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  • 2011 IEEE Conference on Computer Vision and Pattern Recognition
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2011 IEEE Conference on Computer Vision and Pattern Recognition
Providence, RI
June 20-June 25
ISBN: 978-1-4577-0394-2
Table of Contents
Papers
A. Levin, Dept. of Comput. Sci. & Appl. Math, Weizmann Inst. of Sci., Rehovot, Israel
B. Nadler, Dept. of Comput. Sci. & Appl. Math, Weizmann Inst. of Sci., Rehovot, Israel
pp. 2833-2840
A. J. Yezzi, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 1017-1024
A. Andriyenko, Comput. Sci. Dept., Tech. Univ. Darmstadt, Darmstadt, Germany
K. Schindler, Photogrammetry & Remote Sensing Group, ETH Zurich, Zurich, Switzerland
pp. 1265-1272
Guo-Jun Qi, Beckman Inst., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Qi Tian, Dept. of Comput. Sci., Univ. of Texas at San Antonio, San Antonio, TX, USA
Shiyu Chang, Beckman Inst., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
T. Huang, Beckman Inst., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
pp. 897-904
R. Rigamonti, CVLab, EPFL, Lausanne, Switzerland
M. A. Brown, CVLab, EPFL, Lausanne, Switzerland
V. Lepetit, CVLab, EPFL, Lausanne, Switzerland
pp. 1545-1552
Wei Liu, Electr. Eng. Dept., Columbia Univ., New York, NY, USA
Yu-Gang Jiang, Electr. Eng. Dept., Columbia Univ., New York, NY, USA
Jiebo Luo, Kodak Res. Labs., Eastman Kodak Co., Rochester, NY, USA
Shih-Fu Chang, Electr. Eng. Dept., Columbia Univ., New York, NY, USA
pp. 849-856
V. Jain, Yahoo! Labs. Bangalore, Bangalore, India
E. Learned-Miller, Univ. of Massachusetts Amherst, Amherst, MA, USA
pp. 577-584
S. Johnson, Sch. of Comput., Univ. of Leeds, Leeds, UK
M. Everingham, Sch. of Comput., Univ. of Leeds, Leeds, UK
pp. 1465-1472
O. Teboul, Lab. MAS, Ecole Centrale Paris, Paris, France
I. Kokkinos, Lab. MAS, Ecole Centrale Paris, Paris, France
L. Simon, Lab. MAS, Ecole Centrale Paris, Paris, France
P. Koutsourakis, Lab. MAS, Ecole Centrale Paris, Paris, France
N. Paragios, Lab. MAS, Ecole Centrale Paris, Paris, France
pp. 2273-2280
M. Gupta, Robot. Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA
A. Agrawal, Mitsubishi Electr. Res. Labs., Cambridge, MA, USA
A. Veeraraghavan, Mitsubishi Electr. Res. Labs., Cambridge, MA, USA
S. G. Narasimhan, Robot. Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 713-720
Shaoting Zhang, CAD R&D, Siemens Healthcare, Malvern, PA, USA
Yiqiang Zhan, CAD R&D, Siemens Healthcare, Malvern, PA, USA
M. Dewan, CAD R&D, Siemens Healthcare, Malvern, PA, USA
Junzhou Huang, Dept. of Comput. Sci., Rutgers Univ., Piscataway, NJ, USA
D. N. Metaxas, Dept. of Comput. Sci., Rutgers Univ., Piscataway, NJ, USA
X. S. Zhou, CAD R&D, Siemens Healthcare, Malvern, PA, USA
pp. 1025-1032
Ming-Yu Liu, Univ. of Maryland, College Park, MD, USA
O. Tuzel, Mitsubishi Electr. Res. Labs., Cambridge, MA, USA
S. Ramalingam, Mitsubishi Electr. Res. Labs., Cambridge, MA, USA
R. Chellappa, Univ. of Maryland, College Park, MD, USA
pp. 2097-2104
Wei Zhang, Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Xiaogang Wang, Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Xiaoou Tang, Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
pp. 513-520
Xingwei Yang, Dept. of Comput. & Inf. Sci., Temple Univ., Philadelphia, PA, USA
L. J. Latecki, Dept. of Comput. & Inf. Sci., Temple Univ., Philadelphia, PA, USA
pp. 2369-2376
N. Payet, Oregon State Univ., Corvallis, OR, USA
S. Todorovic, Oregon State Univ., Corvallis, OR, USA
pp. 2017-2024
H. Grabner, Comput. Vision Lab., ETH Zurich, Zurich, Switzerland
J. Gall, Comput. Vision Lab., ETH Zurich, Zurich, Switzerland
L. Van Gool, Comput. Vision Lab., ETH Zurich, Zurich, Switzerland
pp. 1529-1536
Ran He, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
Zhenan Sun, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
Tieniu Tan, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
Wei-Shi Zheng, Sch. of Inf. Sci. & Technol., Sun Yat-sen Univ., Guangzhou, China
pp. 2889-2896
B. Siddiquie, Univ. of Maryland, College Park, MD, USA
L. S. Davis, Univ. of Maryland, College Park, MD, USA
pp. 801-808
Zheng Song, Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Qiang Chen, Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Zhongyang Huang, Panasonic Singapore Labs., Singapore, Singapore
Yang Hua, Panasonic Singapore Labs., Singapore, Singapore
Shuicheng Yan, Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
pp. 1585-1592
D. Pomeranz, Comput. Sci. Dept., Ben-Gurion Univ. of The Negev, Beer-Sheva, Israel
M. Shemesh, Comput. Sci. Dept., Ben-Gurion Univ. of The Negev, Beer-Sheva, Israel
O. Ben-Shahar, Comput. Sci. Dept., Ben-Gurion Univ. of The Negev, Beer-Sheva, Israel
pp. 9-16
J. Chang, Massachusetts Inst. of Technol., Cambridge, MA, USA
J. W. Fisher, Massachusetts Inst. of Technol., Cambridge, MA, USA
pp. 2081-2088
Shubao Liu, Brown Univ., Providence, RI, USA
D. B. Cooper, Brown Univ., Providence, RI, USA
pp. 913-920
M. Rouf, Univ. of British Columbia, Vancouver, BC, Canada
R. Mantiuk, Univ. of British Columbia, Vancouver, BC, Canada
W. Heidrich, Univ. of British Columbia, Vancouver, BC, Canada
M. Trentacoste, Univ. of British Columbia, Vancouver, BC, Canada
C. Lau, Univ. of British Columbia, Vancouver, BC, Canada
pp. 289-296
Ji Zhao, Inst. for Pattern Recognition & Artificial Intell., Huazhong Univ. of Sci. & Technol., Wuhan, China
Jiayi Ma, Inst. for Pattern Recognition & Artificial Intell., Huazhong Univ. of Sci. & Technol., Wuhan, China
Jinwen Tian, Inst. for Pattern Recognition & Artificial Intell., Huazhong Univ. of Sci. & Technol., Wuhan, China
Jie Ma, Inst. for Pattern Recognition & Artificial Intell., Huazhong Univ. of Sci. & Technol., Wuhan, China
Dazhi Zhang, Inst. for Pattern Recognition & Artificial Intell., Huazhong Univ. of Sci. & Technol., Wuhan, China
pp. 2977-2984
E. Kokiopoulou, Seminar for Appl. Math., ETH Zurich, Zurich, Switzerland
M. Zervos, Dept. of Inf. & Telecommun., Univ. of Athens, Athens, Greece
D. Kressner, Seminar for Appl. Math., ETH Zurich, Zurich, Switzerland
N. Paragios, Lab. MAS, Ecole Centrale Paris, Paris, France
pp. 2449-2456
D. Kurz, Metaio GmbH, Munich, Germany
Selim Ben Himane, Metaio GmbH, Munich, Germany
pp. 161-166
B. Amberg, Dept. of Math. & Comput. Sci., Univ. of Basel, Basel, Switzerland
T. Vetter, Dept. of Math. & Comput. Sci., Univ. of Basel, Basel, Switzerland
pp. 1209-1216
Weiyu Zhang, GRASP Lab., Univ. of Pennsylvania, Philadelphia, PA, USA
P. Srinivasan, GRASP Lab., Univ. of Pennsylvania, Philadelphia, PA, USA
Jianbo Shi, GRASP Lab., Univ. of Pennsylvania, Philadelphia, PA, USA
pp. 2393-2400
Miao Liao, Dept. of Comput. Sci., Univ. of Kentucky, Lexington, KY, USA
Xinyu Huang, Dept. of Math. & Comput. Sci., North Carolina Central Univ., Durham, NC, USA
Ruigang Yang, Dept. of Comput. Sci., Univ. of Kentucky, Lexington, KY, USA
pp. 689-696
Ziheng Zhou, Comput. Sci. & Eng. Lab., Univ. of Oulu, Oulu, Finland
Guoying Zhao, Comput. Sci. & Eng. Lab., Univ. of Oulu, Oulu, Finland
M. Pietikainen, Comput. Sci. & Eng. Lab., Univ. of Oulu, Oulu, Finland
pp. 137-144
J. Beyerer, Fraunhofer IOSB, Karlsruhe, Germany
S. Hofer, KIT, Karlsruhe, Germany
J. Balzer, KAUST, Thuwal, Saudi Arabia
pp. 2537-2544
A. Torralba, Massachusetts Inst. of Technol., Cambridge, MA, USA
A. A. Efros, Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 1521-1528
Honghui Zhang, Hong Kong Univ. of Sci. & Technol., Hong Kong, China
Tian Fang, Hong Kong Univ. of Sci. & Technol., Hong Kong, China
Xiaowu Chen, Beihang Univ., Beijing, China
Qinping Zhao, Beihang Univ., Beijing, China
Long Quan, Hong Kong Univ. of Sci. & Technol., Hong Kong, China
pp. 2241-2248
G. Sfikas, LSIIT, Univ. of Strasbourg, Illkirch, France
C. Nikou, Dept. of Comput. Sci., Univ. of Ioannina, Ioannina, Greece
N. Galatsanos, Dept. of Electr. & Comput. Eng., Univ. of Patras, Patras, Greece
C. Heinrich, LSIIT, Univ. of Strasbourg, Illkirch, France
pp. 2169-2176
A. Sharma, Inst. of Adv. Comput. Sci., Univ. of Maryland, College Park, MD, USA
D. W. Jacobs, Inst. of Adv. Comput. Sci., Univ. of Maryland, College Park, MD, USA
pp. 593-600
Wen Li, Sch. of Electron. & Inf. Eng., Beihang Univ., Beijing, China
Jun Zhang, Sch. of Electron. & Inf. Eng., Beihang Univ., Beijing, China
Qionghai Dai, Dept. of Autom., Tsinghua Univ., Beijing, China
