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2007 16th Asian Test Symposium (2007)
Beijing
Oct. 8, 2007 to Oct. 11, 2007
ISBN: 978-0-7695-2890-8
TABLE OF CONTENTS
Introduction
Foreword (PDF)
pp.
Introduction
pp. xvi
Session 1A: Opening Session
Jacob Abraham , University of Texas at Austin, USA
pp. 3
Kary Chien , Semiconductor Manufacturing International (Shanghai) Corp.,China
pp. 9
Session 2A: Fault Modeling and Functional Test
Abhijit Jas , Advanced Test Technology, Intel Corporation
Suriyaprakash Natarajan , Advanced Test Technology, Intel Corporation
Srinivas Patil , Advanced Test Technology, Intel Corporation
pp. 13-18
Weixin Wu , Virginia Tech, Blacksburg, VA
Michael S. Hsiao , Virginia Tech, Blacksburg, VA
pp. 19-24
Session 2B: Fault Diagnosis (I)
A. Rousset , Universit? Montpellier II / CNRS, Cedex, France
A. Bosio , Universit? Montpellier II / CNRS, Cedex, France
P. Girard , Universit? Montpellier II / CNRS, Cedex, France
C. Landrault , Universit? Montpellier II / CNRS, Cedex, France
S. Pravossoudovitch , Universit? Montpellier II / CNRS, Cedex, France
A. Virazel , Universit? Montpellier II / CNRS, Cedex, France
pp. 33-38
Hiroshi Takahashi , Ehime University
Yoshinobu Higami , Ehime University
Shuhei Kadoyama , Ehime University
Takashi Aikyo , Ehime University
Yuzo Takamatsu , Ehime University
pp. 39-44
Ruifeng Guo , Mentor Graphics Corp. Wilsonville, OR 97070 USA
Yu Huang , Mentor Graphics Corp. Wilsonville, OR 97070 USA
Wu-Tung Cheng , Mentor Graphics Corp. Wilsonville, OR 97070 USA
pp. 45-52
Session 2C: Panel Session
Jacob Abraham , Univ. of Texas, Austin, USA
Salvador Mir , TIMA, France
Yinghua Min , Chinese Academy of Sciences, China
Jeremy Wang , Fabless Semiconductor Association, Asia Pacific
Cheng-Wen Wu , National TsingHua University, Taiwan
pp. 53
Session 3A: Delay Test (I)
Shahdad Irajpour , University of Southern California, Los Angeles, CA
Sandeep K. Gupta , University of Southern California, Los Angeles, CA
Melvin A. Breuer , University of Southern California, Los Angeles, CA
pp. 57-64
Yuki Yoshikawa , Hiroshima City University
Satoshi Ohtake , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 65-68
Brion Keller , Cadence Design Systems, Inc., Endicott, New York
Anis Uzzaman , Cadence Design Systems, Inc., Endicott, New York
Bibo Li , Cadence Design Systems, Inc., Endicott, New York
Tom Snethen , Cadence Design Systems, Inc., Endicott, New York
pp. 69-72
Elham K. Moghaddam , Sharif University of Technology, Tehran, IRAN
Shaahin Hessabi , Sharif University of Technology, Tehran, IRAN
pp. 73-78
Session 3B: Test Compression
Seongmoon Wang , NEC Labs. America, Princeton, NJ 08540, USA
Wenlong Wei , NEC Labs. America, Princeton, NJ 08540, USA
Srimat T. Chakradhar , NEC Labs. America, Princeton, NJ 08540, USA
pp. 79-86
Hideyuki Ichihara , Hiroshima City University
Yukinori Setohara , Hiroshima City University
Yusuke Nakashima , Hiroshima City University
Tomoo Inoue , Hiroshima City University
pp. 87-90
Aiman H. El-Maleh , King Fahd University of Petroleum & Minerals, Dhahran 31261, Saudi Arabia
Mustafa Imran Ali , King Fahd University of Petroleum & Minerals, Dhahran 31261, Saudi Arabia
Ahmad A. Al-Yamani , King Fahd University of Petroleum & Minerals, Dhahran 31261, Saudi Arabia
pp. 91-94
Sying-Jyan Wang , National Chung Hsing University, Taichung, Taiwan
Po-Chang Tsai , National Chung Hsing University, Taichung, Taiwan
Hung-Ming Weng , National Chung Hsing University, Taichung, Taiwan
Katherine Shu-Min Li , NNational Sun Yat-Sen University, Taiwan
pp. 95-100
