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2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'04) - Volume 1
Washington, D.C., USA
June 27-July 02
ISBN: 0-7695-2158-4
Table of Contents
Poster Session 1: Calibration/Stereo
Vaibhav Vaish, Stanford University
Bennett Wilburn, Stanford University
Neel Joshi, Stanford University
Marc Levoy, Stanford University
pp. 2-9
Zheng Zhang, National University of Singapore
Chew Lim Tan, National University of Singapore
Liying Fan, National University of Singapore
pp. 10-15
Xiaoye Lu, University of California at Santa Cruz
Roberto Manduchi, University of California at Santa Cruz
pp. 16-23
Toon Goedemé, University of Leuven
Tinne Tuytelaars, University of Leuven
Luc Van Gool, ETH Z?urich
pp. 24-29
Matthew Brand, Mitsubishi Electric Research Labs
Kongbin Kang, Brown University
David B. Cooper, Brown University
pp. 30-35
Hailin Jin, University of California at Los Angeles
Daniel Cremers, University of California at Los Angeles
Anthony J. Yezzi, Georgia Institute of Technology
Stefano Soatto, University of California at Los Angeles
pp. 36-42
Ariel Tankus, Tel-Aviv University
Nir Sochen, Tel-Aviv University
Yehezkel Yeshurun, Tel-Aviv University
pp. 43-49
Branislav Mičušík, Czech Technical University in Prague
Tomáš Pajdla, Czech Technical University in Prague
pp. 58-65
Motilal Agrawal, SRI International
Larry S. Davis, University of Maryland at College Park
pp. 66-73
Li Hong, STMicroelectronics, Inc.
George Chen, STMicroelectronics, Inc.
pp. 74-81
Takeshi Takai, Kyoto University
Koichiro Niinuma, Kyoto University
Atsuto Maki, Kyoto University
Takashi Matsuyama, Kyoto University
pp. 98-105
Yichen Wei, Hong Kong University of Science and Technology
Long Quan, Hong Kong University of Science and Technology
pp. 106-113
Y. Wexler, Weizmann Institute of Science
E. Shechtman, Weizmann Institute of Science
M. Irani, Weizmann Institute of Science
pp. 120-127
Yanghai Tsin, Siemens Corporate Research
Takeo Kanade, Carnegie Mellon University
pp. 135-142
Song Wang, University of South Carolina
Toshiro Kubota, University of South Carolina
Theodor Richardson, University of South Carolina
pp. 143-150
Andreas Klaus, VRVis Research Center
Joachim Bauer, VRVis Research Center
Konrad Karner, VRVis Research Center
Pierre Elbischger, Institute for Computer Graphics and Vision
Roland Perko, Institute for Computer Graphics and Vision
Horst Bischof, Institute for Computer Graphics and Vision
pp. 151-157
Zsolt Jankó, Hungarian Academy of Sciences
Ondřej Drbohlav, Czech Technical University
Radim Šára, Czech Technical University
pp. 166-171
Gozde Unal, Siemens Corporate Research
Anthony Yezzi, Georgia Institute of Technology
pp. 172-178
Manik Varma, University of Oxford
Andrew Zisserman, University of Oxford
pp. 179-186
Ali Rahimi, Massachusetts Institute of Technology
Brian Dunagan, Massachusetts Institute of Technology
Trevor Darrell, Massachusetts Institute of Technology
pp. 187-194
Sudipta N. Sinha, University of North Carolina at Chapel Hill
Marc Pollefeys, University of North Carolina at Chapel Hill
Leonard McMillan, University of North Carolina at Chapel Hill
pp. 195-202
Poster Session 2: Low Level Vision
Nebojsa Jojic, Microsoft Research
Yaron Caspi, Hebrew University of Jerusalem
pp. 212-219
Kristen Grauman, Massachusetts Institute of Technology
Trevor Darrell, Massachusetts Institute of Technology
pp. 220-227
Yau-Chat Tsoi, Hong Kong University of Science and Technology
Michael S. Brown, Hong Kong University of Science and Technology
pp. 240-246
Stella X. Yu, University of California at Berkeley
pp. 247-254
Hong Chang, Hong Kong University of Science and Technology
Dit-Yan Yeung, Hong Kong University of Science and Technology