pp. 273-280
Yinqiang Zheng, Dept. of Mech. & Control Eng., Tokyo Inst. of Technol., Tokyo, Japan
S. Sugimoto, Dept. of Mech. & Control Eng., Tokyo Inst. of Technol., Tokyo, Japan
M. Okutomi, Dept. of Mech. & Control Eng., Tokyo Inst. of Technol., Tokyo, Japan
pp. 2953-2960
Jingen Liu, Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
B. Kuipers, Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
S. Savarese, Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
pp. 3337-3344
Zhuolin Jiang, Univ. of Maryland, College Park, MD, USA
Zhe Lin, Adobe Syst. Inc., San Jose, CA, USA
L. S. Davis, Univ. of Maryland, College Park, MD, USA
pp. 1697-1704
S. An, Dept. of Comput., Curtin Univ. of Technol., Perth, WA, Australia
P. Peursum, Dept. of Comput., Curtin Univ. of Technol., Perth, WA, Australia
Wanquan Liu, Dept. of Comput., Curtin Univ. of Technol., Perth, WA, Australia
S. Venkatesh, Dept. of Comput., Curtin Univ. of Technol., Perth, WA, Australia
pp. 1409-1416
Viet-Quoc Pham, Univ. of Tokyo, Tokyo, Japan
K. Takahashi, Univ. of Tokyo, Tokyo, Japan
T. Naemura, Univ. of Tokyo, Tokyo, Japan
pp. 2113-2120
Patrick Ott, Sch. of Comput., Univ. of Leeds, Leeds, UK
M. Everingham, Sch. of Comput., Univ. of Leeds, Leeds, UK
pp. 1513-1520
M. Tamaazousti, Vision & Content Eng. Lab., CEA LIST, Gif-sur-Yvette, France
V. Gay-Bellile, Vision & Content Eng. Lab., CEA LIST, Gif-sur-Yvette, France
S. N. Collette, Vision & Content Eng. Lab., CEA LIST, Gif-sur-Yvette, France
S. Bourgeois, Vision & Content Eng. Lab., CEA LIST, Gif-sur-Yvette, France
M. Dhome, LASMEA, CNRS/UBP, Aubie?re, France
pp. 3073-3080
Le Lu, CAD & Knowledge Solutions, Siemens Med. Solutions, Inc., Malvern, PA, USA
Jinbo Bi, CAD & Knowledge Solutions, Siemens Med. Solutions, Inc., Malvern, PA, USA
M. Wolf, CAD & Knowledge Solutions, Siemens Med. Solutions, Inc., Malvern, PA, USA
M. Salganicoff, CAD & Knowledge Solutions, Siemens Med. Solutions, Inc., Malvern, PA, USA
pp. 1049-1056
O. Shahar, Dept. of Comput. Sci. & Appl. Math, Weizmann Inst. of Sci., Rehovot, Israel
A. Faktor, Dept. of Comput. Sci. & Appl. Math, Weizmann Inst. of Sci., Rehovot, Israel
M. Irani, Dept. of Comput. Sci. & Appl. Math, Weizmann Inst. of Sci., Rehovot, Israel
pp. 3353-3360
A. Osokin, Dept. of Comput. Math. & Cybern., Moscow State Univ., Moscow, Russia
D. Vetrov, Dept. of Comput. Math. & Cybern., Moscow State Univ., Moscow, Russia
V. Kolmogorov, Dept. of Comput. Sci., Univ. Coll. London, London, UK
pp. 1889-1896
Guang Chen, Electr. & Comput. Eng. Dept., Univ. of Missouri, Columbia, MO, USA
T. X. Han, Electr. & Comput. Eng. Dept., Univ. of Missouri, Columbia, MO, USA
Shihong Lao, Core Technol. Center, Omron Corp., Kizugawa, Japan
pp. 1369-1376
Jinbo Bi, Univ. of Connecticut, Storrs, CT, USA
Dijia Wu, Siemens Corp. Res., Princeton, NJ, USA
Le Lu, Siemens Med. Solutions, Malvern, PA, USA
Meizhu Liu, Univ. of Florida, Gainesville, FL, USA
Yimo Tao, Microsoft Corp., Redmond, WA, USA
M. Wolf, Siemens Med. Solutions, Malvern, PA, USA
pp. 2617-2624
P. Sundberg, Univ. of California at Berkeley, Berkeley, CA, USA
T. Brox, Univ. of Freiburg, Freiburg, Germany
M. Maire, California Inst. of Technol., Pasadena, CA, USA
P. Arbelaez, Univ. of California at Berkeley, Berkeley, CA, USA
J. Malik, Univ. of California at Berkeley, Berkeley, CA, USA
pp. 2233-2240
K. Fragkiadaki, GRASP Lab., Univ. of Pennsylvania, Philadelphia, PA, USA
Jianbo Shi, GRASP Lab., Univ. of Pennsylvania, Philadelphia, PA, USA
pp. 2073-2080
Xi Chen, Univ. of Maryland, College Park, MD, USA
A. Jain, Univ. of Maryland, College Park, MD, USA
A. Gupta, Carnegie Mellon Univ., Pittsburgh, PA, USA
L. S. Davis, Univ. of Maryland, College Park, MD, USA
pp. 2001-2008
Bangpeng Yao, Comput. Sci. Dept., Stanford Univ., Stanford, CA, USA
A. Khosla, Comput. Sci. Dept., Stanford Univ., Stanford, CA, USA
Li Fei-Fei, Comput. Sci. Dept., Stanford Univ., Stanford, CA, USA
pp. 1577-1584
Yadong Mu, Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Jian Dong, Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Xiaotong Yuan, Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Shuicheng Yan, Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
pp. 2609-2616
Jiashi Feng, Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Bingbing Ni, Adv. Digital Sci. Center, Illinois at Singapore Pte Ltd., Singapore, Singapore
Qi Tian, Dept. of Comput. Sci., Univ. of Texas at San Antonio, San Antonio, TX, USA
Shuicheng Yan, Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
pp. 2609-2704
C. Rhemann, Vienna Univ. of Technol., Vienna, Austria
A. Hosni, Vienna Univ. of Technol., Vienna, Austria
M. Bleyer, Vienna Univ. of Technol., Vienna, Austria
C. Rother, Microsoft Res. Cambridge, Cambridge, UK
M. Gelautz, Vienna Univ. of Technol., Vienna, Austria
pp. 3017-3024
Liang Wang, Sch. of Comput. Sci. & Technol., Harbin Inst. of Technol., Harbin, China
Yizhou Wang, Nat. Eng. Lab. for Video Technol., Peking Univ., Beijing, China
Tingting Jiang, Nat. Eng. Lab. for Video Technol., Peking Univ., Beijing, China
Wen Gao, Nat. Eng. Lab. for Video Technol., Peking Univ., Beijing, China
pp. 3257-3264
Guo-Jun Qi, Beckman Inst., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Qi Tian, Dept. of Comput. Sci., Univ. of Texas at San Antonio, San Antonio, TX, USA
T. Huang, Beckman Inst., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
pp. 841-848
Hua Wang, Dept. of Comput. Sci. & Eng., Univ. of Texas at Arlington, Arlington, TX, USA
Heng Huang, Dept. of Comput. Sci. & Eng., Univ. of Texas at Arlington, Arlington, TX, USA
C. Ding, Dept. of Comput. Sci. & Eng., Univ. of Texas at Arlington, Arlington, TX, USA
pp. 793-800
Cong Zhao, Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Wai-Kuen Cham, Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Xiaogang Wang, Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
pp. 561-568
Hongzhi Wang, Dept. of Radiol., Univ. of Pennsylvania, Philadelphia, PA, USA
Jung Wook Suh, Dept. of Radiol., Univ. of Pennsylvania, Philadelphia, PA, USA
S. Das, Dept. of Radiol., Univ. of Pennsylvania, Philadelphia, PA, USA
J. Pluta, Dept. of Radiol., Univ. of Pennsylvania, Philadelphia, PA, USA
M. Altinay, Dept. of Radiol., Univ. of Pennsylvania, Philadelphia, PA, USA
P. Yushkevich, Dept. of Radiol., Univ. of Pennsylvania, Philadelphia, PA, USA
pp. 1113-1120
C. Russell, Sch. of EECS, Queen Mary Univ. of London, London, UK
J. Fayad, Sch. of EECS, Queen Mary Univ. of London, London, UK
L. Agapito, Sch. of EECS, Queen Mary Univ. of London, London, UK
pp. 3009-3016
Cheng-Hao Kuo, Inst. for Robot. & Intell. Syst., Univ. of Southern California, Los Angeles, CA, USA
R. Nevatia, Inst. for Robot. & Intell. Syst., Univ. of Southern California, Los Angeles, CA, USA
pp. 1217-1224
Bin Fan, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
Fuchao Wu, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
Zhanyi Hu, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
pp. 2377-2384
V. I. Morariu, Inst. for Adv. Comput. Studies, Univ. of Maryland, College Park, MD, USA
L. S. Davis, Inst. for Adv. Comput. Studies, Univ. of Maryland, College Park, MD, USA
pp. 3289-3296
Jungmin Lee, Dept. of EECS, Seoul Nat. Univ., Seoul, South Korea
Minsu Cho, Dept. of EECS, Seoul Nat. Univ., Seoul, South Korea
Kyoung Mu Lee, Dept. of EECS, Seoul Nat. Univ., Seoul, South Korea
pp. 1633-1640
D. Fleck, American Univ., Washington, DC, USA
Z. Duric, George Mason Univ., Fairfax, VA, USA
pp. 105-112
Deng Cai, State Key Lab. of CAD&CG, Zhejiang Univ., Hangzhou, China
Hujun Bao, State Key Lab. of CAD&CG, Zhejiang Univ., Hangzhou, China
Xiaofei He, State Key Lab. of CAD&CG, Zhejiang Univ., Hangzhou, China
pp. 2905-2910
J. T. Barron, Univ. of California, Berkeley, CA, USA
J. Malik, Univ. of California, Berkeley, CA, USA
pp. 2521-2528
Meng Yang, Hong Kong Polytech. Univ., Hong Kong, China
Lei Zhang, Hong Kong Polytech. Univ., Hong Kong, China
Jian Yang, Nanjing Univ. of Sci. & Tech., Nanjing, China
D. Zhang, Hong Kong Polytech. Univ., Hong Kong, China
pp. 625-632
W. Brendel, Oregon State Univ., Corvallis, OR, USA
M. Amer, Oregon State Univ., Corvallis, OR, USA
S. Todorovic, Oregon State Univ., Corvallis, OR, USA
pp. 1273-1280
K. Sankaranarayanan, Dept. of Comput. Sci. & Eng., Ohio State Univ., Columbus, OH, USA
