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2003 Conference on Computer Vision and Pattern Recognition Workshop - Volume 6
Madison, Wisconsin
June 16-June 22
ISBN: 0-7695-1900-8
Table of Contents
Workshop on Learning in Computer Vision and Pattern Recognition
Krzysztof Krawiec, Poznan University of Technology, Poland
Bir Bhanu, University of California, Riverside
pp. 59
Yingqiang Lin, University of California, Riverside
Bir Bhanu, University of California, Riverside
pp. 60
Andrew Marek, Washington University, St. Louis, MO
William D. Smart, Washington University, St. Louis, MO
Martin C. Martin, MIT Artificial Intelligence Laboratory
pp. 61
Iterative Relief (Abstract)
Bruce Draper, Colorado State University, Fort Collins
Carol Kaito, Colorado State University, Fort Collins
Jos? Bins, Pontificia Universidade Catolica, Porto Alegre, Brazil
pp. 62
Haifeng Chen, Rutgers University, Piscataway, NJ
Peter Meer, Rutgers University, Piscataway, NJ
pp. 64
Xiuwen Liu, Florida State University, Tallahassee
Anuj Srivastava, Florida State University, Tallahassee
pp. 65
Martin Eriksson, Royal Institute of Technology (KTH)
Stefan Carlsson, Royal Institute of Technology (KTH)
pp. 66
Yousun Kang, Tokyo Institute of Technology
Osamu Hasegawa, Tokyo Institute of Technology; Neuroscience Research Institute, Advanced Industrial Science and Technology (AIST); PRESTO, Japan Science and Technology Corp. (JST)
Hiroshi Nagahashi, Tokyo Institute of Technology
pp. 68
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