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2006 IEEE 15th Asian Test Symposium (2006)
Fukuoka
Nov. 20, 2006 to Nov. 23, 2006
ISBN: 0-7695-2628-4
TABLE OF CONTENTS
Foreword (PDF)
pp.
pp.
Introduction
Foreword (PDF)
pp. xi
pp. xiv
Reviewers (PDF)
pp. xvi
Tutorial 1 (PDF)
pp. xx
Tutorial 2 (PDF)
pp. xx
Session 2A: Test Power Reduction
N. Badereddine , Universit? de Montpellier II / CNRS, Cedex, France
Z. Wang , Duke University
P. Girard , Universit? de Montpellier II / CNRS, Cedex, France
K. Chakrabarty , Duke University
S. Pravossoudovitch , Duke University
C. Landrault , Duke University
pp. 5-10
Jia LI , University of Chinese Academy of Sciences, Beijing
Yu HU , Advanced Test Technology Laboratory, Institute of Computing Technology, Beijing, China
Xiaowei LI , Advanced Test Technology Laboratory, Institute of Computing Technology, Beijing, China
pp. 11-16
Youbean Kim , Yonsei University
Dongsup Song , Yonsei University
Kicheol Kim , Yonsei University
Incheol Kim , Yonsei University
Sungho Kang , Yonsei University
pp. 17-24
Session 2B: Memory Test
Li-Ming Denq , National Tsing Hua University, Hsinchu, Taiwan
Tzu-Chiang Wang , National Tsing Hua University, Hsinchu, Taiwan
Cheng-Wen Wu , National Tsing Hua University, Hsinchu, Taiwan
pp. 25-30
A. Benso , Politecnico di Torino, Italy
A. Bosio , Politecnico di Torino, Italy
S. Di Carlo , Politecnico di Torino, Italy
G. Di Natale , Politecnico di Torino, Italy
P. Prinetto , Politecnico di Torino, Italy
pp. 31-36
Baosheng Wang , ATI Technologies Inc., 1 Commerce Valley Drive East, Markham, ON, Canada
Qiang Xu , Chinese University of Hong Kong, Shatin, N.T., Hong Kong
pp. 37-44
Session 2C: Test Techniques
Hsin-Wen Ting , National Cheng-Kung University, Tainan, Taiwan
Bin-Da Liu , National Cheng-Kung University, Tainan, Taiwan
Soon-Jyh Chang , National Cheng-Kung University, Tainan, Taiwan
pp. 51-54
Session 3A: IDDQ and Burn-in Test
Piet Engelke , Albert-Ludwigs-University, Germany
Ilia Polian , Albert-Ludwigs-University, Germany
Hans Manhaeve , Q-Star Test, Belgium
Michel Renovell , LIRMM - UMII, France
Bernd Becker , Albert-Ludwigs-University, Germany
pp. 63-68
Masato Nakanishi , Univ.of Tokushima, Japan
Masaki Hashizume , Univ.of Tokushima, Japan
Hiroyuki Yotsuyanagi , Univ.of Tokushima, Japan
Yukiya Miura , Tokyo Metropolitan University
pp. 69-74
Alfredo BENSO , Politecnico di Torino, Italy
Alberto BOSIO , Politecnico di Torino, Italy
Stefano DI CARLO , Politecnico di Torino, Italy
Giorgio DI NATALE , Politecnico di Torino, Italy
Paolo PRINETTO , Politecnico di Torino, Italy
pp. 75-82
Session 3B: High-Level Test
Nitin Yogi , Auburn University
Vishwani D. Agrawal , Auburn University
pp. 83-88
Tao Lv , Chinese Academy of Sciences, Beijing, China
Ling-yi Liu , Chinese Academy of Sciences, Beijing, China
Yang Zhao , Chinese Academy of Sciences, Beijing, China
Hua-wei Li , Chinese Academy of Sciences, Beijing, China
Xiao-wei Li , Chinese Academy of Sciences, Beijing, China
pp. 89-94
Session 3C: Design Verification
Shih-Chieh Wu , National Tsing Hua University, HsinChu, Taiwan R.O.C.