J. W. Davis, Dept. of Comput. Sci. & Eng., Ohio State Univ., Columbus, OH, USA
pp. 3433-3440
Xiaogang Wang, Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Ke Liu, Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Xiaoou Tang, Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
pp. 857-864
Yan Chen, State Key Lab. of CAD&CG, Zhejiang Univ., Hangzhou, China
Hujun Bao, State Key Lab. of CAD&CG, Zhejiang Univ., Hangzhou, China
Xiaofei He, State Key Lab. of CAD&CG, Zhejiang Univ., Hangzhou, China
pp. 569-574
M. Zontak, Dept. of Comput. Sci. & Appl. Mathemathics, Weizmann Inst. of Sci., Rehovot, Israel
M. Irani, Dept. of Comput. Sci. & Appl. Mathemathics, Weizmann Inst. of Sci., Rehovot, Israel
pp. 977-984
Weilong Yang, Simon Fraser Univ., Burnaby, BC, Canada
G. Toderici, Google Inc., Mountain View, CA, USA
pp. 3217-3224
Karim Ali, CVLAB, Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
D. Hasler, Swiss Center for Electron. & Microtechnol. (CSEM), Switzerland
Francois Fleuret, Idiap Res. Inst., Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
pp. 1433-1440
Guodong Guo, Lane Dept. of CSEE, West Virginia Univ., Morgantown, WV, USA
Guowang Mu, Sch. of Sci., Hebei Univ. of Technol., Tianjin, China
pp. 657-664
Tianfan Xue, Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Jianzhuang Liu, Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Xiaoou Tang, Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
pp. 2577-2584
K. M. Kitani, UEC Tokyo, Tokyo, Japan
T. Okabe, Univ. of Tokyo, Tokyo, Japan
Y. Sato, Univ. of Tokyo, Tokyo, Japan
A. Sugimoto, Nat. Inst. of Inf., Tokyo, Japan
pp. 3241-3248
Heng Wang, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
A. Klaser, LEAR, INRIA Grenoble, Grenoble, France
C. Schmid, LEAR, INRIA Grenoble, Grenoble, France
Cheng-Lin Liu, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
pp. 3169-3176
O. Danielsson, Sch. of Comput. Sci. & Commun., KTH, Stockholm, Sweden
B. Rasolzadeh, Sch. of Comput. Sci. & Commun., KTH, Stockholm, Sweden
S. Carlsson, Sch. of Comput. Sci. & Commun., KTH, Stockholm, Sweden
pp. 2673-2680
Joon-Young Lee, Robot. & Comput. Vision Lab., KAIST, Daejeon, South Korea
Boxin Shi, Univ. of Tokyo, Tokyo, Japan
Y. Matsushita, Microsoft Res. Asia, Beijing, China
In-So Kweon, Robot. & Comput. Vision Lab., KAIST, Daejeon, South Korea
K. Ikeuchi, Univ. of Tokyo, Tokyo, Japan
pp. 2337-2344
Ziming Zhang, Oxford Brookes Univ., Oxford, UK
J. Warrell, Oxford Brookes Univ., Oxford, UK
P. H. S. Torr, Oxford Brookes Univ., Oxford, UK
pp. 1497-1504
Chao-Yeh Chen, Univ. of Texas at Austin, Austin, TX, USA
K. Grauman, Univ. of Texas at Austin, Austin, TX, USA
pp. 1569-1576
C. O. Ancuti, Expertise Center for Digital Media, Hasselt Univ., Diepenbeek, Belgium
C. Ancuti, Expertise Center for Digital Media, Hasselt Univ., Diepenbeek, Belgium
P. Bekaert, Expertise Center for Digital Media, Hasselt Univ., Diepenbeek, Belgium
pp. 257-264
Kai-Yueh Chang, Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
Tyng-Luh Liu, Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
Shang-Hong Lai, Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
pp. 2129-2136
Du Tran, Sch. of EEE, Nanyang Technol. Univ., Singapore, Singapore
Junsong Yuan, Sch. of EEE, Nanyang Technol. Univ., Singapore, Singapore
pp. 3321-3328
Tao Yang, Shaanxi Key Lab. of Speech & Image Inf. Process., Northwestern Polytech. Univ., Xi'an, China
Yanning Zhang, Shaanxi Key Lab. of Speech & Image Inf. Process., Northwestern Polytech. Univ., Xi'an, China
Xiaomin Tong, Shaanxi Key Lab. of Speech & Image Inf. Process., Northwestern Polytech. Univ., Xi'an, China
Xiaoqiang Zhang, Shaanxi Key Lab. of Speech & Image Inf. Process., Northwestern Polytech. Univ., Xi'an, China
Rui Yu, Shaanxi Key Lab. of Speech & Image Inf. Process., Northwestern Polytech. Univ., Xi'an, China
pp. 3409-3416
Y. Adato, Comput. Sci. Dept., Ben-Gurion Univ. of The Negev, Beer-Sheva, Israel
T. Zickler, Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA, USA
O. Ben-Shahar, Comput. Sci. Dept., Ben-Gurion Univ. of The Negev, Beer-Sheva, Israel
pp. 1145-1152
L. Mukherjee, Math. & Comput. Sci., Univ. of Wisconsin-Whitewater, Whitewater, WI, USA
V. Singh, Biostat. & Med. Inform., Univ. of Wisconsin-Madison, Madison, WI, USA
Jiming Peng, Ind. & Syst. Eng., Univ. of Illinois Urbana Champaign, Urbana, IL, USA
pp. 1881-1888
Xue Mei, Assembly Test Technol. Dev., Intel Corp., Chandler, AZ, USA
Haibin Ling, Comput. & Inf. Sci. Dept., Temple Univ., Philadelphia, PA, USA
Yi Wu, Comput. & Inf. Sci. Dept., Temple Univ., Philadelphia, PA, USA
E. Blasch, SNAA, Air Force Res. Lab., OH, USA
Li Bai, Assembly Test Technol. Dev., Intel Corp., Chandler, AZ, USA
pp. 1257-1264
An L (Abstract)
Wenye Ma, Dept. of Math., Univ. of California, Los Angeles, CA, USA
J-M Morel, CMLA, ENS Cachan, Paris, France
S. Osher, Dept. of Math., Univ. of California, Los Angeles, CA, USA
A. Chien, Dept. of Radiol. Sci., Univ. of California, Los Angeles, CA, USA
pp. 153-160
Wei Wang, Natl Eng. Lab. for Video Technol., Beijing, China
Cheng Chen, Natl Eng. Lab. for Video Technol., Beijing, China
Yizhou Wang, Natl Eng. Lab. for Video Technol., Beijing, China
Tingting Jiang, Natl Eng. Lab. for Video Technol., Beijing, China
Fang Fang, Key Lab. of Machine Perception (MoE), Peking Univ., Beijing, China
Yuan Yao, Key Lab. of Machine Perception (MoE), Peking Univ., Beijing, China
pp. 441-448
Mu Li, Dept. of Comput. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
Xiao-Chen Lian, Dept. of Comput. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
J. T. Kwok, Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
Bao-Liang Lu, Dept. of Comput. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
pp. 2297-2304
M. Harker, Inst. for Autom., Univ. of Leoben, Leoben, Austria
P. O'Leary, Inst. for Autom., Univ. of Leoben, Leoben, Austria
pp. 2529-2536
O. Oreifej, Comput. Vision Lab., Univ. of Central Florida, Orlando, FL, USA
Guang Shu, Comput. Vision Lab., Univ. of Central Florida, Orlando, FL, USA
T. Pace, Night Vision & Electron. Sensors Directorate, US Army, Orlando, FL, USA
M. Shah, Comput. Vision Lab., Univ. of Central Florida, Orlando, FL, USA
pp. 1153-1160
Rui Li, Mass. Gen. Hosp., MA, USA
S. Arslan, Univ. of California at San Diego, San Diego, CA, USA
pp. 1041-1048
S. Vijayanarasimhan, Univ. of Texas at Austin, Austin, TX, USA
K. Grauman, Univ. of Texas at Austin, Austin, TX, USA
pp. 1449-1456
A. Jorstad, UMIACS, Univ. of Maryland, College Park, MD, USA
D. Jacobs, UMIACS, Univ. of Maryland, College Park, MD, USA
pp. 2353-2360
Yunchao Gong, Dept. of Comput. Sci., UNC Chapel Hill, Chapel Hill, NC, USA
S. Lazebnik, Dept. of Comput. Sci., UNC Chapel Hill, Chapel Hill, NC, USA
pp. 817-824
Junhong Gao, Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
Seon Joo Kim, Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
M. S. Brown, Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
pp. 49-56
Yang Cong, Sch. of EEE, Nanyang Technol. Univ., Singapore, Singapore
Junsong Yuan, Sch. of EEE, Nanyang Technol. Univ., Singapore, Singapore
Ji Liu, Univ. of Wisconsin-Madison, Madison, WI, USA
pp. 3449-3456
Suha Kwak, Dept. of Comput. Sci. & Eng., POSTECH, Pohang, South Korea
Bohyung Han, Dept. of Comput. Sci. & Eng., POSTECH, Pohang, South Korea
Joon Hee Han, Dept. of Comput. Sci. & Eng., POSTECH, Pohang, South Korea
pp. 3345-3352
D. Glasner, Dept. of Comput. Sci. & Appl. Math., Weizmann Inst. of Sci., Rehovot, Israel
S. N. Vitaladevuni, Raytheon BBN Technol., Lexington, MA, USA
R. Basri, Dept. of Comput. Sci. & Appl. Math., Weizmann Inst. of Sci., Rehovot, Israel
pp. 2385-2392
Kuang-Yu Chang, Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
Chu-Song Chen, Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
Yi-Ping Hung, Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
pp. 585-592
Peng Huang, Centre for Vision Speech Signal Process., Univ. of Surrey, Guildford, UK
C. Budd, Centre for Vision Speech Signal Process., Univ. of Surrey, Guildford, UK
A. Hilton, Centre for Vision Speech Signal Process., Univ. of Surrey, Guildford, UK
pp. 3473-3480
J. C. Caicedo, Univ. Nac., Bogota, Colombia
A. Kapoor, Microsoft Res., Redmond, WA, USA
Sing Bing Kang, Microsoft Res., Redmond, WA, USA
pp. 249-256
J. Franco, LJK, INRIA Grenoble Rhone-Alpes, Grenoble, France