Session 3C: Power Aware Test (I)
Urban Ingelsson , University of Southampton, UK
Paul Rosinger , University of Southampton, UK
S. Saqib Khursheed , University of Southampton, UK
Bashir M. Al-Hashimi , University of Southampton, UK
Peter Harrod , ARM Limited, Cambridge UK
pp. 101-106
Dan Zhao , University at Louisiana at Lafayette, USA
Ronghua Huang , University at Louisiana at Lafayette, USA
Hideo Fujiwara , Nara Institute of Science and Technology, Japan
pp. 107-110
Meng-Fan Wu , National Taiwan University, Taipei 106, Taiwan
Kai-Shun Hu , National Taiwan University, Taipei 106, Taiwan
Jiun-Lang Huang , National Taiwan University, Taipei 106, Taiwan
pp. 111-114
Sunghoon Chun , Yonsei University
Yongjoon Kim , Yonsei University
Sungho Kang , Yonsei University
pp. 115-120
Session 4A: DFT (I)
Yu Huang , Mentor Graphics Corporation, 8005 S.W. Boeckman Road, Wilsonville, OR 97070, USA
Nilanjan Mukherjee , Mentor Graphics Corporation, 8005 S.W. Boeckman Road, Wilsonville, OR 97070, USA
Wu-Tung Cheng , Mentor Graphics Corporation, 8005 S.W. Boeckman Road, Wilsonville, OR 97070, USA
Greg Aldrich , Mentor Graphics Corporation, 8005 S.W. Boeckman Road, Wilsonville, OR 97070, USA
pp. 121-124
Hafizur Rahaman , University, Howrah 711 103, India
Dipak K. Kole Dipak K. Kole , University, Howrah 711 103, India
Debesh K. Das , University, Howrah 711 103, India
Bhargab B. Bhattacharya , ACM Unit, Indian Statistical Institute, Kolkata
pp. 125-128
Sying-Jyan Wang , National Chung Hsing University, Taiwan
Xin-Long Li , National Chung Hsing University, Taiwan
Katherine Shu-Min Li , National Sun Yat-Sen University, Taiwan
pp. 129-134
Session 4B: RF Test
Hung-kai Chen , National Chiao Tung University, Hsinchu, 300, Taiwan
Chauchin Su , National Chiao Tung University, Hsinchu, 300, Taiwan
pp. 135-138
Hsieh-Hung Hsieh , National Taiwan University, Taipei, R.O.C.
Yen-Chih Huang , National Taiwan University, Taipei, R.O.C.
Liang-Hung Lu , National Taiwan University, Taipei, R.O.C.
Guo-Wei Huang , National Nano Device Laboratories, Hsinchu, R.O.C.
pp. 143-148
Session 4C: Software Test
Qian Feng-an , Tongji University, Shanghai 201804,China
Jiang Jian-hui , Tongji University, Shanghai 201804,China
pp. 149-154
Monalisa Sarma , Indian Institute of Technology Kharagpur, West Bengal - 721302, India
Rajib Mall , Indian Institute of Technology Kharagpur, West Bengal - 721302, India
pp. 155-158
Shiyi Xu , Shanghai University, Shanghai 200072, CHINA
pp. 159-164
Session 5A: Design Verification
Haihua Shen , Chinese Academy of Sciences, Beijing, China
Heng Zhang , Chinese Academy of Sciences, Beijing, China
pp. 165-171
Majid Nabi , Tehran University
Hamid Shojaei , Tehran University
Siamak Mohammadi , Tehran University
pp. 172-177
Xiaoqing Yang , Tsinghua University, Beijing, China
Jinian Bian , Tsinghua University, Beijing, China
Shujun Deng , Tsinghua University, Beijing, China
Yanni Zhao , Tsinghua University, Beijing, China
pp. 178-186
Session 5B: SOC Test
Thomas Edison Yu , Nara Institute of Science and Technology, Japan
Tomokazu Yoneda , Nara Institute of Science and Technology, Japan
Krishnendu Chakrabarty , Duke University
Hideo Fujiwara , Duke University
pp. 187-192
Jaehoon Song , Hanyang University, Korea
Juhee Han , Hanyang University, Korea
Dooyoung Kim , Hanyang University, Korea
Hyunbean Yi , Hanyang University, Korea
Sungju Park , Hanyang University, Korea
pp. 193-198
Tomokazu Yoneda , Nara Institute of Science and Technology
Yuusuke Fukuda , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 199-206
Session 5C: Panel Session