Chun-Yao Wang , National Tsing Hua University, HsinChu, Taiwan R.O.C.
Jan-An Hsieh , National Tsing Hua University, HsinChu, Taiwan R.O.C.
pp. 103-108
Jin-Fu Li , National Central University Jhongli, Taiwan
Chun-Hsien Wu , National Central University Jhongli, Taiwan
pp. 109-114
Hiroki Nakahara , Kyushu Institute of Technology, Iizuka 820-8502, Japan
Tsutomu Sasao , Kyushu Institute of Technology, Iizuka 820-8502, Japan
pp. 115-124
Session 4A: Special Session
Industry (Short Presentation)
Paul Wong , Rambus Inc., 4440 El Camino Real, Los Altos, CA 94022, USA
Jing Jiang , Rambus Inc., 4440 El Camino Real, Los Altos, CA 94022, USA
pp. 126
Muhammad Aiman Mazlan , iDEN Subscriber Test Group Global Software Group Motorola, Penang
Ong Kein Wei , iDEN Subscriber Test Group Global Software Group Motorola, Penang
Cindy Phang Sim Sim , iDEN Subscriber Test Group Global Software Group Motorola, Penang
pp. 128
Masayoshi YOSHIMURA , FLEETS Sawara-ku, Fukuoka, 814-0001, Japan
Yusuke MATSUNAGA , Kyushu University
pp. 129
Greg Aldrich , Mentor Graphics Corp., USA
Ron Press , Mentor Graphics Corp., USA
Takeo Kobayashi , Mentor Graphics Corp., USA
Tatsuo Sakajiri , Mentor Graphics Japan Co. Ltd., Japan
pp. 130
Hideaki Konishi , FUJITSU LIMITED
Michiaki Emori , FUJITSU LIMITED
Takahisa Hiraide , FUJITSU LIMITED
pp. 131
Anis Uzzaman , Cadence Design Systems, Inc, Endicott, New York, USA
Brion Keller , Cadence Design Systems, Inc, Endicott, New York, USA
Vivek Chickermane , Cadence Design Systems, Inc, Endicott, New York, USA
pp. 132
Session 5A: Panel Session
Fidel Muradali , National Semiconductor Corporation
pp. 135
Session 6A: Delay Test
Xijiang Lin , Mentor Graphics Corporation, Wilsonville, OR 97070, USA
Kun-Han Tsai , Mentor Graphics Corporation, Wilsonville, OR 97070, USA
Chen Wang , Mentor Graphics Corporation, Wilsonville, OR 97070, USA
Mark Kassab , Mentor Graphics Corporation, Wilsonville, OR 97070, USA
Janusz Rajski , Mentor Graphics Corporation, Wilsonville, OR 97070, USA
Takeo Kobayashi , Mentor Graphics Corporation, Wilsonville, OR 97070, USA
Randy Klingenberg , Mentor Graphics Corporation, Wilsonville, OR 97070, USA
Yasuo Sato , Semiconductor Technology Academic Research Center, Yokohama, Japan
Shuji Hamada , Semiconductor Technology Academic Research Center, Yokohama, Japan
Takashi Aikyo , Semiconductor Technology Academic Research Center, Yokohama, Japan
pp. 139-146
Anis Uzzaman , Cadence Design Systems, Inc. Endicott, New York, USA
Mick Tegethoff , Cadence Design Systems, Inc. Endicott, New York, USA
Bibo Li , Cadence Design Systems, Inc. Endicott, New York, USA
Kevin Mc Cauley , Cadence Design Systems, Inc. Endicott, New York, USA
Shuji Hamada , Semiconductor Technology Academic Research Center (STARC), Yokohama, Japan
Yasuo Sato , Semiconductor Technology Academic Research Center (STARC), Yokohama, Japan
pp. 147-152
Dhiraj Goswami , Mentor Graphics Corporation, Wilsonville, OR 97070
Kun-Han Tsai , Mentor Graphics Corporation, Wilsonville, OR 97070
Mark Kassab , Mentor Graphics Corporation, Wilsonville, OR 97070
Takeo Kobayashi , Mentor Graphics Corporation, Wilsonville, OR 97070