E. Boyer, LJK, INRIA Grenoble Rhone-Alpes, Grenoble, France
pp. 1241-1248
N. Razavi, ETH Zurich, Zurich, Switzerland
J. Gall, ETH Zurich, Zurich, Switzerland
L. Van Gool, ETH Zurich, Zurich, Switzerland
pp. 1505-1512
J. Cech, INRIA Rhone-Alpes, Montbonnot, France
J. Sanchez-Riera, INRIA Rhone-Alpes, Montbonnot, France
R. Horaud, INRIA Rhone-Alpes, Montbonnot, France
pp. 3129-3136
P. J. Flynn, Dept. of Comput. Sci. & Eng., Univ. of Notre Dame, Notre Dame, IN, USA
G. Aggarwal, Dept. of Comput. Sci. & Eng., Univ. of Notre Dame, Notre Dame, IN, USA
S. Biswas, Dept. of Comput. Sci. & Eng., Univ. of Notre Dame, Notre Dame, IN, USA
pp. 601-608
Yuanyuan Ding, Epson R&D, Japan
Jing Xiao, Epson R&D, Japan
Jingyi Yu, Univ. of Delaware, Newark, DE, USA
pp. 89-96
D. Parikh, Toyota Technol. Inst., Chicago, IL, USA
C. L. Zitnick, Microsoft Res., Redmond, WA, USA
pp. 1425-1432
Devi Parikh, Toyota Technol. Inst., Chicago, IL, USA
Kristen Grauman, Univ. of Texas at Austin, Austin, TX, USA
pp. 1681-1688
Taehee Lee, Comput. Sci. Dept., Univ. of California, Los Angeles, CA, USA
S. Soatto, Comput. Sci. Dept., Univ. of California, Los Angeles, CA, USA
pp. 1457-1464
Shenghua Gao, Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
Liang-Tien Chia, Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
Ivor Wai-Hung Tsang, Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
pp. 2809-2816
A. Sharma, INRIA Grenoble Rhone-Alpes, Montbonnot Saint-Martin, France
R. Horaud, INRIA Grenoble Rhone-Alpes, Montbonnot Saint-Martin, France
J. Cech, INRIA Grenoble Rhone-Alpes, Montbonnot Saint-Martin, France
E. Boyer, INRIA Grenoble Rhone-Alpes, Montbonnot Saint-Martin, France
pp. 2481-2488
Bolei Zhou, Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Xiaogang Wang, Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Xiaoou Tang, Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
pp. 3441-3448
Yang Cao, MOE-Microsoft Key Lab. for Intell. Comput. & Intell. Syst., Shanghai Jiao Tong Univ., Shanghai, China
Changhu Wang, Microsoft Res. Asia, Beijing, China
Liqing Zhang, MOE-Microsoft Key Lab. for Intell. Comput. & Intell. Syst., Shanghai Jiao Tong Univ., Shanghai, China
Lei Zhang, Microsoft Res. Asia, Beijing, China
pp. 761-768
Bing Li, Dept. of Comput. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
Rong Xiao, Microsoft Res. Asia, Beijing, China
Zhiwei Li, Microsoft Res. Asia, Beijing, China
Rui Cai, Microsoft Res. Asia, Beijing, China
Bao-Liang Lu, Dept. of Comput. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
Lei Zhang, Microsoft Res. Asia, Beijing, China
pp. 1737-1744
S. Y. Bao, Dept. of Electr. & Comput. Eng., Univ. of Michigan at Ann Arbor, Ann Arbor, MI, USA
S. Savarese, Dept. of Electr. & Comput. Eng., Univ. of Michigan at Ann Arbor, Ann Arbor, MI, USA
pp. 2025-2032
Zhiwei Zhu, SRI Int. Sarnoff, Princeton, NJ, USA
Han-Pang Chiu, SRI Int. Sarnoff, Princeton, NJ, USA
T. Oskiper, SRI Int. Sarnoff, Princeton, NJ, USA
S. Ali, SRI Int. Sarnoff, Princeton, NJ, USA
R. Hadsell, SRI Int. Sarnoff, Princeton, NJ, USA
S. Samarasekera, SRI Int. Sarnoff, Princeton, NJ, USA
R. Kumar, SRI Int. Sarnoff, Princeton, NJ, USA
pp. 81-88
L. Kneip, Autonomous Syst. Lab., ETH Zurich, Zurich, Switzerland
D. Scaramuzza, Autonomous Syst. Lab., ETH Zurich, Zurich, Switzerland
R. Siegwart, Autonomous Syst. Lab., ETH Zurich, Zurich, Switzerland
pp. 2969-2976
R. Pandharkar, MIT Media Lab., Cambridge, MA, USA
A. Velten, MIT Media Lab., Cambridge, MA, USA
A. Bardagjy, MIT Media Lab., Cambridge, MA, USA
E. Lawson, MIT Media Lab., Cambridge, MA, USA
M. Bawendi, Dept. of Chem., MIT, Cambridge, MA, USA
R. Raskar, MIT Media Lab., Cambridge, MA, USA
pp. 265-272
G. Kulkarni, Stony Brook Univ., Stony Brook, NY, USA
V. Premraj, Stony Brook Univ., Stony Brook, NY, USA
S. Dhar, Stony Brook Univ., Stony Brook, NY, USA
Siming Li, Stony Brook Univ., Stony Brook, NY, USA
Yejin Choi, Stony Brook Univ., Stony Brook, NY, USA
A. C. Berg, Stony Brook Univ., Stony Brook, NY, USA
T. L. Berg, Stony Brook Univ., Stony Brook, NY, USA
pp. 1601-1608
S. Dhar, Stony Brook Univ., Stony Brook, NY, USA
V. Ordonez, Stony Brook Univ., Stony Brook, NY, USA
T. L. Berg, Stony Brook Univ., Stony Brook, NY, USA
pp. 1657-1664
K. Yamaguchi, Stony Brook Univ., Stony Brook, NY, USA
A. C. Berg, Stony Brook Univ., Stony Brook, NY, USA
L. E. Ortiz, Stony Brook Univ., Stony Brook, NY, USA
T. L. Berg, Stony Brook Univ., Stony Brook, NY, USA
pp. 1345-1352
D. Singaraju, Center for Imaging Sci., Johns Hopkins Univ., Baltimore, MD, USA
R. Vidal, Center for Imaging Sci., Johns Hopkins Univ., Baltimore, MD, USA
pp. 2313-2319
Minh Hoai, Carnegie Mellon Univ., Pittsburgh, PA, USA
Zhen-Zhong Lan, Carnegie Mellon Univ., Pittsburgh, PA, USA
F. De la Torre, Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 3265-3272
B. M. Smith, Univ. of Wisconsin, Madison, WI, USA
Shengqi Zhu, Univ. of Wisconsin, Madison, WI, USA
Li Zhang, Univ. of Wisconsin, Madison, WI, USA
pp. 769-776
Sai-Kit Yeung, Univ. of California, Los Angeles, CA, USA
Tai-Pang Wu, Hong Kong Univ. of Sci. & Technol., Hong Kong, China
Chi-Keung Tang, Hong Kong Univ. of Sci. & Technol., Hong Kong, China
T. F. Chan, Univ. of California, Los Angeles, CA, USA
S. Osher, Univ. of California, Los Angeles, CA, USA
pp. 2513-2520
Xiaowu Chen, State Key Lab. of Virtual Reality Technol. & Syst., Beihang Univ., Beijing, China
Mengmeng Chen, State Key Lab. of Virtual Reality Technol. & Syst., Beihang Univ., Beijing, China
Xin Jin, State Key Lab. of Virtual Reality Technol. & Syst., Beihang Univ., Beijing, China
Qinping Zhao, State Key Lab. of Virtual Reality Technol. & Syst., Beihang Univ., Beijing, China
pp. 281-287
T. Deselaers, Comput. Vision Lab., ETH Zurich, Zurich, Switzerland
V. Ferrari, Comput. Vision Lab., ETH Zurich, Zurich, Switzerland
pp. 1777-1784
C. Leistner, Comput. Vision Lab., ETH Zurich, Zurich, Switzerland
M. Godec, Inst. for Comput. Graphics & Vision, Tech. Univ. Graz, Graz, Austria
S. Schulter, Inst. for Comput. Graphics & Vision, Tech. Univ. Graz, Graz, Austria
A. Saffari, Sony Comput. Entertainment, Oxford Brookes Univ., London, UK
M. Werlberger, Inst. for Comput. Graphics & Vision, Tech. Univ. Graz, Graz, Austria
H. Bischof, Inst. for Comput. Graphics & Vision, Tech. Univ. Graz, Graz, Austria
pp. 2753-2760
Junsong Yuan, Sch. of EEE, Nanyang Technol. Univ., Singapore, Singapore
Ming Yang, Dept. of Media Analytics, NEC Labs. America, Cupertino, CA, USA
Ying Wu, EECS Dept., Northwestern Univ., Evanston, IL, USA
pp. 2777-2784
Yuanqing Lin, NEC Labs. America, Cupertino, CA, USA
Fengjun Lv, NEC Labs. America, Cupertino, CA, USA
Shenghuo Zhu, NEC Labs. America, Cupertino, CA, USA
Ming Yang, NEC Labs. America, Cupertino, CA, USA
T. Cour, NEC Labs. America, Cupertino, CA, USA
Kai Yu, NEC Labs. America, Cupertino, CA, USA
Liangliang Cao, Beckman Inst., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
T. Huang, Beckman Inst., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
pp. 1689-1696
Weisheng Dong, Xidian Univ., Xi'an, China
Lei Zhang, HK Polytech. Univ., China
Guangming Shi, Xidian Univ., Xi'an, China
pp. 457-464
Taeg Sang Cho, Massachusetts Inst. of Technol., Cambridge, MA, USA
B. K. P. Horn, Massachusetts Inst. of Technol., Cambridge, MA, USA
W. T. Freeman, Massachusetts Inst. of Technol., Cambridge, MA, USA
pp. 241-248
Liang Wang, Center for Visualization & Virtual Environments, Univ. of Kentucky, Lexington, KY, USA
Ruigang Yang, Center for Visualization & Virtual Environments, Univ. of Kentucky, Lexington, KY, USA
pp. 3033-3040
Ming Yang, NEC Labs. America, Inc., Cupertino, CA, USA
Shenghuo Zhu, NEC Labs. America, Inc., Cupertino, CA, USA
Fengjun Lv, Huawei Technol. (USA), Santa Clara, CA, USA
Kai Yu, NEC Labs. America, Inc., Cupertino, CA, USA
pp. 505-512
Peng Zhao, Hong Kong Univ. of Sci. & Technol., Hong Kong, China
Long Quan, Hong Kong Univ. of Sci. & Technol., Hong Kong, China
pp. 1009-1016
Hanxi Li, NICTA, Canberra Res. Lab., Canberra, ACT, Australia
Chunhua Shen, Australian Center for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
Qinfeng Shi, Australian Center for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
pp. 1305-1312
Chunjie Zhang, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
Jing Liu, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
