thomas J. Watson Research Center
pp. 626-631
Amon , University of Washington
pp. 656-661
Jen-Pin Weng , University of Southern California
pp. 668-673
Ly , University of Alberta
pp. 674-679
In-Cheol Park , Korea Advanced Institute of Science and Technology
pp. 680-685
Allen , Microelectronics and Computer Technology Corporation
pp. 694-698
Lobo , The Pennsylvania State University
pp. 775-778
Author Index (PDF)
pp. 781-783
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