Janusz Rajski , Mentor Graphics Corporation, Wilsonville, OR 97070
Bruce Swanson , Mentor Graphics Corporation, Wilsonville, OR 97070
Darryl Walters , Mentor Graphics Corporation, Wilsonville, OR 97070
Yasuo Sato , Semiconductor Technology Academic Research Center, Yokohama, Japan
Toshiharu Asaka , Semiconductor Technology Academic Research Center, Yokohama, Japan
Takashi Aikyo , Semiconductor Technology Academic Research Center, Yokohama, Japan
pp. 153-162
Session 6B: Scan Test Techniques (1)
Chia Yee Ooi , Nara Institute of Science and Technology Kansai Science City
Hideo Fujiwara , Nara Institute of Science and Technology Kansai Science City
pp. 163-168
Sying-Jyan Wang , National Chung Hsing University, Taichung, Taiwan
Kuo-Lin Peng , National Chung Hsing University, Taichung, Taiwan
Katherine Shu-Min Li , National Chung Hsing University, Taichung, Taiwan
pp. 169-174
Irith Pomeranz , Purdue University
Sudhakar M. Reddy , University of Iowa
pp. 175-182
Session 6C: Reliable Circuit Design
Biplab K Sikdar , Bengal Engineering and Science University, India
pp. 183-188
Ming Li , Shanghai University, Shanghai 200072 China
Shiyi Xu , Shanghai University, Shanghai 200072 China
Jialin Cao , Shanghai University, Shanghai 200072 China
Feng Ran , Shanghai University, Shanghai 200072 China
Shiwei Ma , Shanghai University, Shanghai 200072 China
pp. 189-194
Naghmeh Karimi , University of Tehran, 14399 Tehran, IRAN
Shahrzad Mirkhani , University of Tehran, 14399 Tehran, IRAN
Zainalabedin Navabi , University of Tehran, 14399 Tehran, IRAN
pp. 195-202
Session 7A: Defect Diagnosis
Wei Zou , Mentor Graphics Corporation 8005 SW Boeckman Road Wilsonville, OR 97070, U.S.A
Wu-Tung Cheng , Mentor Graphics Corporation 8005 SW Boeckman Road Wilsonville, OR 97070, U.S.A
Sudhakar M. Reddy , University of Iowa Iowa City, IA 52242, U.S.A
pp. 203-209
Yasuo Sato , Semiconductor Technology Academi c Research Center, Yokohama, Japan
Kazushi Sugiura , Semiconductor Technology Academi c Research Center, Yokohama, Japan
Reisuke Shimoda , Semiconductor Technology Academi c Research Center, Yokohama, Japan
Yutaka Yoshizawa , Semiconductor Technology Academi c Research Center, Yokohama, Japan
Kenji Norimatsu , Semiconductor Technology Academi c Research Center, Yokohama, Japan
Masaru Sanada , Kochi University of Technology, Kochi, Japan
pp. 209-214
Lei Wang , University of Southern California, Los Angeles, CA
Sandeep K. Gupta , University of Southern California, Los Angeles, CA
Melvin A. Breuer , University of Southern California, Los Angeles, CA
pp. 215-224
Session 7B: Scan Test Techniques (2)
Po-Chang Tsai , National Chung-Hsing University, Taiwan, ROC
Sying-Jyan Wang , National Chung-Hsing University, Taiwan, ROC
pp. 225-230
Yu Hu , Chinese Academy of Sciences
Cheng Li , Chinese Academy of Sciences
Jia Li , Chinese Academy of Sciences
Yin-He Han , Chinese Academy of Sciences
Xiao-Wei Li , Chinese Academy of Sciences
Wei Wang , Chinese Academy of Sciences
Hua-Wei Li , Chinese Academy of Sciences
Laung-Terng(L.T) Wang , SynTest Technologies, Inc., Sunnyvale 94086, U.S.A.