Qi Tian, Univ. of Texas at San Antonio, San Antonio, TX, USA
Changsheng Xu, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
Hanqing Lu, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
Songde Ma, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
pp. 1673-1680
R. Gopalan, Center for Autom. Res., Univ. of Maryland, College Park, MD, USA
J. Sankaranarayanan, Center for Autom. Res., Univ. of Maryland, College Park, MD, USA
pp. 2769-2776
D. Raviv, Dept. of Comput. Sci., Technion - Israel Inst. of Technol., Haifa, Israel
A. M. Bronstein, Dept. of Electr. Eng., Tel Aviv Univ., Tel Aviv, Israel
M. M. Bronstein, Dept. of Inf., Univ. della Svizzera Italiana, Lugano, Switzerland
R. Kimmel, Dept. of Comput. Sci., Technion - Israel Inst. of Technol., Haifa, Israel
N. Sochen, Dept. of Appl. Math., Tel Aviv Univ., Tel Aviv, Israel
pp. 2361-2367
Ran He, Inst. of Autom., Chinese Acad. of Sci., Beijing, China
Wei-Shi Zheng, Sch. of Inf. Sci. & Technol., Sun Yat-sen Univ., Guangzhou, China
Bao-Gang Hu, Inst. of Autom., Chinese Acad. of Sci., Beijing, China
Xiang-Wei Kong, Dept. of Electron. Eng., Dalian Univ. of Technol., Dalian, China
pp. 2849-2856
Gang Yu, Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Junsong Yuan, Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Zicheng Liu, Microsoft Res., Redmond, WA, USA
pp. 865-872
R. Lasowski, Max-Planck Inst. Inf., Saarbrucken, Germany
A. Tevs, Max-Planck Inst. Inf., Saarbrucken, Germany
M. Wand, Max-Planck Inst. Inf., Saarbrucken, Germany
H. Seidel, Max-Planck Inst. Inf., Saarbrucken, Germany
pp. 1921-1928
X. Maurice, LSIIT, Strasbourg Univ., Strasbourg, France
P. Graebling, LSIIT, Strasbourg Univ., Strasbourg, France
C. Doignon, LSIIT, Strasbourg Univ., Strasbourg, France
pp. 2497-2504
W. Brendel, Oregon State Univ., Corvallis, OR, USA
A. Fern, Oregon State Univ., Corvallis, OR, USA
S. Todorovic, Oregon State Univ., Corvallis, OR, USA
pp. 3329-3336
Mithun Das Gupta, GE Global Res., Bangalore, India
Jing Xiao, Epson R&D Inc., San Jose, CA, USA
pp. 2841-2848
Jiang Wang, EECS Dept., Northwestern Univ., Evanston, IL, USA
Zhuoyuan Chen, EECS Dept., Northwestern Univ., Evanston, IL, USA
Ying Wu, EECS Dept., Northwestern Univ., Evanston, IL, USA
pp. 3185-3192
Qi Yin, Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
Xiaoou Tang, Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
pp. 497-504
Kaiming He, Chinese Univ. of Hong Kong, Hong Kong, China
C. Rhemann, Vienna Univ. of Technol., Vienna, Austria
C. Rother, Microsoft Res., Cambridge, UK
Xiaoou Tang, Chinese Univ. of Hong Kong, Hong Kong, China
pp. 2049-2056
Q. V. Le, Comput. Sci. Dept., Stanford Univ., Stanford, CA, USA
W. Y. Zou, Comput. Sci. Dept., Stanford Univ., Stanford, CA, USA
S. Y. Yeung, Comput. Sci. Dept., Stanford Univ., Stanford, CA, USA
A. Y. Ng, Comput. Sci. Dept., Stanford Univ., Stanford, CA, USA
pp. 3361-3368
Xiaobai Liu, Huazhong Univ. of Sci. & Technol., Wuhan, China
Jiashi Feng, Nat. Univ. of Singapore, Singapore, Singapore
Shuicheng Yan, Nat. Univ. of Singapore, Singapore, Singapore
Liang Lin, Sun Yat-Sen Univ., Guangzhou, China
Hai Jin, Huazhong Univ. of Sci. & Technol., Wuhan, China
pp. 2249-2256
K. Schelten, Dept. of Comput. Sci., Tech. Univ. Darmstadt, Darmstadt, Germany
S. Roth, Dept. of Comput. Sci., Tech. Univ. Darmstadt, Darmstadt, Germany
pp. 2641-2648
Yang Yang, Univ. of Queensland, Brisbane, QLD, Australia
Yi Yang, Univ. of Queensland, Brisbane, QLD, Australia
Zi Huang, Univ. of Queensland, Brisbane, QLD, Australia
Heng Tao Shen, Univ. of Queensland, Brisbane, QLD, Australia
Feiping Nie, Univ. of Texas Arlington, Arlington, TX, USA
pp. 881-888
Yiqun Hu, Sch. of Comput. Sci. & Software Eng., Univ. of Western Australia, Perth, WA, Australia
A. S. Mian, Sch. of Comput. Sci. & Software Eng., Univ. of Western Australia, Perth, WA, Australia
R. Owens, Sch. of Comput. Sci. & Software Eng., Univ. of Western Australia, Perth, WA, Australia
pp. 121-128
M. Dubska, Brno Univ. of Technol., Brno, Czech Republic
A. Herout, Brno Univ. of Technol., Brno, Czech Republic
J. Havel, Brno Univ. of Technol., Brno, Czech Republic
pp. 1489-1494
B. Daubney, Dept. of Comput. Sci., Swansea Univ., Swansea, UK
Xianghua Xie, Dept. of Comput. Sci., Swansea Univ., Swansea, UK
pp. 1321-1328
Chao Chen, IST Austria (Inst. of Sci. & Technol. Austria), Austria
D. Freedman, Sch. of Eng., Bar Ilan Univ., Ramat Gan, Israel
C. H. Lampert, IST Austria (Inst. of Sci. & Technol. Austria), Austria
pp. 2089-2096
A. Gordo, Comput. Vision Center, Univ. Autonoma de Barcelona, Barcelona, Spain
F. Perronnin, Textual & Visual Pattern Anal., Xerox Res. Centre Eur., Meylan, France
pp. 729-736
N. Murray, Comput. Sci. Dept., Univ. Autonoma de Barcelona, Barcelona, Spain
M. Vanrell, Comput. Sci. Dept., Univ. Autonoma de Barcelona, Barcelona, Spain
X. Otazu, Comput. Sci. Dept., Univ. Autonoma de Barcelona, Barcelona, Spain
C. A. Parraga, Comput. Sci. Dept., Univ. Autonoma de Barcelona, Barcelona, Spain
pp. 433-440
Jianbing Shen, Beijing Lab. of Intell. Inf. Technol., Beijing Inst. of Technol., Beijing, China
Xiaoshan Yang, Beijing Lab. of Intell. Inf. Technol., Beijing Inst. of Technol., Beijing, China
Yunde Jia, Beijing Lab. of Intell. Inf. Technol., Beijing Inst. of Technol., Beijing, China
Xuelong Li, State Key Lab. of Transient Opt. & Photonics, Chinese Acad. of Sci., Xi'an, China
pp. 3481-3487
S. Brutzer, Intell. Syst. Group, Univ. Stuttgart, Stuttgart, Germany
B. Hoferlin, Intell. Syst. Group, Univ. Stuttgart, Stuttgart, Germany
G. Heidemann, Intell. Syst. Group, Univ. Stuttgart, Stuttgart, Germany
pp. 1937-1944
K. Streib, Dept. of Comput. Sci. & Eng., Ohio State Univ., Columbus, OH, USA
J. W. Davis, Dept. of Comput. Sci. & Eng., Ohio State Univ., Columbus, OH, USA
pp. 2305-2312
M. K. Johnson, Massachusetts Inst. of Technol., Cambridge, MA, USA
E. H. Adelson, Massachusetts Inst. of Technol., Cambridge, MA, USA
pp. 2553-2560
Jongwoo Lim, Honda Res. Inst. USA, Inc., Mountain View, CA, USA
Jan-Michael Frahm, Dept. of Comput. Sci., Univ. of North Carolina, Chapel Hill, NC, USA
M. Pollefeys, Dept. of Comput. Sci., ETH Zurich, Zurich, Switzerland
pp. 3489-3496
A. Elqursh, Dept. of Comput. Sci., Rutgers Univ., New Brunswick, NJ, USA
A. Elgammal, Dept. of Comput. Sci., Rutgers Univ., New Brunswick, NJ, USA
pp. 3049-3056
Yun Zeng, Comput. Sci. Dept., Stony Brook Univ., New York, NY, USA
Chaohui Wang, Lab. MAS, Ecole Centrale Paris, Chatenay-Malabry, France
Yang Wang, Comput. Sci. Dept., Stony Brook Univ., New York, NY, USA
Xianfeng Gu, Comput. Sci. Dept., Stony Brook Univ., New York, NY, USA
D. Samaras, Comput. Sci. Dept., Stony Brook Univ., New York, NY, USA
N. Paragios, Lab. MAS, Ecole Centrale Paris, Chatenay-Malabry, France
pp. 1225-1232
S. Mittal, ECE Dept., Rutgers Univ., Piscataway, NJ, USA
S. Anand, ECE Dept., Rutgers Univ., Piscataway, NJ, USA
P. Meer, ECE Dept., Rutgers Univ., Piscataway, NJ, USA
pp. 2689-2696
Zheng Wu, Dept. of Comput. Sci., Boston Univ., Boston, MA, USA
T. H. Kunz, Dept. of Biol., Boston Univ., Boston, MA, USA
M. Betke, Dept. of Comput. Sci., Boston Univ., Boston, MA, USA
pp. 1185-1192
A. Humayun, Univ. Coll. London, London, UK
O. M. Aodha, Univ. Coll. London, London, UK
G. J. Brostow, Univ. Coll. London, London, UK
pp. 2161-2168
Junfeng He, Columbia Univ., New York, NY, USA
Regunathan Radhakrishnan, Dolby Labs., San Francisco, CA, USA
Shih-Fu Chang, Columbia Univ., New York, NY, USA
Claus Bauer, Dolby Labs., San Francisco, CA, USA
pp. 753-760
Yang Wang, Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Duan Tran, Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Zicheng Liao, Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
pp. 1705-1712
Jian Sun, Sch. of Sci., Xi'an Jiaotong Univ., Xi'an, China
M. F. Tappen, EECS, Univ. of Central Florida, Orlando, FL, USA
pp. 2745-2752
D. Krishnan, Courant Inst., New York Univ., New York, NY, USA
R. Fergus, Courant Inst., New York Univ., New York, NY, USA
pp. 233-240
T. Parag, HHMI, Ashburn, VA, USA
A. Elgammal, Dept. of Comput. Sci., Rutgers Univ., Piscataway, NJ, USA
pp. 2289-2296
Yong Jae Lee, Univ. of Texas at Austin, Austin, TX, USA
K. Grauman, Univ. of Texas at Austin, Austin, TX, USA
pp. 1721-1728
Bin Zhao, Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
Li Fei-Fei, Comput. Sci. Dept., Stanford Univ., Stanford, CA, USA