Session 6A: Industry Session
Yu Wei P?ng , Marvell Semiconductor
Moo Kit Lee , Marvell Semiconductor
Peng Weng Ng , Marvell Semiconductor
Chin Hu Ong , Marvell Semiconductor
pp. 211
Brion Keller , Cadence Design Systems, Inc., Endicott, New York 13850, USA
Tom Jackson , Cadence Design Systems, Inc., Endicott, New York 13850, USA
Anis Uzzaman , Cadence Design Systems, Inc., Endicott, New York 13850, USA
pp. 213
Shawn Molavi , Broadcom Corporation, Irvine, CA
Toby McPheeters , Broadcom Corporation, Santa Clara, CA
pp. 214
Wu Yang , Mentor Graphics, 8005 SW Boeckman Road, Wilsonville, OR, USA
Wu-Tung Cheng , Mentor Graphics, 8005 SW Boeckman Road, Wilsonville, OR, USA
Yu Huang , Mentor Graphics, 8005 SW Boeckman Road, Wilsonville, OR, USA
Martin Keim , Mentor Graphics, 8005 SW Boeckman Road, Wilsonville, OR, USA
Randy Klingenberg , Mentor Graphics, 8005 SW Boeckman Road, Wilsonville, OR, USA
pp. 215
Session 6B: Analog Test
Nai-Chen Daniel Cheng , Industrial Technology Research Institute, Hsinchu, Taiwan
Yu Lee , Industrial Technology Research Institute, Hsinchu, Taiwan
Ji-Jan Chen , Industrial Technology Research Institute, Hsinchu, Taiwan
pp. 219-223
Dongwoo Hong , University of California, Santa Barbara, CA
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara, CA
pp. 224-229
Xinsong Zhang , University of Arkansas, Fayetteville
Simon S. Ang , University of Arkansas, Fayetteville
Chandra Carter , Texas Instruments Inc., Dallas, Texas, 75243 USA
pp. 230-238
Session 6C: Power Aware Test (II)
F. Azais , LIRMM, CNRS/University of Montpellier, 161 rue Ada - 34392 Montpellier Cedex 5 - France
L. Larguier , LIRMM, CNRS/University of Montpellier, 161 rue Ada - 34392 Montpellier Cedex 5 - France
M. Renovell , LIRMM, CNRS/University of Montpellier, 161 rue Ada - 34392 Montpellier Cedex 5 - France
pp. 239-244
Chunsheng Liu , University of Nebraska-Lincoln
Yang Wu , University of Nebraska-Lincoln
Yu Huang , Mentor Graphics
pp. 245-250
Krishna Chakravadhanula , Cadence Design Systems
Nitin Parimi , Cadence Design Systems
Brian Foutz , Cadence Design Systems
Bing Li , Cadence Design Systems
Vivek Chickermane , Cadence Design Systems
pp. 251-258
Session 7A: Test Generation (I)
Minjin Zhang , Chinese Academy of Sciences, Beijing, China
Xiaowei Li , Chinese Academy of Sciences, Beijing, China
pp. 259-264
Stefan Spinner , Albert-Ludwigs-University, Germany
Jie Jiang , Albert-Ludwigs-University, Germany
Ilia Polian , Albert-Ludwigs-University, Germany
Piet Engelke , Albert-Ludwigs-University, Germany
Bernd Becker , Albert-Ludwigs-University, Germany
pp. 265-270
Yoshinobu Higami , Ehime University
Kewal K. Saluja , Ehime University
Hiroshi Takahashi , Ehime University
Shin-ya Kobayashi , Ehime University
Yuzo Takamatsu , Ehime University
pp. 271-274
Toshinori Hosokawa , Nihon University
Ryoichi Inoue , Nihon University
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 275-280
Session 7B: Fault Diagnosis (II)
Huaxing Tang , Mentor Graphics Corporation, 8005 S.W. Boeckman Road, Wilsonville, Oregon, USA
Chen Liu , University of Iowa
Wu-Tung Cheng , Mentor Graphics Corporation, 8005 S.W. Boeckman Road, Wilsonville, Oregon, USA
Sudahkar M. Reddy , University of Iowa, Iowa City, Iowa
Wei Zou , Mentor Graphics Corporation, 8005 S.W. Boeckman Road, Wilsonville, Oregon, USA
pp. 281-287
Feijun Zheng , Zhejiang University
Kwang-Ting Cheng , University of California at Santa Barbara
Xiaolang Yan , Zhejiang University, Hangzhou
John Moondanos , Intel Corporation
Ziyad Hanna , Intel Corporation
pp. 288-294
Yu Huang , Mentor Graphics Corp.