Xiao-Qing Wen , Kyushu Institute of Technology, Japan
pp. 231-236
Jinkyu Lee , University of Texas, Austin, TX
Nur A. Touba , University of Texas, Austin, TX
pp. 237-244
Session 7C: Analog DFT
Hongjoong Shin , University of Texas at Austin
Jiseon Park , University of Texas at Austin
Jacob A. Abraham , University of Texas at Austin
pp. 245-250
Maohsuan Chou , National Chiao Tung University, Hsinchu 300, Taiwan
Jenchien Hsu , National Chiao Tung University, Hsinchu 300, Taiwan
Chauchin Su , National Chiao Tung University, Hsinchu 300, Taiwan
pp. 251-254
Hao-Chiao Hong , National Chiao Tung University
Sheng-Chuan Liang , National Chiao Tung University
pp. 255-264
Session 8A: Defect ATPG
Shahdad Irajpour , University of Southern California, Los Angeles, CA
Sandeep K. Gupta , University of Southern California, Los Angeles, CA
Melvin A. Breuer , University of Southern California, Los Angeles, CA
pp. 265-272
M. Renovell , LIRMM-UMR C5506 CNRS
M. Comte , LIRMM-UMR C5506 CNRS
I. Polian , Albert-Ludwigs University, Germany
P. Engelke , Albert-Ludwigs University, Germany
B. Becker , Albert-Ludwigs University, Germany
pp. 273-278
Yongjoon Kim , Yonsei Univeristy
Myung-Hoon Yang , Yonsei Univeristy
Youngkyu Park , Yonsei Univeristy
DaeYeal Lee , Yonsei Univeristy
Sungho Kang , Yonsei Univeristy
pp. 279-286
Session 8B: Reconfigurabilities in BIST
Xiaogang Du , Mentor Graphics Corporation, 8005 S.W. Boeckman Rd., Wilsonville, OR
Nilanjan Mukherjee , Mentor Graphics Corporation, 8005 S.W. Boeckman Rd., Wilsonville, OR
Chris Hill , Mentor Graphics Corporation, 8005 S.W. Boeckman Rd., Wilsonville, OR
Wu-Tung Cheng , Mentor Graphics Corporation, 8005 S.W. Boeckman Rd., Wilsonville, OR
Sudhakar Reddy , University of Iowa, Iowa City, IA
pp. 287-292
Armin Alaghi , University of Tehran, Iran
Mahnaz Sadoughi Yarandi , University of Tehran, Iran
Zainalabedin Navabi , University of Tehran, Iran
pp. 293-298
Dong Xiang , Tsinghua University
Yang Zhao , Tsinghua University
Khrismendu Chakrabarty , Duke University
Jiaguang Sun , Tsinghua University
pp. 299-306
Session 8C: Solutions for Jitter Problems
Shalabh Goya , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
Yanan Shieh , Georgia Institute of Technology
pp. 307-312
Chung-Yi Li , National Tsing Hua University
Chia-Yuan Chou , National Tsing Hua University
Tsin-Yuan Chang , National Tsing Hua University
pp. 313-317
Jiun-Lang Huang , National Taiwan University, Taipei 106, Taiwan
pp. 318-326
Session 9A: Test Compression (1)
Terumine Hayashi , Graduate School of Engineering, Mie University
Naotsugu Ikeda , Graduate School of Engineering, Mie University
Tsuyoshi Shinogi , Graduate School of Engineering, Mie University
Haruhiko Takase , Graduate School of Engineering, Mie University
Hidehiko Kita , Graduate School of Engineering, Mie University
pp. 327-332
Rajamani Sethuram , Rutgers University
Seongmoon Wang , NEC Laboratories America, Princeton, NJ
Srimat T. Chakradhar , NEC Laboratories America, Princeton, NJ
Michael L. Bushnell , Rutgers University
pp. 339-348
Session 9B: Diagnosis Algorithms
Koji Yamazaki , Meiji University, JAPAN
Yuzo Takamatsu , Ehime University, JAPAN
pp. 349-353
