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2003 Conference on Computer Vision and Pattern Recognition Workshop - Volume 3
Madison, Wisconsin
June 16-June 22
ISBN: 0-7695-1900-8
Table of Contents
Workshop on Document Image Analysis and Retrieval (DIAR '03)
Papers
G. Nagy, Rensselaer Polytechnic Institute, Troy, NY
S. C. Seth, University of Nebraska-Lincoln
S. K. Mehta, Indian Institute of Technology, Kanpur
Y. Lin, University of Nebraska-Lincoln
pp. 22
Yefeng Zheng, University of Maryland, College Park
Huiping Li, University of Maryland, College Park
David Doermann, University of Maryland, College Park
pp. 23
Jun Sun, Fujitsu Research & Development Center
Yukata Katsuyama, Fujitsu Laboratories LTD
Satoshi Naoi, Fujitsu Laboratories LTD
pp. 24
Y. Fataicha, ?cole de Technologie Sup?rieure de Montr?al, Qu?bec, Canada; Universit? de Montr?al, Qu?bec, Canada
M. Cheriet, ?cole de Technologie Sup?rieure de Montr?al, Qu?bec, Canada; Concordia University, Montr?al, Qu?bec, Canada
J. Y. Nie, Universit? de Montr?al, Qu?bec, Canada
C. Y. Suen, Concordia University, Montr?al, Qu?bec, Canada
pp. 25
Li Zhang, National University of Singapore, Kent Ridge
Yue Lu, National University of Singapore, Kent Ridge
Chew Lim Tan, National University of Singapore, Kent Ridge
pp. 27
David Menoti, Pontifical Catholic University of Parana (PUCPR)
D?bio Leandro Borges, Pontifical Catholic University of Parana (PUCPR)
Alceu de Souza Britto Jr, Pontifical Catholic University of Parana (PUCPR)
pp. 29
Jamie L. Rothfeder, University of Massachusetts
Shaolei Feng, University of Massachusetts
Toni M. Rath, University of Massachusetts
pp. 30
Zhe Wang, National University of Singapore, Kent Ridge
Yue Lu, National University of Singapore, Kent Ridge
Chew Lim Tan, National University of Singapore, Kent Ridge
pp. 31
M N S S K Pavan Kumar, International Institute of Information Technology
S S Ravi Kiran, International Institute of Information Technology
Abhishek Nayani, International Institute of Information Technology
C V Jawahar, International Institute of Information Technology
P J Narayanan, International Institute of Information Technology
pp. 33
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