E. P. Xing, Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 3313-3320
M. Grundmann, Google Res., Mountain View, CA, USA
V. Kwatra, Google Res., Mountain View, CA, USA
I. Essa, Georgia Inst. of Technol., Atlanta, GA, USA
pp. 225-232
Jaechul Kim, Univ. of Texas at Austin, Austin, TX, USA
K. Grauman, Univ. of Texas at Austin, Austin, TX, USA
pp. 1553-1560
C. Galleguillos, Comput. Sci. & Eng. Dept., Univ. of California, San Diego, CA, USA
B. McFee, Comput. Sci. & Eng. Dept., Univ. of California, San Diego, CA, USA
S. Belongie, Comput. Sci. & Eng. Dept., Univ. of California, San Diego, CA, USA
G. Lanckriet, Electr. & Comput. Eng. Dept., Univ. of California, San Diego, CA, USA
pp. 2665-2672
Yimeng Zhang, Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
Zhaoyin Jia, Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
Tsuhan Chen, Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
pp. 809-816
F. Moreno-Noguer, Inst. de Robot. i Inf. Ind., CSIC-UPC, Barcelona, Spain
pp. 1593-1600
S. Vicente, Univ. Coll. London, London, UK
V. Kolmogorov, Univ. Coll. London, London, UK
pp. 2217-2224
Chaoying Tang, Nanyang Technol. Univ., Singapore, Singapore
Adams Wai Kin Kong, Nanyang Technol. Univ., Singapore, Singapore
N. Craft, Los Angeles Biomed. Res. Inst., Harbor-UCLA Med. Center, Torrance, CA, USA
pp. 665-672
F. Moreno-Noguer, Inst. de Robot. i Inf. Ind., CSIC-UPC, Barcelona, Spain
J. M. Porta, Inst. de Robot. i Inf. Ind., CSIC-UPC, Barcelona, Spain
pp. 1289-1296
M. Hansard, INRIA Grenoble Rhone-Alpes, Montbonnot, France
R. Horaud, INRIA Grenoble Rhone-Alpes, Montbonnot, France
M. Amat, INRIA Grenoble Rhone-Alpes, Montbonnot, France
Seungkyu Lee, 3D Mixed Reality Group, Samsung Adv. Inst. of Technol., Yongin, South Korea
pp. 3089-3096
B. Micusik, AIT Austrian Inst. of Technol., Seibersdorf, Austria
pp. 3105-3112
Xingwei Yang, Dept. of Comput. & Inf. Sci., Temple Univ., Philadelphia, PA, USA
N. Adluru, Dept. of Biostat. & Med. Inf., Univ. of Winsconsin-Madison, Madison, WI, USA
L. J. Latecki, Dept. of Comput. & Inf. Sci., Temple Univ., Philadelphia, PA, USA
pp. 2873-2880
M. Holroyd, Univ. of Virginia, Charlottesville, VA, USA
J. Lawrence, Univ. of Virginia, Charlottesville, VA, USA
pp. 2985-2991
Nan Jiang, Huazhong Univ. of Sci. & Technol., Wuhan, China
Heng Su, Tsinghua Univ., Beijing, China
Wenyu Liu, Huazhong Univ. of Sci. & Technol., Wuhan, China
Ying Wu, Northwestern Univ., Evanston, IL, USA
pp. 1329-1336
G. W. Taylor, Dept. of Comput. Sci., New York Univ., New York, NY, USA
I. Spiro, Dept. of Comput. Sci., New York Univ., New York, NY, USA
C. Bregler, Dept. of Comput. Sci., New York Univ., New York, NY, USA
R. Fergus, Dept. of Comput. Sci., New York Univ., New York, NY, USA
pp. 2729-2736
M. Nishiyama, Inst. of Ind. Sci., Univ. of Tokyo, Tokyo, Japan
T. Okabe, Inst. of Ind. Sci., Univ. of Tokyo, Tokyo, Japan
I. Sato, Nat. Inst. of Inf., Tokyo, Japan
Y. Sato, Inst. of Ind. Sci., Univ. of Tokyo, Tokyo, Japan
pp. 33-40
Yuandong Tian, Robot. Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA
S. G. Narasimhan, Robot. Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 377-384
J. Susskind, Inst. for Neural Comput., Univ. of California, San Diego, CA, USA
R. Memisevic, Dept. of Comput. Sci., Univ. of Frankfurt, Frankfurt, Germany
G. Hinton, Dept. of Comput. Sci., Univ. of Toronto, Toronto, ON, Canada
M. Pollefeys, Dept. of Comput. Sci., ETH Zurich, Zurich, Switzerland
pp. 2793-2800
D. Reddy, Univ. of Maryland, College Park, MD, USA
A. Veeraraghavan, Mitsubishi Electr. Res. Labs., Cambridge, MA, USA
R. Chellappa, Univ. of Maryland, College Park, MD, USA
pp. 329-336
Sung Ju Hwang, Dept. of Comput. Sci., Univ. of Texas at Austin, Austin, TX, USA
Fei Sha, Comput. Sci. Dept., Univ. of Southern California, Los Angeles, CA, USA
K. Grauman, Dept. of Comput. Sci., Univ. of Texas at Austin, Austin, TX, USA
pp. 1761-1768
F. Bergamasco, Dipt. di Sci. Ambientali, Inf. e Statistica, Univ. Ca' Foscari Venezia, Venice, Italy
A. Albarelli, Dipt. di Sci. Ambientali, Inf. e Statistica, Univ. Ca' Foscari Venezia, Venice, Italy
E. Rodola, Dipt. di Sci. Ambientali, Inf. e Statistica, Univ. Ca' Foscari Venezia, Venice, Italy
A. Torsello, Dipt. di Sci. Ambientali, Inf. e Statistica, Univ. Ca' Foscari Venezia, Venice, Italy
pp. 113-120
S. Vijayanarasimhan, Univ. of Texas at Austin, Austin, TX, USA
K. Grauman, Univ. of Texas at Austin, Austin, TX, USA
pp. 1401-1408
R. Garg, Univ. of Washington, Seattle, WA, USA
D. Ramanan, Univ. of California at Irvine, Irvine, CA, USA
Steven M. Seitz, Univ. of Washington, Seattle, WA, USA
pp. 1793-1800
C. Wojek, MPI Inf., Saarbrucken, Germany
S. Walk, Dept. of Comput. Sci., Tech. Univ. Darmstadt, Darmstadt, Germany
S. Roth, Dept. of Comput. Sci., Tech. Univ. Darmstadt, Darmstadt, Germany
B. Schiele, MPI Inf., Saarbrucken, Germany
pp. 1993-2000
R. Roberts, Georgia Inst. of Technol. Atlanta, Atlanta, GA, USA
S. N. Sinha, Microsoft Res., Redmond, WA, USA
R. Szeliski, Microsoft Res., Redmond, WA, USA
D. Steedly, Microsoft, Redmond, WA, USA
pp. 3137-3144
M. Reynolds, Univ. Coll. London, London, UK
J. Dobos, Univ. Coll. London, London, UK
L. Peel, Adv. Technol. Centre, BAE Syst., Bristol, UK
T. Weyrich, Univ. Coll. London, London, UK
G. J. Brostow, Univ. Coll. London, London, UK
pp. 945-952
Changchang Wu, Univ. of Washington, Seattle, WA, USA
J. Frahm, UNC-Chapel Hill, Chapel Hill, NC, USA
M. Pollefeys, ETH-Zurich, Switzerland
pp. 3113-3120
Changchang Wu, Univ. of Washington, Seattle, WA, USA
B. Curless, Univ. of Washington, Seattle, WA, USA
S. M. Seitz, Univ. of Washington, Seattle, WA, USA
pp. 3057-3064
Wen Wu, Image Analytics & Inf., Siemens Corp. Res., Princeton, NJ, USA
T. Chen, Image Analytics & Inf., Siemens Corp. Res., Princeton, NJ, USA
A. Barbu, Dept. of Stat., Florida State Univ., Tallahassee, FL, USA
Peng Wang, Image Analytics & Inf., Siemens Corp. Res., Princeton, NJ, USA
N. Strobel, Siemens AG, Forchheim, Germany
S. K. Zhou, Image Analytics & Inf., Siemens Corp. Res., Princeton, NJ, USA
D. Comaniciu, Image Analytics & Inf., Siemens Corp. Res., Princeton, NJ, USA
pp. 1097-1104
Chunhua Shen, Australian Center for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
Zhihui Hao, Beijing Inst. of Technol., Beijing, China
pp. 2585-2592
Chia-Chih Chen, Dept. of ECE, Univ. of Texas at Austin, Austin, TX, USA
J. K. Aggarwal, Dept. of ECE, Univ. of Texas at Austin, Austin, TX, USA
pp. 3425-3432
Qinfeng Shi, Australian Centre for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
A. Eriksson, Australian Centre for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
A. van den Hengel, Australian Centre for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
Chunhua Shen, Australian Centre for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
pp. 553-560
B. Kamgar-Parsi, Office of Naval Res., Arlington, VA, USA
B. Kamgar-Parsi, Naval Res. Lab., Navy Center for Appl. Res. in AI, Washington, DC, USA
pp. 2425-2432
Xinyi Cui, Dept. of Comput. Sci., Rutgers Univ., Piscataway, NJ, USA
Qingshan Liu, Dept. of Comput. Sci., Rutgers Univ., Piscataway, NJ, USA
Mingchen Gao, Dept. of Comput. Sci., Rutgers Univ., Piscataway, NJ, USA
D. N. Metaxas, Dept. of Comput. Sci., Rutgers Univ., Piscataway, NJ, USA
pp. 3161-3167
C. D. Castillo, Comput. Sci. Dept., Univ. of Maryland, College Park, MD, USA
D. W. Jacobs, Comput. Sci. Dept., Univ. of Maryland, College Park, MD, USA
pp. 537-544
P. F. U. Gotardo, Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
A. M. Martinez, Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
pp. 3065-3072
Dongfeng Han, Dept. of Radiat. Oncology, Univ. of Iowa, Iowa City, IA, USA
J. Bayouth, Dept. of Radiat. Oncology, Univ. of Iowa, Iowa City, IA, USA
Qi Song, Dept. of Electr. & Comput. Eng., Univ. of Iowa, Iowa City, IA, USA
S. Bhatia, Dept. of Radiat. Oncology, Univ. of Iowa, Iowa City, IA, USA
M. Sonka, Dept. of Electr. & Comput. Eng., Univ. of Iowa, Iowa City, IA, USA
Xiaodong Wu, Dept. of Electr. & Comput. Eng., Univ. of Iowa, Iowa City, IA, USA
pp. 1057-1064
Wei-Lwun Lu, Univ. of British Columbia, Vancouver, BC, Canada
Jo-Anne Ting, Univ. of British Columbia, Vancouver, BC, Canada
K. P. Murphy, Univ. of British Columbia, Vancouver, BC, Canada
J. J. Little, Univ. of British Columbia, Vancouver, BC, Canada
pp. 3249-3256