Xijiang Lin , Mentor Graphics Corp.
pp. 295-300
Irith Pomeranz , Purdue University
Sudhakar M. Reddy , University of Iowa
pp. 301-306
Session 7C: Soft Error Issue
Shijian Zhang , Chinese Academy of Sciences, Beijing 100080, P.R.China
Weiwu Hu , Chinese Academy of Sciences, Beijing 100080, P.R.China
pp. 313-318
Ramashis Das , University of Michigan
John P. Hayes , University of Michigan
pp. 319-322
Shaohua Lei , Chinese Academy of Sciences, Beijing
Yinhe Han , Chinese Academy of Sciences, Beijing
Xiaowei Li , Chinese Academy of Sciences, Beijing
pp. 323-328
Session 8A: DFT (II)
Gefu Xu , Auburn University, AL, USA
Adit D. Singh , Auburn University, AL, USA
pp. 335-340
Xiao-Xin FAN , Graduate School of Chinese Academy of Sciences, Beijing
Yu HU , Chinese Academy of Sciences
Laung-Terng (L.-T.) WANG , SynTest Technologies, Inc., 505 S. Pastoria Ave., Suite 101, CA
pp. 341-348
Session 8B: Memory Test (I)
Li-Ming Denq , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 349-354
Hsiang-Huang Wu , Realtek Semiconductor Corp., Hsinchu, Taiwan
Jin-Fu Li , National Central University, Jhongli, Taiwan
Chi-Feng Wu , Realtek Semiconductor Corp., Hsinchu, Taiwan
Cheng-Wen Wu , National Tsing Hua University, Hsinchu, Taiwan
pp. 355-360
Session 8C: Panel Session
Anis Uzzaman , Cadence Design Systems, U.S.A.
Fidel Muradali , National Semiconductor, U.S.A.
Takashi Aikyo , Fujitsu/STARC, Japan
Robert Aitken , ARM, U.S.A.
Tom Jackson , Cadence Design Systems, U.S.A.
Rajesh Galivanche , Intel, U.S.A.
Takeshi Onodera , Sony, Japan
pp. 367
Session 9A: BIST
Liyang Lai , Mentor Graphics Corporation, 8005 SW Boeckman Road, Wilsonville, OR 97070, USA
Wu-Tung Cheng , Mentor Graphics Corporation, 8005 SW Boeckman Road, Wilsonville, OR 97070, USA
Thomas Rinderknecht , Mentor Graphics Corporation, 8005 SW Boeckman Road, Wilsonville, OR 97070, USA
pp. 371-377
L. Lizarraga , TIMA Laboratory, Grenoble, FRANCE
S. Mir , TIMA Laboratory, Grenoble, FRANCE
G. Sicard , TIMA Laboratory, Grenoble, FRANCE
pp. 378-383
Hsuan-Jung Hsu , National Tsing-Hua University, Taiwan
Chun-Chieh Tu , National Tsing-Hua University, Taiwan
Shi-Yu Huang , National Tsing-Hua University, Taiwan
pp. 384-392
Session 9B: Current Test
S. Sermet Akbay , Georgia Institute of Technology, Atlanta, GA
Shreyas Sen , Georgia Institute of Technology, Atlanta, GA
Abhijit Chatterjee , Georgia Institute of Technology, Atlanta, GA
pp. 393-398
Masaki Hashizume , University of Tokushima
Yutaka Hata , University of Tokushima
Tomomi Nishida , University of Tokushima
Hiroyuki Yotsuyanagi , University of Tokushima
Yukiya Miura , Tokyo Metropolitan University
pp. 399-403
Liquan Fang , Automotive Business Line, NXP Semiconductors, 6534 AE Nijmegen, the Netherlands
Yang Zhong , RWTH-Aachen University, Aachen, Germany
Henk van de Donk , Design Methods and Solutions, NXP Semiconductors, Eindhoven, the Netherlands
pp. 404-412
Session 9C: Power Aware Test (III)
Nan-Cheng Lai , National Chung-Hsing University, Taiwan
Sying-Jyan Wang , National Chung-Hsing University, Taiwan
pp. 413-418
Chandan Giri , E & ECE, IIT Kharagpur, India
Pradeep Kumar Choudhary , E & ECE, IIT Kharagpur, India
Santanu Chattopadhyay , E & ECE, IIT Kharagpur, India
