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2003 Conference on Computer Vision and Pattern Recognition Workshop - Volume 1
Madison, Wisconsin
June 16-June 22
ISBN: 0-7695-1900-8
Table of Contents
Workshop on Applications of Computer Vision in Architecture
Modeling of fragments and small artifacts and automatically putting fragments together to obtain objects
M. Kampel, Vienna University of Technology
R. Sablatnig, Vienna University of Technology
pp. 4
Extraction of models of small and medium sized archaeological objects from dense-data laser scans and from images
Kyoungju Park, University of Pennsylvania, Philadelphia
April Nowell, University of Victoria, Canada
Dimitris Metaxas, Rutgers University, New Brnswick, NJ
pp. 6
Marco Andreetto, University of Padova, Italy
Nicola Brusco, University of Padova, Italy
Guido M. Cortelazzo, University of Padova, Italy
pp. 7
H. Rushmeier, IBM Corporation
J. Gomes, IBM Corporation
F. Giordano, IBM Corporation
H. El Shishiny, IBM Corporation
K. Magerlein, IBM Corporation
F. Bernardini, IBM Corporation
pp. 8
Luciano Silva, CPGEI, Centro Federal de Educa??o Tecnol?gica do Paran?, Brasil
Olga R.P. Bellon, Universidade Federal do Paran?, Brasil
Kim L. Boyer, The Ohio State University
Paulo F. U. Gotardo, Universidade Federal do Paran?, Brasil
pp. 9
Extraction of models of large archaeological objects from laser scans and from images
Peter K. Allen, Hunter College, CUNY
Alejandro Troccoli, Hunter College, CUNY
Benjamin Smith, Hunter College, CUNY
Ioannis Stamos, Hunter College, CUNY
Stephen Murray, Columbia University, New York, NY
pp. 10
Guy Godin, National Research Council of Canada
Fran?ois Blais, National Research Council of Canada
Luc Cournoyer, National Research Council of Canada
J.-Angelo Beraldin, National Research Council of Canada
Jacques Domey, National Research Council of Canada
John Taylor, National Research Council of Canada
Marc Rioux, National Research Council of Canada
Sabry El-Hakim, National Research Council of Canada
pp. 11
Katsushi Ikeuchi, University of Tokyo, Japan
Atsushi Nakazawa, University of Tokyo, Japan
Ko Nishino, University of Tokyo, Japan
Takeshi Oishi, University of Tokyo, Japan
pp. 12
Using additional sources of information: Textures, Maps, Expertise
Alexey Zalesny, Swiss Federal Institute of Technology Zurich, Switzerland
Dominik Auf der Maur, Swiss Federal Institute of Technology Zurich, Switzerland
Rupert Paget, Swiss Federal Institute of Technology Zurich, Switzerland
Maarten Vergauwen, Catholic University of Leuven, Belgium
Luc Van Gool, Swiss Federal Institute of Technology Zurich, Switzerland; Catholic University of Leuven, Belgium
pp. 14
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