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2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (2005)
San Diego, CA, USA
Sept. 21, 2005 to Sept. 23, 2005
ISBN: 0-7695-2372-2
TABLE OF CONTENTS
Introduction
Aims & Scope (PDF)
pp. ix
Sponsors (PDF)
pp. xiv
Empirical Evaluation Methods in Computer Vision
Introduction
pp. xxxii
pp. xxxviii
Ear Biometrics Session
Introduction
Face Recognition Grand Challenge Experiments
38 ms
(Ver 2.0)

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