pp. 419-424
Bo-Hua Chen , National Taiwan University
Wei-Chung Kao , National Taiwan University
Bing-Chuan Bai , National Taiwan University
Shyue-Tsong Shen , National Taiwan University
James C.-M. Li , National Taiwan University
pp. 425-432
Session 10A: Test Generation (II)
Piet Engelke , Albert-Ludwigs-University
Bettina Braitling , Albert-Ludwigs-University
Ilia Polian , Albert-Ludwigs-University
Michel Renovell , LIRMM - UMII, Montpellier, France
pp. 433-438
Jian Kang , University of Nebraska - Lincoln
Sharad C. Seth , University of Nebraska - Lincoln
Shashank K. Mehta , Indian Institute of Technology, India
pp. 439-444
Stephan Eggersgluess , University of Bremen, Germany
Rolf Drechsler , University of Bremen, Germany
pp. 445-452
Session 10B: NOC/SOC Test
Mahshid Sedghi , University of Tehran, Tehran, Iran
Armin Alaghi , University of Tehran, Tehran, Iran
Elnaz Koopahi , University of Tehran, Tehran, Iran
Zainalabedin Navabi , University of Tehran, Tehran, Iran
pp. 453-458
Fawnizu Azmadi Hussin , Nara Institute of Science and Technology
Tomokazu Yoneda , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 459-462
Tong-Yu Hsieh , National Cheng Kung University
Kuen-Jong Lee , National Cheng Kung University
Jian-Jhih You , National Cheng Kung University
pp. 463-466
Lei Zhang , Hefei University of Technology, 230009 Hefei, China
Huaguo Liang , Hefei University of Technology, 230009 Hefei, China
Wenfa Zhan , Hefei University of Technology, 230009 Hefei, China
Cuiyun Jiang , Hefei University of Technology, 230009 Hefei, China
pp. 467-472
Session 10C: Analog Production Test #1
Akinori Maeda , Verigy Japan K.K. Hachioji Tokyo Japan
pp. 474
Sean Lu , Broadcom Corporation, Irvine, CA
Dee-Won Lee , Verigy Ltd., Irvine, CA
pp. 475
Session 11A: Delay Test (II)
Irith Pomeranz , Purdue University
Sudhakar M. Reddy , University of Iowa
pp. 479-484
I-De Huang , University of Southern California
Sandeep K. Gupta , University of Southern California
pp. 485-492
Xijiang Lin , Mentor Graphics Corp.
Mark Kassab , Mentor Graphics Corp.
Janusz Rajski , Mentor Graphics Corp.
pp. 493-500
Session 11B: Memory Test (II)
M. Bastian , Infineon Technologies France
V. Gouin , Infineon Technologies France
P. Girard , Laboratoire d?Informatique, de Robotique et de Micro?lectronique de Montpellier ? UM2/CNRS, France
C. Landrault , Laboratoire d?Informatique, de Robotique et de Micro?lectronique de Montpellier - UM2/CNRS, France
A. Ney , Laboratoire d?Informatique, de Robotique et de Micro?lectronique de Montpellier - UM2/CNRS, France
S. Pravossoudovitch , Laboratoire d?Informatique, de Robotique et de Micro?lectronique de Montpellier - UM2/CNRS, France
A. Virazel , Laboratoire d?Informatique, de Robotique et de Micro?lectronique de Montpellier - UM2/CNRS, France
pp. 507-510
Session 11C: Analog Production Test #2
Deng Yue , Verigy Shanghai Application Development Center
pp. 518
Takahiro J. Yamaguchi , Advantest Laboratories, Ltd., Sendai, Miyagi, Japan
pp. 519
Special Sessions on Analog Production Test
Fidel Muradali , National Semiconductor
Jochen Rivoir , Verigy
pp. 523
Author Index
Author Index (PDF)
pp. 525
Call for Papers ATS 2008
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