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2012 IEEE 21st Asian Test Symposium (2012)
Niigata, Japan Japan
Nov. 19, 2012 to Nov. 22, 2012
ISBN: 978-1-4673-4555-2
TABLE OF CONTENTS
Papers
[Cover art] (PDF)
pp. C4
pp. i
pp. iii
pp. v-xii
Foreword (PDF)
pp. xii
pp. xiv-xv
Reviewers (PDF)
pp. xvi
pp. xvii
Tutorials (PDF)
pp. xviii-xix
Xinli Gu , Huawei Technologies, USA
pp. 67
Author index (PDF)
pp. 362-364
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