Yi Fang, Purdue Univ., West Lafayette, IN, USA
Mengtian Sun, Purdue Univ., West Lafayette, IN, USA
S. V. N. Vishwanathan, Purdue Univ., West Lafayette, IN, USA
K. Ramani, Purdue Univ., West Lafayette, IN, USA
pp. 1129-1136
M. T. Harandi, NICTA, St. Lucia, QLD, Australia
C. Sanderson, NICTA, St. Lucia, QLD, Australia
S. Shirazi, NICTA, St. Lucia, QLD, Australia
B. C. Lovell, NICTA, St. Lucia, QLD, Australia
pp. 2705-2712
A. Torsello, Dipt. di Sci. Ambientali, Inf. e Statistica, Univ. Ca' Foscari Venezia, Venice, Italy
E. Rodola, Dipt. di Sci. Ambientali, Inf. e Statistica, Univ. Ca' Foscari Venezia, Venice, Italy
A. Albarelli, Dipt. di Sci. Ambientali, Inf. e Statistica, Univ. Ca' Foscari Venezia, Venice, Italy
pp. 2441-2448
L. Wolf, Blavatnik Sch. of Comput. Sci., Tel-Aviv Univ., Tel-Aviv, Israel
T. Hassner, Comput. Sci. Div., Open Univ. of Israel, Israel
I. Maoz, Blavatnik Sch. of Comput. Sci., Tel-Aviv Univ., Tel-Aviv, Israel
pp. 529-534
Xiaogang Chen, Inst. of Image Process. & Pattern Recognition, Shanghai Jiao Tong Univ., Shanghai, China
Xiangjian He, Centre for Innovation in IT Services & Applic., Univ. of Technol., Sydney, NSW, Australia
Jie Yang, Inst. of Image Process. & Pattern Recognition, Shanghai Jiao Tong Univ., Shanghai, China
Qiang Wu, Centre for Innovation in IT Services & Applic., Univ. of Technol., Sydney, NSW, Australia
pp. 369-376
A. L. Rodriguez, DITEC, Univ. de Murcia, Murcia, Spain
P. E. Lopez-de-Teruel, DITEC, Univ. de Murcia, Murcia, Spain
A. Ruiz, DIS, Univ. de Murcia, Murcia, Spain
pp. 3097-3104
Liang Li, Key Lab. of Intell. Inf. Process., CAS, China
Shuqiang Jiang, Key Lab. of Intell. Inf. Process., CAS, China
Qingming Huang, Grad. Univ. Chinese Acad. of Sci., China
pp. 825-832
Remi Emonet, Idiap Res. Inst., Martigny, Switzerland
Jagannadan Varadarajan, Idiap Res. Inst., Martigny, Switzerland
Jean-Marc Odobez, Idiap Res. Inst., Martigny, Switzerland
pp. 3233-3240
E. Strekalovskiy, Tech. Univ. Munich, Munich, Germany
D. Cremers, Tech. Univ. Munich, Munich, Germany
pp. 1905-1911
L. Pishchulin, MPI Inf., Saarbrucken, Germany
A. Jain, MPI Inf., Saarbrucken, Germany
C. Wojek, MPI Inf., Saarbrucken, Germany
M. Andriluka, MPI Inf., Saarbrucken, Germany
T. Thormahlen, MPI Inf., Saarbrucken, Germany
B. Schiele, MPI Inf., Saarbrucken, Germany
pp. 1473-1480
B. C. Matei, SRI Int. Sarnoff, Princeton, NJ, USA
H. S. Sawhney, SRI Int. Sarnoff, Princeton, NJ, USA
S. Samarasekera, SRI Int. Sarnoff, Princeton, NJ, USA
pp. 3465-3472
Y. Yoshiyasu, Grad. Sch. of Sci. & Technol., Keio Univ., Yokohama, Japan
N. Yamazaki, Dept. of Mech. Eng., Keio Univ., Yokohama, Japan
pp. 1001-1008
The magic sigma (Abstract)
D. Padfield, GE Global Res., Niskayuna, NY, USA
pp. 129-136
G. Zen, DISI, Univ. of Trento, Povo, Italy
E. Ricci, Fondazione Bruno Kessler, Povo, Italy
pp. 3225-3232
Hao Jiang, Boston Coll., Chestnut Hill, MA, USA
Tai-Peng Tian, Boston Univ., Boston, MA, USA
S. Sclaroff, Boston Univ., Boston, MA, USA
pp. 2473-2480
M. Bleyer, Vienna Univ. of Technol. Vienna, Vienna, Austria
C. Rother, Microsoft Res. Cambridge, Cambridge, UK
P. Kohli, Microsoft Res. Cambridge, Cambridge, UK
D. Scharstein, Middlebury Coll., Middlebury, VT, USA
S. Sinha, Microsoft Res. Redmond, Redmond, WA, USA
pp. 3081-3088
J. Gall, BIWI, ETH Zurich, Zurich, Swaziland
A. Fossati, BIWI, ETH Zurich, Zurich, Swaziland
L. van Gool, BIWI, ETH Zurich, Zurich, Swaziland
pp. 1969-1976
F. Escolano, Univ. of Alicante, Alicante, Spain
E. Hancock, Univ. of York, York, UK
M. Lozano, Univ. of Alicante, Alicante, Spain
pp. 2417-2424
Xiong Li, Shanghai Jiao Tong Univ., Shanghai, China
Tai Sing Lee, Carnegie Mellon Univ., Pittsburgh, PA, USA
Yuncai Liu, Shanghai Jiao Tong Univ., Shanghai, China
pp. 2713-2720
A. Panagopoulos, Comput. Sci. Dept., Stony Brook Univ., Stony Brook, NY, USA
Chaohui Wang, Lab. MAS, Ecole Centrale Paris, Chatenay-Malabry, France
D. Samaras, Comput. Sci. Dept., Stony Brook Univ., Stony Brook, NY, USA
N. Paragios, Lab. MAS, Ecole Centrale Paris, Chatenay-Malabry, France
pp. 673-680
Bo Yang, Inst. for Robot. & Intell. Syst., Univ. of Southern California, Los Angeles, CA, USA
Chang Huang, Inst. for Robot. & Intell. Syst., Univ. of Southern California, Los Angeles, CA, USA
R. Nevatia, Inst. for Robot. & Intell. Syst., Univ. of Southern California, Los Angeles, CA, USA
pp. 1233-1240
Yu Cao, Dept. of Comput. Sci. & Eng., Univ. of South Carolina, Columbia, SC, USA
Zhiqi Zhang, Dept. of Comput. Sci. & Eng., Univ. of South Carolina, Columbia, SC, USA
I. Czogiel, Max Planck Inst. for Mol. Genetics, Berlin, Germany
I. Dryden, Dept. of Stat., Univ. of South Carolina, Columbia, SC, USA
Song Wang, Dept. of Comput. Sci. & Eng., Univ. of South Carolina, Columbia, SC, USA
pp. 2345-2352
S. Jegelka, Max Planck Inst. Tubingen, Germany
J. Bilmes, Univ. of Washington, Seattle, WA, USA
pp. 1897-1904
Yu Cao, Dept. of Comput. Sci. & Eng., Univ. of South Carolina, Columbia, SC, USA
Lili Ju, Dept. of Math., Univ. of South Carolina, Columbia, SC, USA
Qin Zou, Dept. of Comput. Sci. & Eng., Univ. of South Carolina, Columbia, SC, USA
Chengzhang Qu, Dept. of Comput. Sci. & Eng., Univ. of South Carolina, Columbia, SC, USA
Song Wang, Dept. of Comput. Sci. & Eng., Univ. of South Carolina, Columbia, SC, USA
pp. 17-24
Tianyang Ma, Dept. of Comput. & Inf. Sci., Temple Univ., Philadelphia, PA, USA
L. J. Latecki, Dept. of Comput. & Inf. Sci., Temple Univ., Philadelphia, PA, USA
pp. 1441-1448
Jianping Shi, Dept. of Comput. Sci. & Technol., Zhejiang Univ., Hangzhou, China
Xiang Ren, Dept. of Comput. Sci. & Technol., Zhejiang Univ., Hangzhou, China
Guang Dai, Dept. of Comput. Sci. & Technol., Zhejiang Univ., Hangzhou, China
Zhihua Zhang, Dept. of Comput. Sci. & Technol., Zhejiang Univ., Hangzhou, China
pp. 1809-1816
J. Prokaj, Univ. of Southern California, Los Angeles, CA, USA
G. Medioni, Univ. of Southern California, Los Angeles, CA, USA
pp. 1337-1344
Yali Zheng, Chongqing Univ., Chongqing, China
S. Nobuhara, Kyoto Univ., Kyoto, Japan
Y. Sheikh, Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 2569-2576
M. Douze, INRIA, France
A. Ramisa, Inst. de Robot. i Inf. Ind., CSIC-UPC, Barcelona, Spain
C. Schmid, INRIA, France
pp. 745-752
A. Agrawal, Mitsubishi Electr. Res. Labs. (MERL), Cambridge, MA, USA
Y. Taguchi, Mitsubishi Electr. Res. Labs. (MERL), Cambridge, MA, USA
S. Ramalingam, Mitsubishi Electr. Res. Labs. (MERL), Cambridge, MA, USA
pp. 2993-3000
Wei-Shi Zheng, Sch. of Inf. Sci. & Technol., Sun Yat-sen Univ., Guangzhou, China
Shaogang Gong, Sch. of Electron. Eng. & Comput. Sci., Queen Mary Univ. of London, London, UK
Tao Xiang, Sch. of Electron. Eng. & Comput. Sci., Queen Mary Univ. of London, London, UK
pp. 649-656
Branch and track (Abstract)
S. Gu, Duke Univ., Durham, NC, USA
C. Tomasi, Duke Univ., Durham, NC, USA
pp. 1169-1174
I. Budvytis, Dept. of Eng., Univ. of Cambridge, Cambridge, UK
V. Badrinarayanan, Dept. of Eng., Univ. of Cambridge, Cambridge, UK
R. Cipolla, Dept. of Eng., Univ. of Cambridge, Cambridge, UK
pp. 2257-2264
O. Chum, Dept. of Cybern., Czech Tech. Univ. in Prague, Prague, Czech Republic
A. Mikulik, Dept. of Cybern., Czech Tech. Univ. in Prague, Prague, Czech Republic
M. Perdoch, Dept. of Cybern., Czech Tech. Univ. in Prague, Prague, Czech Republic
J. Matas, Dept. of Cybern., Czech Tech. Univ. in Prague, Prague, Czech Republic
pp. 889-896
M. Chandraker, Univ. of California, Berkeley, CA, USA
Jiamin Bai, Univ. of California, Berkeley, CA, USA
R. Ramamoorthi, Univ. of California, Berkeley, CA, USA
pp. 2505-2512
H. Pirsiavash, Dept. of Comput. Sci., Univ. of California, Irvine, CA, USA
D. Ramanan, Dept. of Comput. Sci., Univ. of California, Irvine, CA, USA
C. C. Fowlkes, Dept. of Comput. Sci., Univ. of California, Irvine, CA, USA
pp. 1201-1208
M. J. Saberian, Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA
H. Masnadi-Shirazi, Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA
N. Vasconcelos, Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA
pp. 2929-2934
Hongbo Zhou, Dept. of Comput. Sci., Southern Illinois Univ. Carbondale, Carbondale, IL, USA
Qiang Cheng, Dept. of Comput. Sci., Southern Illinois Univ. Carbondale, Carbondale, IL, USA
pp. 2209-2215
B. Sapp, Univ. of Pennsylvania, Philadelphia, PA, USA
D. Weiss, Univ. of Pennsylvania, Philadelphia, PA, USA