Yimin Xiong, Hong Kong University of Science and Technology
pp. 275-282
Shai Avidan, Mitsubishi Electric Research Labs
pp. 283-290
Song Wang, University of South Carolina
Jun Wang, University of South Carolina
Toshiro Kubota, University of South Carolina
pp. 291-298
Anat Levin, Hebrew University of Jerusalem
Assaf Zomet, Hebrew University of Jerusalem
Yair Weiss, Hebrew University of Jerusalem
pp. 306-313
Qing Yang, Institute of Automation
Bahram Parvin, Lawrence Berkeley National Laboratory
pp. 320-325
Franck Galpin, Tohoku University
Raphaèle Balter, IRISA INRIA-University of Rennes and France-Telecom R&D
Luce Morin, IRISA INRIA-University of Rennes
Koichiro Deguchi, Tohoku University
pp. 334-341
Bastian Goldluecke, Max-Planck-Institut für Informatik
Marcus Magnor, Max-Planck-Institut für Informatik
pp. 350-355
M. Garbey, University of Houston
A. Merla, University of Houston
I. Pavlidis, University of Houston
pp. 356-363
Jiaya Jia, Hong Kong University of Science and Technology
Tai-Pang Wu, Hong Kong University of Science and Technology
Yu-Wing Tai, Hong Kong University of Science and Technology
Chi-Keung Tang, Hong Kong University of Science and Technology
pp. 364-371
Kang Li, University of Iowa
Xiaodong Wu, University of Texas — Pan American
Danny Z. Chen, University of Notre Dame
Milan Sonka, University of Iowa
pp. 394-399
Anthony Lobay, University of California at Berkeley
D.A. Forsyth, University of California at Berkeley
pp. 400-406
Leonid Sigal, Brown University
Sidharth Bhatia, Brown University
Stefan Roth, Brown University
Michael J Black, Brown University
Michael Isard, Microsoft Research Silicon Valley
pp. 421-428
Subhadip Sarkar, University of California at Irvine
Glenn Healey, University of California at Irvine
pp. 429-434
Session 1A: Sensors
Shree K. Nayar, Columbia University
Vlad Branzoi, Columbia University
Terry E. Boult, University of Colorado
pp. 436-443
The World in an Eye (Abstract)
Ko Nishino, Columbia University
Shree K. Nayar, Columbia University
pp. 444-451
Session 1B: Low Level Vision - 1
Session 2A: Statistical Methods - 1
Xiaolei Huang, Rutgers University
Dimitris Metaxas, Rutgers University
Ting Chen, Rutgers University
pp. 496-503
Richard Hartley, National ICT Australia and Australian National University
Frederik Schaffalitzky, Australian National University and Oxford University
pp. 504-509
René Vidal, Johns Hopkins University
Yi Ma, University of Illinois at Urbana-Champaign
Jacopo Piazzi, Johns Hopkins University
pp. 510-517
Session 2B: Detection and Tracking - 1
Kshitiz Garg, Columbia University
Shree K. Nayar, Columbia University
pp. 528-535
Yoav Y. Schechner, Technion - Israel Institute of Technology
Nir Karpel, Technion - Israel Institute of Technology
pp. 536-543
Dirk Walther, California Institute of Technology
Duane R. Edgington, Monterey Bay Aquarium Research Institute
Christof Koch, California Institute of Technology
pp. 544-549
Session 3A: Calibration/Stereo
Christoph Strecha, University of Leuven
Rik Fransens, University of Leuven
Luc Van Gool, University of Leuven
pp. 552-559
Abhijit S. Ogale, University of Maryland at College Park
Yiannis Aloimonos, University of Maryland at College Park
pp. 568-573
Session 3B: Medical Applications
Christopher V. Alvino, Georgia Institute of Technology
Anthony J. Yezzi, Jr., Georgia Institute of Technology
pp. 576-581
Y. Chen, University of Florida
W. Guo, University of Florida
Q. Zeng, University of Florida
X. Yan, University of Florida
F. Huang, University of Florida
H. Zhang, University of Florida
G. He, University of Florida
B.C. Vemuri, University of Florida
Y. Liu, University of Florida
pp. 588-593
Kazunori Okada, Siemens Corporate Research, Inc.
Dorin Comaniciu, Siemens Corporate Research, Inc.