Yoshinobu Higami , Ehime University
Kewal K. Saluja , University of Wisconsin - Madison
Hiroshi Takahashi , Ehime University
Sin-ya Kobayashi , Ehime University
Yuzo Takamatsu , Ehime University
pp. 354-359
Andreas Leininger , Infineon Technologies AG Am Campeon 1-12 Munich, Germany
Ajay Khoche , Verigy, Santa Clara CA, USA
Martin Fischer , Verigy, Boeblingen, Germany
Nagesh Tamarapalli , Mentor Graphics Corporation, Wilsonville, OR
Wu-Tung Cheng , Mentor Graphics Corporation, Wilsonville, OR
Randy Klingenberg , Mentor Graphics Corporation, Wilsonville, OR
Wu Yang , Mentor Graphics Corporation, Wilsonville, OR
pp. 360-368
Session 9C: DFT for Processors and ASICs
Louis Bushard , IBM Corp., Rochester MN
Nathan Chelstrom , Intrinsity, Austin, TX
Steven Ferguson , IBM Corp., Austin, TX
Brion Keller , Cadence Design Systems Inc., Endicott, NY
pp. 369-374
Masato Nakazato , Nara Institute of Science and Technology
Satoshi Ohtake , Nara Institute of Science and Technology
Michiko Inoue , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 375-380
Brian Foutz , Cadence Design Systems
Vivek Chickermane , Cadence Design Systems
Bing Li , Cadence Design Systems
Harry Linzer , IBM Corp.
Gary Kunselman , IBM Corp.
pp. 381-388
Session 10A: Test Compression (2)
Kazuteru Namba , Chiba University, Japan
Hideo Ito , Chiba University, Japan
pp. 389-394
Taweesak Reungpeerakul , Santa Clara University
Xiaoshu Qian , Intel Corporation
Samiha Mourad , Santa Clara University
pp. 395-401
Masayuki Arai , Tokyo Metropolitan University, Tokyo, Japan
Satoshi Fukumoto , Tokyo Metropolitan University, Tokyo, Japan
Kazuhiko Iwasaki , Tokyo Metropolitan University, Tokyo, Japan
pp. 401-408
Session 10B: Diagnosis Techniques
Yoshiyuki Nakamura , NEC Electronics Corporation, Kawasaki, Japan
Thomas Clouqueur , Nara Institute of Science and Technology
Kewal K. Saluja , University of Wisconsin-Madison, WI 53706-1691, USA
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 409-414
Sanae Seike , IBM Industrial Solution Co., Ltd., Tokyo, Japan
Ken Namura , IBM Industrial Solution Co., Ltd., Tokyo, Japan
Yukio Ohya , IBM Industrial Solution Co., Ltd., Tokyo, Japan
Anis Uzzaman , Cadence Design Systems, New York, USA
Shinichi Arima , Cadence Design Systems, New York, USA
Dale Meehl , Cadence Design Systems, New York, USA
Vivek Chickermane , Cadence Design Systems, New York, USA
Azumi Kobayashi , Renesas Technology Corporation, Tokyo, Japan
Satoshi Tanaka , Renesas Technology Corporation, Tokyo, Japan
Hiroyuki Adachi , Renesas Technology Corporation, Tokyo, Japan
pp. 415-420
Sverre Wichlund , Nordic Semiconductor ASA
Einar J. Aas , Norwegian University of Science and Technology
pp. 421-430
Session 10C: Network Issues
Jaan Raik , Tallinn University of Technology
Vineeth Govind , Tallinn University of Technology
Raimund Ubar , Tallinn University of Technology
pp. 437-442
Ariel Sabiguero Yawelak , Universidad de la Republica Montevideo, Uruguay
Cesar Viho , Institut de Recherche en Informatique et Systemes Aleatoires Campus de Beaulieu, Rennes, France
pp. 443-448
Author Index
Author Index (PDF)
pp. 449
Call for Papers ATS 2007
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