B. Taskar, Univ. of Pennsylvania, Philadelphia, PA, USA
pp. 1281-1288
Jin Yu, Australian Centre for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
Tat-Jun Chin, Australian Centre for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
D. Suter, Australian Centre for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
pp. 2041-2048
Yihang Bo, Sch. of Comput. & Inf. Technol., Beijing Jiaotong Univ., Beijing, China
C. C. Fowlkes, Dept. of Comput. Sci., Univ. of California, Irvine, CA, USA
pp. 2265-2272
Qian-Yi Zhou, Univ. of Southern California, Los Angeles, SC, USA
U. Neumann, Univ. of Southern California, Los Angeles, SC, USA
pp. 2489-2496
P. W. Fieguth, Univ. of Waterloo, Waterloo, ON, Canada
D. A. Clausi, Univ. of Waterloo, Waterloo, ON, Canada
pp. 2121-2128
O. Ocegueda, Depts. of Comput. Sci., Univ. of Houston, Houston, TX, USA
S. K. Shah, Depts. of Comput. Sci., Univ. of Houston, Houston, TX, USA
I. A. Kakadiaris, Depts. of Comput. Sci., Univ. of Houston, Houston, TX, USA
pp. 641-648
Bing Li, Inst. of Autom., CAS, Beijing, China
Weihua Xiong, OmniVision Technol., Sunnyvale, CA, USA
Weiming Hu, Inst. of Autom., CAS, Beijing, China
Ou Wu, Inst. of Autom., CAS, Beijing, China
pp. 1929-1936
Yuanyuan Ding, Univ. of Delaware, Newark, DE, USA
Jingyi Yu, Univ. of Delaware, Newark, DE, USA
pp. 217-224
J. Saragih, ICT Center, CSIRO, Brisbane, QLD, Australia
pp. 2881-2888
Yunchao Gong, Dept. of Comput. Sci., UNC Chapel Hill, Chapel Hill, NC, USA
S. Lazebnik, Dept. of Comput. Sci., UNC Chapel Hill, Chapel Hill, NC, USA
pp. 2633-2640
Yu Wang, Rensselaer Polytech. Inst., Troy, NY, USA
A. Narayanaswamy, Rensselaer Polytech. Inst., Troy, NY, USA
B. Roysam, Univ. of Houston, Houston, TX, USA
pp. 1105-1112
Lu-Hung Chen, Res. Center for Inf. Technol. Innovation, Acad. Sinica, Taipei, Taiwan
Yao-Hsiang Yang, Res. Center for Inf. Technol. Innovation, Acad. Sinica, Taipei, Taiwan
Chu-Song Chen, Res. Center for Inf. Technol. Innovation, Acad. Sinica, Taipei, Taiwan
Ming-Yen Cheng, Dept. of Math., Nat. Taiwan Univ., Taipei, Taiwan
pp. 681-688
Jiandong Tian, State Key Lab. of Robot., Chinese Acad. of Sci., Shenyang, China
Yandong Tang, State Key Lab. of Robot., Chinese Acad. of Sci., Shenyang, China
pp. 985-992
Tianshi Gao, Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
B. Packer, Dept. of Comput. Sci., Stanford Univ., Stanford, CA, USA
D. Koller, Dept. of Comput. Sci., Stanford Univ., Stanford, CA, USA
pp. 1361-1368
Xinxiao Wu, Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
Dong Xu, Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
Lixin Duan, Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
Jiebo Luo, Kodak Res. Labs., Eastman Kodak Co., Rochester, NY, USA
pp. 489-496
V. G. Edupuganti, Dept. of Comput. Sci., New Jersey Inst. of Technol., Newark, NJ, USA
V. A. Agarwal, Stanford Univ., Stanford, CA, USA
S. Kompalli, Hewlett-Packard Labs., Bangalore, India
pp. 385-392
D. Crandall, Indiana Univ., Bloomington, IN, USA
A. Owens, MIT, Cambridge, MA, USA
N. Snavely, Cornell Univ., Ithaca, NY, USA
D. Huttenlocher, Cornell Univ., Ithaca, NY, USA
pp. 3001-3008
M. Rohrbach, MPI Inf., Saarbrucken, Germany
M. Stark, MPI Inf., Saarbrucken, Germany
B. Schiele, MPI Inf., Saarbrucken, Germany
pp. 1641-1648
Lingqiao Liu, Sch. of Eng., Australian Nat. Univ., Canberra, ACT, Australia
Lei Wang, Sch. of Eng., Australian Nat. Univ., Canberra, ACT, Australia
Chunhua Shen, Australian Center Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
pp. 1537-1544
J. Heller, Fac. of Electr. Eng., Czech Tech. Univ., Prague, Czech Republic
M. Havlena, Fac. of Electr. Eng., Czech Tech. Univ., Prague, Czech Republic
A. Sugimoto, Nat. Inst. of Inf., Tokyo, Japan
T. Pajdla, Fac. of Electr. Eng., Czech Tech. Univ., Prague, Czech Republic
pp. 3497-3503
S. Maji, Univ. of California, Berkeley, CA, USA
N. K. Vishnoi, Microsoft Res. India, Bangalore, India
J. Malik, Univ. of California, Berkeley, CA, USA
pp. 2057-2064
S. Maji, Univ. of California at Berkeley, Berkeley, CA, USA
L. Bourdev, Univ. of California at Berkeley, Berkeley, CA, USA
J. Malik, Univ. of California at Berkeley, Berkeley, CA, USA
pp. 3177-3184
K. A. Sidorov, Sch. of Comput. Sci., Cardiff Univ., Cardiff, UK
S. Richmond, Sch. of Dentistry, Cardiff Univ., Cardiff, UK
D. Marshall, Sch. of Comput. Sci., Cardiff Univ., Cardiff, UK
pp. 2401-2408
T. Muller, Daimler Res., Sindelfingen, Germany
J. Rannacher, Daimler Res., Sindelfingen, Germany
C. Rabe, Daimler Res., Sindelfingen, Germany
U. Franke, Daimler Res., Sindelfingen, Germany
pp. 1193-1200
F. Pirri, Dipt. di Inf. e Sist., Sapienza Univ. di Roma, Rome, Italy
M. Pizzoli, Dipt. di Inf. e Sist., Sapienza Univ. di Roma, Rome, Italy
A. Rudi, Dipt. di Inf. e Sist., Sapienza Univ. di Roma, Rome, Italy
pp. 921-928
J. Bruna, CMAP, Ecole Polytech., Palaiseau, France
S. Mallat, CMAP, Ecole Polytech., Palaiseau, France
pp. 1561-1566
L. Benoit, Ecole Normale Super., Paris, France
J. Mairal, INRIA, Paris, France
F. Bach, INRIA, Paris, France
J. Ponce, Ecole Normale Super., Paris, France
pp. 2913-2920
M. Brown, Sch. of Comput. & Commun. Sci., Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
S. Susstrunk, Sch. of Comput. & Commun. Sci., Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
pp. 177-184
Yin-Hsi Kuo, Nat. Taiwan Univ., Taipei, Taiwan
Hsuan-Tien Lin, Nat. Taiwan Univ., Taipei, Taiwan
Wen-Huang Cheng, Acad. Sinica, Taipei, Taiwan
Yi-Hsuan Yang, Nat. Taiwan Univ., Taipei, Taiwan
W. H. Hsu, Nat. Taiwan Univ., Taipei, Taiwan
pp. 905-912
Yinqiang Zheng, Dept. of Mech. & Control Eng., Tokyo Inst. of Technol., Tokyo, Japan
S. Sugimoto, Dept. of Mech. & Control Eng., Tokyo Inst. of Technol., Tokyo, Japan
M. Okutomi, Dept. of Mech. & Control Eng., Tokyo Inst. of Technol., Tokyo, Japan
pp. 1825-1832
A. Schwing, ETH Zurich, Zurich, Switzerland
T. Hazan, TTI Chicago, Chicago, IL, USA
M. Pollefeys, ETH Zurich, Zurich, Switzerland
R. Urtasun, TTI Chicago, Chicago, IL, USA
pp. 1833-1840
Jun Wang, Key Lab. of Machine Perception (Minist. of Educ.), Peking Univ., Beijing, China
Ying Tan, Key Lab. of Machine Perception (Minist. of Educ.), Peking Univ., Beijing, China
pp. 1625-1632
Taesup Kim, Dept. of Electr. Eng., KAIST, Daejeon, South Korea
S. Nowozin, Microsoft Res. Cambridge, Cambridge, UK
P. Kohli, Microsoft Res. Cambridge, Cambridge, UK
C. D. Yoo, Dept. of Electr. Eng., KAIST, Daejeon, South Korea
pp. 1913-1920
A. Shyr, UC Berkeley, Berkeley, CA, USA
T. Darrell, ICSI, UC Berkeley, Berkeley, CA, USA
M. Jordan, UC Berkeley, Berkeley, CA, USA
R. Urtasun, TTI Chicago, Chicago, IL, USA
pp. 2281-2288
Yuelei Xie, Inst. of Comput. Technol., Chinese Acad. of Sci. (CAS), China
Hong Chang, Inst. of Comput. Technol., Chinese Acad. of Sci. (CAS), China
Zhe Li, Inst. of Comput. Technol., Chinese Acad. of Sci. (CAS), China
Luhong Liang, Inst. of Comput. Technol., Chinese Acad. of Sci. (CAS), China
Xilin Chen, Inst. of Comput. Technol., Chinese Acad. of Sci. (CAS), China
Debin Zhao, Sch. of Comput. Sci. & Technol., Harbin Inst. of Technol., Harbin, China
pp. 25-32
P. S. Li, Univ. of Toronto, Toronto, ON, Canada
I. E. Givoni, Univ. of Toronto, Toronto, ON, Canada
B. J. Frey, Univ. of Toronto, Toronto, ON, Canada
pp. 2721-2728
Yingying Zhu, Univ. of Queensland, Brisbane, QLD, Australia
pp. 1-8
B. Ng, Univ. of British Columbia, Vancouver, WA, USA
R. Abugharbieh, Univ. of British Columbia, Vancouver, WA, USA
pp. 1065-1071
Bogdan Savchynskyy, HCI, Heidelberg Univ., Heidelberg, Germany
Stefan Schmidt, HCI, Heidelberg Univ., Heidelberg, Germany
Jorg Kappes, IPA, Heidelberg Univ., Heidelberg, Germany
C. Schnorr, HCI, Heidelberg Univ., Heidelberg, Germany
pp. 1817-1823
U. Schmidt, Dept. of Comput. Sci., Tech. Univ. Darmstadt, Darmstadt, Germany
K. Schelten, Dept. of Comput. Sci., Tech. Univ. Darmstadt, Darmstadt, Germany
S. Roth, Dept. of Comput. Sci., Tech. Univ. Darmstadt, Darmstadt, Germany
pp. 2625-2632
R. Tron, Center for Imaging Sci., Johns Hopkins Univ., Baltimore, MD, USA
R. Vidal, Center for Imaging Sci., Johns Hopkins Univ., Baltimore, MD, USA
pp. 57-63
Yongzhen Huang, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
Kaiqi Huang, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
Chong Wang, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
Tieniu Tan, Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
pp. 1649-1656