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Proceedings. Fourth IEEE Workshop on Automatic Identification Advanced Technologies (2005)
Buffalo, NY, USA
Oct. 17, 2005 to Oct. 18, 2005
ISBN: 0-7695-2475-3
TABLE OF CONTENTS
Session IV: Posters
pp. 118,119,120,121,122,123
Preface (PDF)
pp. ix
Introduction
Preface (PDF)
pp. ix
Session I: Biometrics
Sarat C. Dass , Michigan State University
Yongfang Zhu , Michigan State University
Anil K. Jain , Michigan State University
pp. 3-9
Douglas J. Buettner , The Aerospace Corporation
Nicholas M. Orlans , The MITRE Corporation
pp. 10-14
R. M. Bolle , IBM Thomas J. Watson Research Center
J. H. Connell , IBM Thomas J. Watson Research Center
S. Pankanti , IBM Thomas J. Watson Research Center
N. K. Ratha , IBM Thomas J. Watson Research Center
A. W. Senior , IBM Thomas J. Watson Research Center
pp. 15-20
T. A. M. Kevenaar , Philips Research
G. J. Schrijen , Philips Research
M. van der Veen , Philips Research
A. H. M. Akkermans , Philips Research
F. Zuo , Technical University Eindhoven
pp. 21-26
Yip Wai Kuan , Multimedia University and Corentix Technologies
Alwyn Goh , Corentix Technologies
David Ngo , Multimedia University and Corentix Technologies
Andrew Teoh , Multimedia University and Corentix Technologies
pp. 27-32
Session II: RFID — I
Vijay Pillai , Intermec Technologies
Rene Martinez , Intermec Technologies
John Bleichner , Intermec Technologies
Katherine Elliot , Intermec Technologies
Shashi Ramamurthy , Intermec Technologies
K. V. S. Rao , Intermec Technologies
pp. 35-38
K. V. S. Rao , Intermec Technologies Corporation
Pavel V. Nikitin , Intermec Technologies Corporation
Sander F. Lam , Intermec Technologies Corporation
pp. 39-42
Session III: Face Modality
Karthik Sridharan , University at Buffalo
Venu Govindaraju , University at Buffalo
pp. 51-56
Chee Kiat Ng , Carnegie Mellon University
Marios Savvides , Carnegie Mellon University
Pradeep K. Khosla , Carnegie Mellon University
pp. 57-62
Richa Singh , West Virginia University
Mayank Vatsa , West Virginia University
Arun Ross , West Virginia University
Afzel Noore , West Virginia University
pp. 63-68
K. Kollreider , Halmstad University
H. Fronthaler , Halmstad University
J. Bigun , Halmstad University
pp. 75-80
Session IV: Posters
Leonid Bolotnyy , University of Virginia
Gabriel Robins , University of Virginia
pp. 83-88
Feng Yang , University of Electronic Science and Technology of China
Zheng Ma , University of Electronic Science and Technology of China
pp. 89-94
Jinfang Wang , Jilin University
Jinbao Wang , Northeast Normal University
pp. 95-100
Vijay Pillai , Intermec Technologies
James Peternel , Intermec Technologies
Harley Heinrich , Intermec Technologies
Rene Martinez , Intermec Technologies
K. V. S. Rao , Intermec Technologies
pp. 101-105
Ningping Fan , Siemens Corporate Research
Justinian Rosca , Siemens Corporate Research
Radu Balan , Siemens Corporate Research
pp. 112-117
Jinqing Qi , Tokyo Institute of Technology
Desiree Abdurrachim , Tokyo Institute of Technology
Dongju Li , Tokyo Institute of Technology
Hiroaki Kunieda , Tokyo Institute of Technology
pp. 124-129
Pan Lili , University of Electronic Science and Technology of China
Xie Mei , University of Electronic Science and Technology of China
pp. 134-138
Shamalee Deshpande , University at Buffalo
Sharat Chikkerur , University at Buffalo
Venu Govindaraju , University at Buffalo
pp. 139-143
Harin Sellahewa , University of Buckingham
Sabah Jassim , University of Buckingham
pp. 144-148
Guilherme Boreki , Centro Universit?rio Positivo - Curitiba
Alessandro Zimmer , Centro Universit?rio Positivo - Curitiba
pp. 149-154
Ramzi Abiantun , Carnegie Mellon University
Marios Savvides , Carnegie Mellon University
Pradeep K. Khosla , Carnegie Mellon University
pp. 155-159
Nanfei Sun , IBM T.J.Watson Research Center
Norman Haas , IBM T.J.Watson Research Center
Jonathan H. Connell , IBM T.J.Watson Research Center
Sharath Pankanti , IBM T.J.Watson Research Center
pp. 160-165
Dongjae Lee , Samsung Electronics Co., Ltd
Wonchurl Jang , Samsung Electronics Co., Ltd
Doeksoo Park , Samsung Electronics Co., Ltd
Sung-Jae Kim , Samsung Electronics Co., Ltd
Jaihie Kim , Yonsei University
pp. 166-170
Lee Middleton , University of Southampton
Alex A. Buss , University of Southampton
Alex Bazin , University of Southampton
Mark S. Nixon , University of Southampton
pp. 171-176
Session VI: RFID — II
V. Natarajan , State University of New York at Buffalo
A. Balasubramanian , CompSys Technologies Inc.
S. Mishra , CompSys Technologies Inc.
R. Sridhar , State University of New York at Buffalo
pp. 181-186
Gerardo Barroeta Perez , Massachusetts Institute of Technology
Mateusz Malinowski , Massachusetts Institute of Technology
Joseph A. Paradiso , Massachusetts Institute of Technology
pp. 187-192
Rich Redemske , Massachusetts Institute of Technology
Rich Fletcher , TagSense, Inc.
pp. 193-198
Jianyun Hu , Fudan University
Hao Min , Fudan University
pp. 199-204
Session VII: Mixed Modalities — I
Sharat Chikkerur , State University of New York at Buffalo
Nalini Ratha , IBM T. J. Watson Research Center
pp. 207-212
Ping Yan , University of Notre Dame
Kevin W. Bowyer , University of Notre Dame
pp. 213-218
A. H. M. Akkermans , Philips Research
T. A. M. Kevenaar , Philips Research
D. W. E. Schobben , Philips Research
pp. 219-223
Sylvain Hocquet , Université François-Rabelais de Tours
Jean-Yves Ramel , Université François-Rabelais de Tours
Hubert Cardot , Université François-Rabelais de Tours
pp. 224-229
M. Wirotius , Universit? de Tours and AtosOrigin
J. Y. Ramel , Universit? de Tours
N. Vincent , Universit? Paris 5
pp. 230-235
Session VIII: Mixed Modalities — II
Aditya Abhyankar , Clarkson University
Lawrence Hornak , West Virginia University
Stephanie Schuckers , Clarkson University
pp. 239-244
Yan Ma , West Virginia University
Michael Schuckers , St. Lawrence University
Bojan Cukic , West Virginia University
pp. 251-256
Chunyan Xie , Carnegie Mellon University
B. V. K. Vijaya Kumar , Carnegie Mellon University
pp. 257-262
Author Index
Author Index (PDF)
pp. 263-264
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