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Fourth IEEE Workshop on Automatic Identification Advanced Technologies (AutoID'05)
Buffalo, New York
October 17-October 18
ISBN: 0-7695-2475-3
Table of Contents
Introduction
Session IV: Posters
X. Chen, Dept. of Comput. Sci. & Eng., Notre Dame Univ., Notre Dame, IN, USA
P.J. Flynn, Dept. of Comput. Sci. & Eng., Notre Dame Univ., Notre Dame, IN, USA
K.W. Bowyer, Dept. of Comput. Sci. & Eng., Notre Dame Univ., Notre Dame, IN, USA
pp. 106,107,108,109,110,111
Session I: Biometrics
Sarat C. Dass, Michigan State University
Yongfang Zhu, Michigan State University
Anil K. Jain, Michigan State University
pp. 3-9
R. M. Bolle, IBM Thomas J. Watson Research Center
J. H. Connell, IBM Thomas J. Watson Research Center
S. Pankanti, IBM Thomas J. Watson Research Center
N. K. Ratha, IBM Thomas J. Watson Research Center
A. W. Senior, IBM Thomas J. Watson Research Center
pp. 15-20
T. A. M. Kevenaar, Philips Research
G. J. Schrijen, Philips Research
M. van der Veen, Philips Research
A. H. M. Akkermans, Philips Research
F. Zuo, Technical University Eindhoven
pp. 21-26
Yip Wai Kuan, Multimedia University and Corentix Technologies
Alwyn Goh, Corentix Technologies
David Ngo, Multimedia University and Corentix Technologies
Andrew Teoh, Multimedia University and Corentix Technologies
pp. 27-32
Session II: RFID — I
Vijay Pillai, Intermec Technologies
Rene Martinez, Intermec Technologies
John Bleichner, Intermec Technologies
Katherine Elliot, Intermec Technologies
Shashi Ramamurthy, Intermec Technologies
K. V. S. Rao, Intermec Technologies
pp. 35-38
K. V. S. Rao, Intermec Technologies Corporation
Pavel V. Nikitin, Intermec Technologies Corporation
Sander F. Lam, Intermec Technologies Corporation
pp. 39-42
Session III: Face Modality
Richa Singh, West Virginia University
Mayank Vatsa, West Virginia University
Arun Ross, West Virginia University
Afzel Noore, West Virginia University
pp. 63-68
Feng Yang, University of Electronic Science and Technology of China
Zheng Ma, University of Electronic Science and Technology of China
pp. 89-94
Vijay Pillai, Intermec Technologies
James Peternel, Intermec Technologies
Harley Heinrich, Intermec Technologies
Rene Martinez, Intermec Technologies
K. V. S. Rao, Intermec Technologies
pp. 101-105
Ningping Fan, Siemens Corporate Research
Justinian Rosca, Siemens Corporate Research
Radu Balan, Siemens Corporate Research
pp. 112-117
Jinqing Qi, Tokyo Institute of Technology
Desiree Abdurrachim, Tokyo Institute of Technology
Dongju Li, Tokyo Institute of Technology
Hiroaki Kunieda, Tokyo Institute of Technology
pp. 124-129
Pan Lili, University of Electronic Science and Technology of China
Xie Mei, University of Electronic Science and Technology of China
pp. 134-138
Shamalee Deshpande, University at Buffalo
Sharat Chikkerur, University at Buffalo
Venu Govindaraju, University at Buffalo
pp. 139-143
Guilherme Boreki, Centro Universit?rio Positivo - Curitiba
Alessandro Zimmer, Centro Universit?rio Positivo - Curitiba
pp. 149-154
Nanfei Sun, IBM T.J.Watson Research Center
Norman Haas, IBM T.J.Watson Research Center
Jonathan H. Connell, IBM T.J.Watson Research Center
Sharath Pankanti, IBM T.J.Watson Research Center
pp. 160-165
Dongjae Lee, Samsung Electronics Co., Ltd
Wonchurl Jang, Samsung Electronics Co., Ltd
Doeksoo Park, Samsung Electronics Co., Ltd
Sung-Jae Kim, Samsung Electronics Co., Ltd
Jaihie Kim, Yonsei University
pp. 166-170
Lee Middleton, University of Southampton
Alex A. Buss, University of Southampton
Alex Bazin, University of Southampton
Mark S. Nixon, University of Southampton
pp. 171-176
Session VI: RFID — II
V. Natarajan, State University of New York at Buffalo
A. Balasubramanian, CompSys Technologies Inc.
S. Mishra, CompSys Technologies Inc.
R. Sridhar, State University of New York at Buffalo
pp. 181-186
Gerardo Barroeta Perez, Massachusetts Institute of Technology
Mateusz Malinowski, Massachusetts Institute of Technology
Joseph A. Paradiso, Massachusetts Institute of Technology
pp. 187-192
Session VII: Mixed Modalities — I
Sharat Chikkerur, State University of New York at Buffalo
Nalini Ratha, IBM T. J. Watson Research Center
pp. 207-212
Sylvain Hocquet, Université François-Rabelais de Tours
Jean-Yves Ramel, Université François-Rabelais de Tours
Hubert Cardot, Université François-Rabelais de Tours
pp. 224-229
M. Wirotius, Universit? de Tours and AtosOrigin
J. Y. Ramel, Universit? de Tours
N. Vincent, Universit? Paris 5
pp. 230-235
Session VIII: Mixed Modalities — II
Author Index
Author Index (PDF)
pp. 263-264
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