Arun Krishnan, Siemens Medical Solutions USA, Inc.
pp. 594-601
Poster Session 3: Motion
Anat Levin, Microsoft Research
Richard Szeliski, Microsoft Research
pp. 611-618
Paolo Favaro, University of California at Los Angeles
Stefano Soatto, University of California at Los Angeles
pp. 631-637
Bohyung Han, University of Maryland at College Park
Dorin Comaniciu, Siemens Corporate Research
Ying Zhu, Siemens Corporate Research
Larry Davis, University of Maryland at College Park
pp. 638-644
Seon Joo Kim, University of North Carolina
Marc Pollefeys, University of North Carolina
pp. 645-651
Visual Odometry (Abstract)
David Nistér, Sarnoff Corporation
Oleg Naroditsky, Sarnoff Corporation
James Bergen, Sarnoff Corporation
pp. 652-659
Marc Niethammer, Georgia Institute of Technology
Allen Tannenbaum, Georgia Institute of Technology
pp. 660-667
Jing Xiao, Carnegie Mellon University
Takeo Kanade, Carnegie Mellon University
pp. 668-675
Weichaun Yu, Yale University
Ping Yan, Yale University
Albert Sinusas, Yale University
Karl Thiele, Philips Medical Systems
James S. Duncan, Yale University
pp. 676-683
Roberto Marzotto, Università degli Studi di Verona
Andrea Fusiello, Università degli Studi di Verona
Vittorio Murino, Università degli Studi di Verona
pp. 692-698
Amit Gruber, Hebrew University of Jerusalem
Yair Weiss, Hebrew University of Jerusalem
pp. 707-714
Ashok Veeraraghavan, University of Maryland at College Park
Amit Roy Chowdhury, University of California at Riverside
Rama Chellappa, University of Maryland at College Park
pp. 730-737
Hao Jiang, Simon Fraser University
Ze-Nian Li, Simon Fraser University
Mark S. Drew, Simon Fraser University
pp. 738-745
Rodrigo L. Carceroni, Universidade Federal de Minas Gerais
Flávio L. C. Pádua, Universidade Federal de Minas Gerais
Geraldo A. M. R. Santos, Universidade Federal de Minas Gerais
Kiriakos N. Kutulakos, University of Toronto
pp. 746-753
Adrian Barbu, University of California at Los Angeles
Alan Yuille, University of California at Los Angeles
pp. 754-761
Tinne Tuytelaars, University of Leuven
Luc Van Gool, University of Leuven and ETH
pp. 762-768
Richard Hartley, Australian National University and National ICT Australia
René Vidal, National ICT Australia and Johns Hopkins University
pp. 769-775
Zhimin Fan, Tsinghua University
Jie Zhou, Tsinghua University
Ying Wu, Northwestern University
pp. 776-781
Jeffrey Ho, University of California at San Diego
Kuang-Chih Lee, University of Illinois at Urbana-Champaign
Ming-Hsuan Yang, Honda Research Institute
David Kriegman, University of California at San Diego
pp. 782-789
Gregory D. Hager, Johns Hopkins University
Maneesh Dewan, Johns Hopkins University
Charles V. Stewart, Renssalaer Polytechnic Institute
pp. 790-797
Zoran Zivkovic, University of Amsterdam
Ben Kröse, University of Amsterdam
pp. 798-803
K. E. Ozden, K.U. Leuven
K. Cornelis, K.U. Leuven
L. Van Eycken, K.U. Leuven
L. Van Gool, K.U. Leuven and ETH
pp. 819-825
Gang Hua, Northwestern University
Ying Wu, Northwestern University
pp. 826-833
Ting Yu, Northwestern University
Ying Wu, Northwestern University
pp. 834-841
Hui Zhang, University of Pennsylvania
Paul A. Yushkevich, University of Pennsylvania
James C. Gee, University of Pennsylvania
pp. 842-847
Jie Zhang, University of Florida
Anand Rangarajan, University of Florida
pp. 848-855
Yizhou Wang, University of California at Los Angeles
Song Chun Zhu, University of California at Los Angeles
pp. 856-863
Mei Han, NEC Laboratories America
Wei Xu, NEC Laboratories America
Hai Tao, University of California at Santa Cruz
Yihong Gong, NEC Laboratories America
pp. 864-871
X. S. Zhou, Siemens Corporate Research, Inc.
D. Comaniciu, Siemens Corporate Research, Inc.
B. Xie, Siemens Corporate Research, Inc.
R. Cruceanu, Siemens Corporate Research, Inc.
A. Gupta, Siemens Medical Solutions USA, Inc.
pp. 872-879
Siome Goldenstein, IC-Unicamp
Christian Vogler, Gallaudet University
Dimitris Metaxas, Rutgers University
pp. 880-885
Stefan Roth, Brown University
Leonid Sigal, Brown University
Michael J. Black, Brown University
pp. 886-893
N. Krahnstoever, GE Research
R. Sharma, GE Research
pp. 894-901
Author Index
Author Index (PDF)
pp. 903-909
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